Online self-repair of FIR filters

Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs

New Symmetric and Planar Designs of Reversible Full-Adders/Subtractors in Quantum-Dot Cellular Automata

Quantum-dot Cellular Automata (QCA) is one of the emerging nanotechnologies, promising alternative to CMOS technology due to faster speed, smaller size, lower power consumption, higher scale integration and higher switching frequency. Also, power dissipation is the main limitation of all the nano electronics design techniques including the QCA. Researchers have proposed the various mechanisms to limit this problem. Among them, reversible computing is considered as the reliable solution to lower the power dissipation. On the other hand, adders are fundamental circuits for most digital systems. In this paper, Innovation is divided to three sections. In the first section, a method for converting irreversible functions to a reversible one is presented. This method has advantages such as: converting of irreversible functions to reversible one directly and as optimal. So, in this method, sub-optimal methods of using of conventional reversible blocks such as Toffoli and Fredkin are not used, having of minimum number of garbage outputs and so on. Then, Using the method, two new symmetric and planar designs of reversible full-adders are presented. In the second section, a new symmetric, planar and fault tolerant five-input majority gate is proposed. Based on the designed gate, a reversible full-adder are presented. Also, for this gate, a fault-tolerant analysis is proposed. And in the third section, three new 8-bit reversible full-adder/subtractors are designed based on full-adders/subtractors proposed in the second section. The results are indicative of the outperformance of the proposed designs in comparison to the best available ones in terms of area, complexity, delay, reversible/irreversible layout, and also in logic level in terms of garbage outputs, control inputs, number of majority and NOT gates

New Symmetric and Planar Designs of Reversible Full-Adders/Subtractors in Quantum-Dot Cellular Automata

Quantum-dot Cellular Automata (QCA) is one of the emerging nanotechnologies, promising alternative to CMOS technology due to faster speed, smaller size, lower power consumption, higher scale integration and higher switching frequency. Also, power dissipation is the main limitation of all the nano electronics design techniques including the QCA. Researchers have proposed the various mechanisms to limit this problem. Among them, reversible computing is considered as the reliable solution to lower the power dissipation. On the other hand, adders are fundamental circuits for most digital systems. In this paper, Innovation is divided to three sections. In the first section, a method for converting irreversible functions to a reversible one is presented. This method has advantages such as: converting of irreversible functions to reversible one directly and as optimal. So, in this method, sub-optimal methods of using of conventional reversible blocks such as Toffoli and Fredkin are not used, having of minimum number of garbage outputs and so on. Then, Using the method, two new symmetric and planar designs of reversible full-adders are presented. In the second section, a new symmetric, planar and fault tolerant five-input majority gate is proposed. Based on the designed gate, a reversible full-adder are presented. Also, for this gate, a fault-tolerant analysis is proposed. And in the third section, three new 8-bit reversible full-adder/subtractors are designed based on full-adders/subtractors proposed in the second section. The results are indicative of the outperformance of the proposed designs in comparison to the best available ones in terms of area, complexity, delay, reversible/irreversible layout, and also in logic level in terms of garbage outputs, control inputs, number of majority and NOT gates

Design and Test Space Exploration of Transport-Triggered Architectures

This paper describes a new approach in the high level design and test of transport-triggered architectures (TTA), a special type of application specific instruction processors (ASIP). The proposed method introduces the test as an additional constraint, besides throughput and circuit area. The method, that calculates the testability of the system, helps the designer to assess the obtained architectures with respect to test, area and throughput in the early phase of the design and selects the most suitable one. In order to create the templated TTA, the ¿MOVE¿ framework has been addressed. The approach is validated with respect to the ¿Crypt¿ Unix applicatio

Optimizing construction of scheduled data flow graph for on-line testability

The objective of this work is to develop a new methodology for behavioural synthesis using a flow of synthesis, better suited to the scheduling of independent calculations and non-concurrent online testing. The traditional behavioural synthesis process can be defined as the compilation of an algorithmic specification into an architecture composed of a data path and a controller. This stream of synthesis generally involves scheduling, resource allocation, generation of the data path and controller synthesis. Experiments showed that optimization started at the high level synthesis improves the performance of the result, yet the current tools do not offer synthesis optimizations that from the RTL level. This justifies the development of an optimization methodology which takes effect from the behavioural specification and accompanying the synthesis process in its various stages. In this paper we propose the use of algebraic properties (commutativity, associativity and distributivity) to transform readable mathematical formulas of algorithmic specifications into mathematical formulas evaluated efficiently. This will effectively reduce the execution time of scheduling calculations and increase the possibilities of testability

