Highly Automated Formal Verification of Arithmetic Circuits

This dissertation investigates the problems of two distinctive formal verification techniques for verifying large scale multiplier circuits and proposes two approaches to overcome some of these problems. The first technique is equivalence checking based on recurrence relations, while the second one is the symbolic computation technique which is based on the theory of Gröbner bases. This investigation demonstrates that approaches based on symbolic computation have better scalability and more robustness than state-of-the-art equivalence checking techniques for verification of arithmetic circuits. According to this conclusion, the thesis leverages the symbolic computation technique to verify floating-point designs. It proposes a new algebraic equivalence checking, in contrast to classical combinational equivalence checking, the proposed technique is capable of checking the equivalence of two circuits which have different architectures of arithmetic units as well as control logic parts, e.g., floating-point multipliers

Synthesis and Verification of Digital Circuits using Functional Simulation and Boolean Satisfiability.

The semiconductor industry has long relied on the steady trend of transistor scaling, that is, the shrinking of the dimensions of silicon transistor devices, as a way to improve the cost and performance of electronic devices. However, several design challenges have emerged as transistors have become smaller. For instance, wires are not scaling as fast as transistors, and delay associated with wires is becoming more significant. Moreover, in the design flow for integrated circuits, accurate modeling of wire-related delay is available only toward the end of the design process, when the physical placement of logic units is known. Consequently, one can only know whether timing performance objectives are satisfied, i.e., if timing closure is achieved, after several design optimizations. Unless timing closure is achieved, time-consuming design-flow iterations are required. Given the challenges arising from increasingly complex designs, failing to quickly achieve timing closure threatens the ability of designers to produce high-performance chips that can match continually growing consumer demands. In this dissertation, we introduce powerful constraint-guided synthesis optimizations that take into account upcoming timing closure challenges and eliminate expensive design iterations. In particular, we use logic simulation to approximate the behavior of increasingly complex designs leveraging a recently proposed concept, called bit signatures, which allows us to represent a large fraction of a complex circuit's behavior in a compact data structure. By manipulating these signatures, we can efficiently discover a greater set of valid logic transformations than was previously possible and, as a result, enhance timing optimization. Based on the abstractions enabled through signatures, we propose a comprehensive suite of novel techniques: (1) a fast computation of circuit don't-cares that increases restructuring opportunities, (2) a verification methodology to prove the correctness of speculative optimizations that efficiently utilizes the computational power of modern multi-core systems, and (3) a physical synthesis strategy using signatures that re-implements sections of a critical path while minimizing perturbations to the existing placement. Our results indicate that logic simulation is effective in approximating the behavior of complex designs and enables a broader family of optimizations than previous synthesis approaches.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61793/1/splaza_1.pd

Advances in Functional Decomposition: Theory and Applications

Functional decomposition aims at finding efficient representations for Boolean functions. It is used in many applications, including multi-level logic synthesis, formal verification, and testing. This dissertation presents novel heuristic algorithms for functional decomposition. These algorithms take advantage of suitable representations of the Boolean functions in order to be efficient. The first two algorithms compute simple-disjoint and disjoint-support decompositions. They are based on representing the target function by a Reduced Ordered Binary Decision Diagram (BDD). Unlike other BDD-based algorithms, the presented ones can deal with larger target functions and produce more decompositions without requiring expensive manipulations of the representation, particularly BDD reordering. The third algorithm also finds disjoint-support decompositions, but it is based on a technique which integrates circuit graph analysis and BDD-based decomposition. The combination of the two approaches results in an algorithm which is more robust than a purely BDD-based one, and that improves both the quality of the results and the running time. The fourth algorithm uses circuit graph analysis to obtain non-disjoint decompositions. We show that the problem of computing non-disjoint decompositions can be reduced to the problem of computing multiple-vertex dominators. We also prove that multiple-vertex dominators can be found in polynomial time. This result is important because there is no known polynomial time algorithm for computing all non-disjoint decompositions of a Boolean function. The fifth algorithm provides an efficient means to decompose a function at the circuit graph level, by using information derived from a BDD representation. This is done without the expensive circuit re-synthesis normally associated with BDD-based decomposition approaches. Finally we present two publications that resulted from the many detours we have taken along the winding path of our research

Data structures for SIMD logic simulation

Due to the growth of design size and complexity, design verification is an important aspect of the Logic Circuit development process. The purpose of verification is to validate that the design meets the system requirements and specification. This is done by either functional or formal verification. The most popular approach to functional verification is the use of simulation based techniques. Using models to replicate the behaviour of an actual system is called simulation. In this thesis, a software/data structure architecture without explicit locks is proposed to accelerate logic gate circuit simulation. We call thus system ZSIM. The ZSIM software architecture simulator targets low cost SIMD multi-core machines. Its performance is evaluated on the Intel Xeon Phi and 2 other machines (Intel Xeon and AMD Opteron). The aim of these experiments is to: • Verify that the data structure used allows SIMD acceleration, particularly on machines with gather instructions ( section 5.3.1). • Verify that, on sufficiently large circuits, substantial gains could be made from multicore parallelism ( section 5.3.2 ). • Show that a simulator using this approach out-performs an existing commercial simulator on a standard workstation ( section 5.3.3 ). • Show that the performance on a cheap Xeon Phi card is competitive with results reported elsewhere on much more expensive super-computers ( section 5.3.5 ). To evaluate the ZSIM, two types of test circuits were used: 1. Circuits from the IWLS benchmark suit [1] which allow direct comparison with other published studies of parallel simulators.2. Circuits generated by a parametrised circuit synthesizer. The synthesizer used an algorithm that has been shown to generate circuits that are statistically representative of real logic circuits. The synthesizer allowed testing of a range of very large circuits, larger than the ones for which it was possible to obtain open source files. The experimental results show that with SIMD acceleration and multicore, ZSIM gained a peak parallelisation factor of 300 on Intel Xeon Phi and 11 on Intel Xeon. With only SIMD enabled, ZSIM achieved a maximum parallelistion gain of 10 on Intel Xeon Phi and 4 on Intel Xeon. Furthermore, it was shown that this software architecture simulator running on a SIMD machine is much faster than, and can handle much bigger circuits than a widely used commercial simulator (Xilinx) running on a workstation. The performance achieved by ZSIM was also compared with similar pre-existing work on logic simulation targeting GPUs and supercomputers. It was shown that ZSIM simulator running on a Xeon Phi machine gives comparable simulation performance to the IBM Blue Gene supercomputer at very much lower cost. The experimental results have shown that the Xeon Phi is competitive with simulation on GPUs and allows the handling of much larger circuits than have been reported for GPU simulation. When targeting Xeon Phi architecture, the automatic cache management of the Xeon Phi, handles and manages the on-chip local store without any explicit mention of the local store being made in the architecture of the simulator itself. However, targeting GPUs, explicit cache management in program increases the complexity of the software architecture. Furthermore, one of the strongest points of the ZSIM simulator is its portability. Note that the same code was tested on both AMD and Xeon Phi machines. The same architecture that efficiently performs on Xeon Phi, was ported into a 64 core NUMA AMD Opteron. To conclude, the two main achievements are restated as following: The primary achievement of this work was proving that the ZSIM architecture was faster than previously published logic simulators on low cost platforms. The secondary achievement was the development of a synthetic testing suite that went beyond the scale range that was previously publicly available, based on prior work that showed the synthesis technique is valid

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks