A Physical Unclonable Function Based on Inter-Metal Layer Resistance Variations and an Evaluation of its Temperature and Voltage Stability

Keying material for encryption is stored as digital bistrings in non-volatile memory (NVM) on FPGAs and ASICs in current technologies. However, secrets stored this way are not secure against a determined adversary, who can use probing attacks to steal the secret. Physical Unclonable functions (PUFs) have emerged as an alternative. PUFs leverage random manufacturing variations as the source of entropy for generating random bitstrings, and incorporate an on-chip infrastructure for measuring and digitizing the corresponding variations in key electrical parameters, such as delay or voltage. PUFs are designed to reproduce a bitstring on demand and therefore eliminate the need for on-chip storage. In this dissertation, I propose a kind of PUF that measures resistance variations in inter-metal layers that define the power grid of the chip and evaluate its temperature and voltage stability. First, I introduce two implementations of a power grid-based PUF (PG-PUF). Then, I analyze the quality of bit strings generated without considering environmental variations from the PG-PUFs that leverage resistance variations in: 1) the power grid metal wires in 60 copies of a 90 nm chip and 2) in the power grid metal wires of 58 copies of a 65 nm chip. Next, I carry out a series of experiments in a set of 63 chips in IBM\u27s 90 nm technology at 9 TV corners, i.e., over all combination of 3 temperatures: -40oC, 25oC and 85oC and 3 voltages: nominal and +/-10% of the nominal supply voltage. The randomness, uniqueness and stability characteristics of bitstrings generated from PG-PUFs are evaluated. The stability of the PG-PUF and an on-chip voltage-to-digital (VDC) are also evaluated at 9 temperature-voltage corners. I introduce several techniques that have not been previously described, including a mechanism to eliminate voltage trends or \u27bias\u27 in the power grid voltage measurements, as well as a voltage threshold, Triple-Module-Redundancy (TMR) and majority voting scheme to identify and exclude unstable bits

A Novel Physical Unclonable Function (PUF) Featuring 0.113 FJ/B for IOT Devices

A physically unclonable function (PUF) is useful for authentication purposes and is a function created for its inherent uniqueness and inability of adversaries to duplicate it. In this thesis, a PUF is designed, which is a combination of both digital and analog circuits. This PUF could be designed partially based on a semi-automated approach using custom-built P-cells. The PUF is implemented using novel digital circuits, which have been designed using basic digital gates with a minimal number of transistors. The proposed PUF is developed by the introduction of a layer of multiplexers, which is triggered by a novel SR-latch based model for driving the selection lines. For a higher bit stability, the SR latch is combined with four-way asynchronous circuits, which are a class of coincident flip-flops. The resulted PUF consumes very little power and is suitable for sensors and low power applications. The proposed design was implemented in using the Cadence virtuoso IC 5.1.4 and based on the 180nm TSMC transistor models. The energy consumption and area of the proposed PUF is shown to be equal to 0.1132 fJ/bit and 8.03, which is considerably lower than the state of the arts. The uniqueness and reliability of the proposed PUF are estimated to be 48.66% and 99.33%