Printed Receive Coils with High Acoustic Transparency for Magnetic Resonance Guided Focused Ultrasound.

In magnetic resonance guided focused ultrasound (MRgFUS) therapy sound waves are focused through the body to selectively ablate difficult to access lesions and tissues. A magnetic resonance imaging (MRI) scanner non-invasively tracks the temperature increase throughout the tissue to guide the therapy. In clinical MRI, tightly fitted hardware comprised of multichannel coil arrays are required to capture high quality images at high spatiotemporal resolution. Ablating tissue requires a clear path for acoustic energy to travel but current array materials scatter and attenuate acoustic energy. As a result coil arrays are placed outside of the transducer, clear of the beam path, compromising imaging speed, resolution, and temperature accuracy of the scan. Here we show that when coil arrays are fabricated by additive manufacturing (i.e., printing), they exhibit acoustic transparency as high as 89.5%. This allows the coils to be placed in the beam path increasing the image signal to noise ratio (SNR) five-fold in phantoms and volunteers. We also characterize printed coil materials properties over time when submerged in the water required for acoustic coupling. These arrays offer high SNR and acceleration capabilities, which can address current challenges in treating head and abdominal tumors allowing MRgFUS to give patients better outcomes

A novel scan segmentation design method for avoiding shift timing failure in scan testing

ITC : 2011 IEEE International Test Conference , 20-22 Sep. 2011 , Anaheim, CA, USAHigh power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which are primarily caused by excessive switching activity in the proximities of clock paths that tends to introduce severe clock skew due to IR-drop-induced delay increase. This paper is the first of its kind to address this critical issue with a novel layout-aware scheme based on scan segmentation design, called LCTI-SS (Low-Clock-Tree-Impact Scan Segmentation). An optimal combination of scan segments is identified for simultaneous clocking so that the switching activity in the proximities of clock trees is reduced while maintaining the average power reduction effect on conventional scan segmentation. Experimental results on benchmark and industrial circuits have demonstrated the advantage of the LCTI-SS scheme

Low-Capture-Power Test Generation for Scan-Based At-Speed Testing

Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0\u27s and 1\u27s to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield lossIEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, US

REDUCING POWER DURING MANUFACTURING TEST USING DIFFERENT ARCHITECTURES

Power during manufacturing test can be several times higher than power consumption in functional mode. Excessive power during test can cause IR drop, over-heating, and early aging of the chips. In this dissertation, three different architectures have been introduced to reduce test power in general cases as well as in certain scenarios, including field test. In the first architecture, scan chains are divided into several segments. Every segment needs a control bit to enable capture in a segment when new faults are detectable on that segment for that pattern. Otherwise, the segment should be disabled to reduce capture power. We group the control bits together into one or more control chains. To address the extra pin(s) required to shift data into the control chain(s) and significant post processing in the first architecture, we explored a second architecture. The second architecture stitches the control bits into the chains they control as EECBs (embedded enable capture bits) in between the segments. This allows an ATPG software tool to automatically generate the appropriate EECB values for each pattern to maintain the fault coverage. This also works in the presence of an on-chip decompressor. The last architecture focuses primarily on the self-test of a device in a 3D stacked IC when an existing FPGA in the stack can be programmed as a tester. We show that the energy expended during test is significantly less than would be required using low power patterns fed by an on-chip decompressor for the same very short scan chains

A high speed Tri-Vision system for automotive applications

Purpose: Cameras are excellent ways of non-invasively monitoring the interior and exterior of vehicles. In particular, high speed stereovision and multivision systems are important for transport applications such as driver eye tracking or collision avoidance. This paper addresses the synchronisation problem which arises when multivision camera systems are used to capture the high speed motion common in such applications. Methods: An experimental, high-speed tri-vision camera system intended for real-time driver eye-blink and saccade measurement was designed, developed, implemented and tested using prototype, ultra-high dynamic range, automotive-grade image sensors specifically developed by E2V (formerly Atmel) Grenoble SA as part of the European FP6 project – sensation (advanced sensor development for attention stress, vigilance and sleep/wakefulness monitoring). Results : The developed system can sustain frame rates of 59.8 Hz at the full stereovision resolution of 1280 × 480 but this can reach 750 Hz when a 10 k pixel Region of Interest (ROI) is used, with a maximum global shutter speed of 1/48000 s and a shutter efficiency of 99.7%. The data can be reliably transmitted uncompressed over standard copper Camera-Link® cables over 5 metres. The synchronisation error between the left and right stereo images is less than 100 ps and this has been verified both electrically and optically. Synchronisation is automatically established at boot-up and maintained during resolution changes. A third camera in the set can be configured independently. The dynamic range of the 10bit sensors exceeds 123 dB with a spectral sensitivity extending well into the infra-red range. Conclusion: The system was subjected to a comprehensive testing protocol, which confirms that the salient requirements for the driver monitoring application are adequately met and in some respects, exceeded. The synchronisation technique presented may also benefit several other automotive stereovision applications including near and far-field obstacle detection and collision avoidance, road condition monitoring and others.Partially funded by the EU FP6 through the IST-507231 SENSATION project.peer-reviewe

A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing