Digital design techniques for dependable High-Performance Computing

L'abstract è presente nell'allegato / the abstract is in the attachmen

A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit

Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. The main concern for safety-critical applications such aerospace is due to Single Event Transient (SET) effects. SETs are exacerbated by the technology scaling of modern technologies especially when they are adopted in harsh environments. This paper evaluates the SET sensitivity of state-of-the-art floating gate configurable logic circuit and proposes a novel methodology for filtering a SET pulse generated inside the logic cells by increasing the charge sharing effect on the sensitive node of a cell due to remapping of its configurable switches. Experimental results, performed with radiation particle simulation on several benchmark circuits implemented in a 130nm floating-gate device demonstrate an improvement in filtering SET effects of more than 24% on the average with negligible delay degradation

Fault Tolerant Electronic System Design

Due to technology scaling, which means reduced transistor size, higher density, lower voltage and more aggressive clock frequency, VLSI devices may become more sensitive against soft errors. Especially for those devices used in safety- and mission-critical applications, dependability and reliability are becoming increasingly important constraints during the development of system on/around them. Other phenomena (e.g., aging and wear-out effects) also have negative impacts on reliability of modern circuits. Recent researches show that even at sea level, radiation particles can still induce soft errors in electronic systems. On one hand, processor-based system are commonly used in a wide variety of applications, including safety-critical and high availability missions, e.g., in the automotive, biomedical and aerospace domains. In these fields, an error may produce catastrophic consequences. Thus, dependability is a primary target that must be achieved taking into account tight constraints in terms of cost, performance, power and time to market. With standards and regulations (e.g., ISO-26262, DO-254, IEC-61508) clearly specify the targets to be achieved and the methods to prove their achievement, techniques working at system level are particularly attracting. On the other hand, Field Programmable Gate Array (FPGA) devices are becoming more and more attractive, also in safety- and mission-critical applications due to the high performance, low power consumption and the flexibility for reconfiguration they provide. Two types of FPGAs are commonly used, based on their configuration memory cell technology, i.e., SRAM-based and Flash-based FPGA. For SRAM-based FPGAs, the SRAM cells of the configuration memory highly susceptible to radiation induced effects which can leads to system failure; and for Flash-based FPGAs, even though their non-volatile configuration memory cells are almost immune to Single Event Upsets induced by energetic particles, the floating gate switches and the logic cells in the configuration tiles can still suffer from Single Event Effects when hit by an highly charged particle. So analysis and mitigation techniques for Single Event Effects on FPGAs are becoming increasingly important in the design flow especially when reliability is one of the main requirements

Digital Design Techniques for Dependable High Performance Computing

As today’s process technologies continuously scale down, circuits become increasingly more vulnerable to radiation-induced soft errors in nanoscale VLSI technologies. The reduction of node capacitance and supply voltages coupled with increasingly denser chips are raising soft error rates and making them an important design issue. This research work is focused on the development of design techniques for high-reliability modern VLSI technologies, focusing mainly on Radiation-induced Single Event Transient. In this work, we evaluate the complete life-cycle of the SET pulse from the generation to the mitigation. A new simulation tool, Rad-Ray, has been developed to simulate and model the passage of heavy ion into the silicon matter of modern Integrated Circuit and predict the transient voltage pulse taking into account the physical description of the design. An analysis and mitigation tool has been developed to evaluate the propagation of the predicted SET pulses within the circuit and apply a selective mitigation technique to the sensitive nodes of the circuit. The analysis and mitigation tools have been applied to many industrial projects as well as the EUCLID space mission project, including more than ten modules. The obtained results demonstrated the effectiveness of the proposed tools

Using Machine Learning for Anomaly Detection on a System-on-Chip under Gamma Radiation

The emergence of new nanoscale technologies has imposed significant challenges to designing reliable electronic systems in radiation environments. A few types of radiation like Total Ionizing Dose (TID) effects often cause permanent damages on such nanoscale electronic devices, and current state-of-the-art technologies to tackle TID make use of expensive radiation-hardened devices. This paper focuses on a novel and different approach: using machine learning algorithms on consumer electronic level Field Programmable Gate Arrays (FPGAs) to tackle TID effects and monitor them to replace before they stop working. This condition has a research challenge to anticipate when the board results in a total failure due to TID effects. We observed internal measurements of the FPGA boards under gamma radiation and used three different anomaly detection machine learning (ML) algorithms to detect anomalies in the sensor measurements in a gamma-radiated environment. The statistical results show a highly significant relationship between the gamma radiation exposure levels and the board measurements. Moreover, our anomaly detection results have shown that a One-Class Support Vector Machine with Radial Basis Function Kernel has an average Recall score of 0.95. Also, all anomalies can be detected before the boards stop working

Fault Tolerant Nanosatellite Computing on a Budget

In this contribution, we present a CubeSat-compatible on-board computer (OBC) architecture that offers strong fault tolerance to enable the use of such spacecraft in critical and long-term missions. We describe in detail the design of our OBC’s breadboard setup, and document its composition from the component-level, all the way down to the software level. Fault tolerance in this OBC is achieved without resorting to radiation hardening, just intelligent through software. The OBC ages graceful, and makes use of FPGA-reconfiguration and mixed criticality. It can dynamically adapt to changing performance requirements throughout a space mission. We developed a proof-of-concept with several Xilinx Ultrascale and Ultrascale+ FPGAs. With the smallest Kintex Ultrascale+ KU3P device, we achieve 1.94W total power consumption at 300Mhz, well within the power budget range of current 2U CubeSats. To our knowledge, this is the first scalable and COTS-based, widely reproducible OBC solution which can offer strong fault coverage even for small CubeSats. To reproduce this OBC architecture, no custom-written, proprietary, or protected IP is needed, and the needed design tools are available free-of-charge to academics. All COTS components required to construct this architecture can be purchased on the open market, and are affordable even for academic and scientific CubeSat developers

Total ionizing dose and single event upset testing of flash based field programmable gate arrays

The effectiveness of implementing field programmable gate arrays (FPGAs) in communication, military, space and high radiation environment applications, coupled with the increased accessibility of private individuals and researchers to launch satellites, has led to an increased interest in commercial off the shelf components. The metal oxide semiconductor (MOS) structures of FPGAs however, are sensitive to radiation effects which can lead to decreased reliability of the device. In order to successfully implement a FPGA based system in a radiation environment, such as on-board a satellite, the single event upset (SEU) and total ionizing dose (TID) characteristics of the device must first be established. This research experimentally determines a research procedure which could accurately determine the SEU cross sections and TID characteristics of various mitigation techniques as well as control circuits implemented in a ProASIC3 A3P1000 FPGA. To gain an understanding of the SEU effects of the implemented circuits, the test FPGA was irradiated by a 66MeV proton beam at the iTemba LABS facility. Through means of irradiation, the SEU cross section of various communication, motor control and mitigation schemes circuits, induced by high energy proton strikes was investigated. The implementation of a full global triple modular redundancy (TMR) and a combination of TMR and a AND-OR multiplexer filter was found to most effectively mitigate SEUs in comparison to the other techniques. When comparing the communication and motor control circuits, the high frequency I2C and SPI circuits experienced a higher number of upsets when compared to a low frequency servo motor control circuit. To gain a better understanding of the absorbed dose effects, experimental TID testing was conducted by irradiating the test FPGA with a cobalt-60 (Co-60) source. An accumulated absorbed dose resulted in the fluctuation of the device supply current and operating voltages as well as resulted in output errors. The TMR and TMR filtering combination mitigation techniques again were found to be the most effective methods of mitigation

Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip

L'abstract è presente nell'allegato / the abstract is in the attachmen