18,758 research outputs found

    Phase Locked Loop Test Methodology

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    Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

    Analysis and equalization of data-dependent jitter

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    Data-dependent jitter limits the bit-error rate (BER) performance of broadband communication systems and aggravates synchronization in phase- and delay-locked loops used for data recovery. A method for calculating the data-dependent jitter in broadband systems from the pulse response is discussed. The impact of jitter on conventional clock and data recovery circuits is studied in the time and frequency domain. The deterministic nature of data-dependent jitter suggests equalization techniques suitable for high-speed circuits. Two equalizer circuit implementations are presented. The first is a SiGe clock and data recovery circuit modified to incorporate a deterministic jitter equalizer. This circuit demonstrates the reduction of jitter in the recovered clock. The second circuit is a MOS implementation of a jitter equalizer with independent control of the rising and falling edge timing. This equalizer demonstrates improvement of the timing margins that achieve 10/sup -12/ BER from 30 to 52 ps at 10 Gb/s

    Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

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    Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis

    Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability

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    Cancellation of crosstalk-induced jitter

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    A novel jitter equalization circuit is presented that addresses crosstalk-induced jitter in high-speed serial links. A simple model of electromagnetic coupling demonstrates the generation of crosstalk-induced jitter. The analysis highlights unique aspects of crosstalk-induced jitter that differ from far-end crosstalk. The model is used to predict the crosstalk-induced jitter in 2-PAM and 4-PAM, which is compared to measurement. Furthermore, the model suggests an equalizer that compensates for the data-induced electromagnetic coupling between adjacent links and is suitable for pre- or post-emphasis schemes. The circuits are implemented using 130-nm MOSFETs and operate at 5-10 Gb/s. The results demonstrate reduced deterministic jitter and lower bit-error rate (BER). At 10 Gb/s, the crosstalk-induced jitter equalizer opens the eye at 10^sup-12 BER from 17 to 45 ps and lowers the rms jitter from 8.7 to 6.3 ps

    Product assurance technology for custom LSI/VLSI electronics

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    The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

    High-Responsivity Graphene-Boron Nitride Photodetector and Autocorrelator in a Silicon Photonic Integrated Circuit

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    Graphene and other two-dimensional (2D) materials have emerged as promising materials for broadband and ultrafast photodetection and optical modulation. These optoelectronic capabilities can augment complementary metal-oxide-semiconductor (CMOS) devices for high-speed and low-power optical interconnects. Here, we demonstrate an on-chip ultrafast photodetector based on a two-dimensional heterostructure consisting of high-quality graphene encapsulated in hexagonal boron nitride. Coupled to the optical mode of a silicon waveguide, this 2D heterostructure-based photodetector exhibits a maximum responsivity of 0.36 A/W and high-speed operation with a 3 dB cut-off at 42 GHz. From photocurrent measurements as a function of the top-gate and source-drain voltages, we conclude that the photoresponse is consistent with hot electron mediated effects. At moderate peak powers above 50 mW, we observe a saturating photocurrent consistent with the mechanisms of electron-phonon supercollision cooling. This nonlinear photoresponse enables optical on-chip autocorrelation measurements with picosecond-scale timing resolution and exceptionally low peak powers

    Computing Safe Contention Bounds for Multicore Resources with Round-Robin and FIFO Arbitration

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    Numerous researchers have studied the contention that arises among tasks running in parallel on a multicore processor. Most of those studies seek to derive a tight and sound upper-bound for the worst-case delay with which a processor resource may serve an incoming request, when its access is arbitrated using time-predictable policies such as round-robin or FIFO. We call this value upper-bound delay ( ubd ). Deriving trustworthy ubd statically is possible when sufficient public information exists on the timing latency incurred on access to the resource of interest. Unfortunately however, that is rarely granted for commercial-of-the-shelf (COTS) processors. Therefore, the users resort to measurement observations on the target processor and thus compute a “measured” ubdm . However, using ubdm to compute worst-case execution time values for programs running on COTS multicore processors requires qualification on the soundness of the result. In this paper, we present a measurement-based methodology to derive a ubdm under round-robin (RoRo) and first-in-first-out (FIFO) arbitration, which accurately approximates ubd from above, without needing latency information from the hardware provider. Experimental results, obtained on multiple processor configurations, demonstrate the robustness of the proposed methodology.The research leading to this work has received funding from: the European Union’s Horizon 2020 research and innovation programme under grant agreement No 644080(SAFURE); the European Space Agency under Contract 789.2013 and NPI Contract 40001102880; and COST Action IC1202, Timing Analysis On Code-Level (TACLe). This work has also been partially supported by the Spanish Ministry of Science and Innovation under grant TIN2015-65316-P. Jaume Abella has been partially supported by the MINECO under Ramon y Cajal postdoctoral fellowship number RYC-2013-14717. The authors would like to thanks Paul Caheny for his help with the proofreading of this document.Peer ReviewedPostprint (author's final draft
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