Design of ALU and Cache Memory for an 8 bit ALU

The design of an ALU and a Cache memory for use in a high performance processor was examined in this thesis. Advanced architectures employing increased parallelism were analyzed to minimize the number of execution cycles needed for 8 bit integer arithmetic operations. In addition to the arithmetic unit, an optimized SRAM memory cell was designed to be used as cache memory and as fast Look Up Table. The ALU consists of stand alone units for bit parallel computation of basic integer arithmetic operations. Addition and subtraction were performed using Kogge Stone parallel prefix hardware operating at 330MHz. A high performance multiplier was built using Radix 4 Modified Booth Encoder (MBE) and a Wallace Tree summation array. The multiplier requires single clock cycle for 8 bit integer multiplication and operates at a maximum frequency of 100MHz. Multiplicative division hardware was built for executing both integer division and square root. The division hardware computes 8-bit division and square root in 4 clock cycles. Multiplier forms the basic building block of all these functional units, making high level of resource sharing feasible with this architecture. The optimal operating frequency for the arithmetic unit is 70MHz. A 6T CMOS SRAM cell measuring 90 µm2 was designed using minimum size transistors. The layout allows for horizontal overlap resulting in effective area of 76 µm2 for an 8x8 array. By substituting equivalent bit line capacitance of P4 L1 Cache, the memory was simulated to have a read time of 3.27ns. An optimized set of test vectors were identified to enable high fault coverage without the need for any additional test circuitry. Sixteen test cases were identified that would toggle all the nodes and provide all possible inputs to the sub units of the multiplier. A correlation based semi automatic method was investigated to facilitate test case identification for large multipliers. This method of testability eliminates performance and area overhead associated with conventional testability hardware. Bottom up design methodology was employed for the design. The performance and area metrics are presented along with estimated power consumption. A set of Monte Carlo analysis was carried out to ensure the dependability of the design under process variations as well as fluctuations in operating conditions. The arithmetic unit was found to require a total die area of 2mm2 (approx.) in 0.35 micron process

AREA-TIME OPTIMAL ADDER WITH RELATIVE PLACEMENT GENERATOR

ABSTRACT This paper presents design of an adder generator, for the production of area-time-optimal adders. A unique feature of the proposed generator is its integrated synthesis and layout environment achieved by providing relative placement information to the synthesis tool. Adders produced by this generator are dynamically configured for a given technology library, wire-load model, delay, and area goal. The adder architecture used in this generator is a hybrid of Brent & Kung, carry select, and ripple carry adders. When compared with standard cell fast adders, a 20%-50% reduction in area with comparable delays is achieved. The reduction comes from a judicious selection of ripple carry or carry select adders based on computation of delays. When performance is being met, the carry select adders are replaced with ripple carry adders. The proposed generator has been integrated into a commercially available high-performance datapath design tool

Design a Low Power Built in Self-Test (BIST) Architecture for Fast Multiplier and Optimize in Terms of Real Time Functionality

Aiming low power during testing, Maypresent a methodology for derivingBIST Architecture forfast Multipliers. In my propose Researchseveral design rules for designing the Wallace tree in order to be fully testable under the cell fault model. The proposed low power BISTArchitecture for the derived multipliers is achieved by: (i) IntroducingTest Pattern Generators (ii) Properly assigning the TPGsoutputs to the multiplier inputs and(iii) Significantly reducing the test vector length. In this work, I have implemented 4bit * 4bit Multiplier with many test pattern generators (TPG) alternative. A BIST TPG Architecture was use of 6 bit counter. I have calculated operation speed, time delay, area, power consumption for Design. Reductionof power dissipationachieved byproperly assigning the TPG output to the multiplier input,significantly reducing the test set length, suitableTPG built of a6-bit counter DOI: 10.17762/ijritcc2321-8169.150317