29,123 research outputs found
Development of Classification Features of Mental Disorder Characteristics Using The Fuzzy Logic
AbstractâMental disorders are related to self-injurious
behavior problems of mind, such as the tendency to commit
suicide. This research has built a system to classify the
disorder. It explains that a system is used to help the people
recognize mental illness as a diagnosis detection. Diagnosis can
be done in the form of automation system using data mining
with Fuzzy Logic method. This system can make decision to
classify the mental illnesses based on symptoms. The first stage
of the research was collecting and preprocessing the data by
type. There are six types of psychiatric disorders that are
determined, namely Schizophrenia Paranoid, Phobia,
Depression, Anxiety, Obsessive Compulsive Disorder (OCD),
and Anti-Social. The source of the data were questionnaires
that consisted of the list of symptoms and types of disorders
that were distributed to 16 selected respondents, including
psychiatric specialists, psychology lecturers, general
practitioners, psychiatric hospital nurses, and psychology
students. The next stage was building the fuzzy process to
determine ten inputs in the form of symptoms. Outputs system
were six types of the disease. The fuzzy inference system used
Mamdani model and obtained 65 rules in determining the
classification. The result of system test is done for both training
and testing data and accuracy level of 91.67% for training data
and 81.94% for testing dat
E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods
During post-silicon validation, manufactured integrated circuits are
extensively tested in actual system environments to detect design bugs. Bug
localization involves identification of a bug trace (a sequence of inputs that
activates and detects the bug) and a hardware design block where the bug is
located. Existing bug localization practices during post-silicon validation are
mostly manual and ad hoc, and, hence, extremely expensive and time consuming.
This is particularly true for subtle electrical bugs caused by unexpected
interactions between a design and its electrical state. We present E-QED, a new
approach that automatically localizes electrical bugs during post-silicon
validation. Our results on the OpenSPARC T2, an open-source
500-million-transistor multicore chip design, demonstrate the effectiveness and
practicality of E-QED: starting with a failed post-silicon test, in a few hours
(9 hours on average) we can automatically narrow the location of the bug to
(the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on
average for a design with ~ 1 Million flip-flops) and also obtain the
corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast,
deter-mining this same information might take weeks (or even months) of mostly
manual work using traditional approaches
A High-level EDA Environment for the Automatic Insertion of HD-BIST Structures
This paper presents a High-Level EDA environment based on the Hierarchical Distributed BIST (HD-BIST), a flexible and reusable approach to solve BIST scheduling issues in System-on-Chip applications. HD-BIST allows activating and controlling different BISTed blocks at different levels of hierarchy, with a minimum overhead in terms of area and test time. Besides the hardware layer, the authors present the HD-BIST application layer, where a simple modeling language, and a prototypical EDA tool demonstrate the effectiveness of the automation of the HD-BIST insertion in the test strategy definition of a complex System-on-Chip
Test exploration and validation using transaction level models
The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space exploration and validation of test strategies and schedules using transaction level models (TLMs). Since many aspects of testing involve the transfer of a significant amount of test stimuli and responses, the communication-centric view of TLMs suits this purpose exceptionally wel
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