Software integration testing based on communication coverage criteria and partial model generation

This paper considers the problem of integration testing the components of a timed distributed software system. We assume that communication between the components is specified using timed interface automata and use computational tree logic (CTL) to define communication-based coverage criteria that refer to send- and receive-statements and communication paths. The proposed method enables testers to focus during component integration on such parts of the specification, e.g. behaviour specifications or Markovian usage models, that are involved in the communication between components to be integrated. A more specific application area of this approach is the integration of test-models, e.g. a transmission gear can be tested based on separated models for the driver behaviour, the engine condition, and the mechanical and hydraulical transmission states. Given such a state-based specification of a distributed system and a concrete coverage goal, a model checker is used in order to determine the coverage or generate test sequences that achieve the goal. Given the generated test sequences we derive a partial test-model of the components from which the test sequences are derived. The partial model can be used to drive further testing and can also be used as the basis for producing additional partial models in incremental integration testing. While the process of deriving the test sequences could suffer from a combinatorial explosion, the effort required to generate the partial model is polynomial in the number of test sequences and their length. Thus, where it is not feasible to produce test sequences that achieve a given type of coverage it is still possible to produce a partial model on the basis of test sequences generated to achieve some other criterion. As a result, the process of generating a partial model has the potential to scale to large industrial software systems. While a particular model checker, UPPAAL, was used, it should be relatively straightforward to adapt the approach for use with other CTL based model checkers. A potential additional benefit of the approach is that it provides a visual description of the state-based testing of distributed systems, which may be beneficial in other contexts such as education and comprehension

Observation mechanisms for in-field software-based self-test

When electronic systems are used in safety critical applications, as in the space, avionic, automotive or biomedical areas, it is required to maintain a very low probability of failures due to faults of any kind. Standards and regulations play a significant role, forcing companies to devise and adopt solutions able to achieve predefined targets in terms of dependability. Different techniques can be used to reduce fault occurrence or to minimize the probability that those faults produce critical failures (e.g., by introducing redundancy). Unfortunately, most of these techniques have a severe impact on the cost of the resulting product and, in some cases, the probability of failures is too large anyway. Hence, a solution commonly used in several scenarios lies on periodically performing a test able to detect the occurrence of any fault before it produces a failure (in-field test). This solution is normally based on forcing the processor inside the Device Under Test to execute a properly written test program, which is able to activate possible faults and to make their effects visible in some observable locations. This approach is also called Software-Based Self-Test, or SBST. If compared with testing in an end of manufacturing scenario, in-field testing has strong limitations in terms of access to the system inputs and outputs because Design for Testability structures and testing equipment are usually not available. As a consequence there are reduced possibilities to activate the faults and to observe their effects. This reduced observability particularly affects the ability to detect performance faults, i.e. faults that modify the timing but not the final value of computations. This kind of faults are hard to detect by only observing the final content of predefined memory locations, that is the usual test result observation method used in-field. Initially, the present work was focused on fault tolerance techniques against transient faults induced by ionizing radiation, the so called Single Event Upsets (SEUs). The main contribution of this early stage of the thesis lies in the experimental validation of the feasibility of achieving a safe system by using an architecture that combines task-level redundancy with already available IP cores, thus minimizing the development time. Task execution is replicated and Memory Protection is used to guarantee that any SEU may affect one and only one of the replicas. A proof of concept implementation was developed and validated using fault injection. Results outline the effectiveness of the architecture, and the overhead analysis shows that the proposed architecture is effective in reducing the resource occupation with respect to N-modular redundancy, at an affordable cost in terms of application execution time. The main part of the thesis is focused on in-field software-based self-test of permanent faults. A set of observation methods exploiting existing or ad-hoc hardware is proposed, aimed at obtaining a better coverage, in particular of performance faults. An extensive quantitative evaluation of the proposed methods is presented, including a comparison with the observation methods traditionally used in end of manufacturing and in-field testing. Results show that the proposed methods are a good complement to the traditionally used final memory content observation. Moreover, they show that an adequate combination of these complementary methods allows for achieving nearly the same fault coverage achieved when continuously observing all the processor outputs, which is an observation method commonly used for production test but usually not available in-field. A very interesting by-product of what is described above is a detailed description of how to compute the fault coverage achieved by functional in-field tests using a conventional fault simulator, a tool that is usually applied in an end of manufacturing testing scenario. Finally, another relevant result in the testing area is a method to detect permanent faults inside the cache coherence logic integrated in each cache controller of a multi-core system, based on the concurrent execution of a test program by the different cores in a coordinated manner. By construction, the method achieves full fault coverage of the static faults in the addressed logic.Cuando se utilizan sistemas electrónicos en aplicaciones críticas como en las áreas biomédica, aeroespacial o automotriz, se requiere mantener una muy baja probabilidad de malfuncionamientos debidos a cualquier tipo de fallas. Los estándares y normas juegan un papel importante, forzando a los desarrolladores a diseñar y adoptar soluciones que sean capaces de alcanzar objetivos predefinidos en cuanto a seguridad y confiabilidad. Pueden utilizarse diferentes técnicas para reducir la ocurrencia de fallas o para minimizar la probabilidad de que esas fallas produzcan mal funcionamientos críticos, por ejemplo a través de la incorporación de redundancia. Lamentablemente, muchas de esas técnicas afectan en gran medida el costo de los productos y, en algunos casos, la probabilidad de malfuncionamiento sigue siendo demasiado alta. En consecuencia, una solución usada a menudo en varios escenarios consiste en realizar periódicamente un test que sea capaz de detectar la ocurrencia de una falla antes de que esta produzca un mal funcionamiento (test en campo). En general, esta solución se basa en forzar a un procesador existente dentro del dispositivo bajo prueba a ejecutar un programa de test que sea capaz de activar las posibles fallas y de hacer que sus efectos sean visibles en puntos observables. A esta metodología también se la llama auto-test basado en software, o en inglés Software-Based Self-Test (SBST). Si se lo compara con un escenario de test de fin de fabricación, el test en campo tiene fuertes limitaciones en términos de posibilidad de acceso a las entradas y salidas del sistema, porque usualmente no se dispone de equipamiento de test ni de la infraestructura de Design for Testability. En consecuencia se tiene menos posibilidades de activar las fallas y de observar sus efectos. Esta observabilidad reducida afecta particularmente la habilidad para detectar fallas de performance, es decir fallas que modifican la temporización pero no el resultado final de los cálculos. Este tipo de fallas es difícil de detectar por la sola observación del contenido final de lugares de memoria, que es el método usual que se utiliza para observar los resultados de un test en campo. Inicialmente, el presente trabajo estuvo enfocado en técnicas para tolerar fallas transitorias inducidas por radiación ionizante, llamadas en inglés Single Event Upsets (SEUs). La principal contribución de esa etapa inicial de la tesis reside en la validación experimental de la viabilidad de obtener un sistema seguro, utilizando una arquitectura que combina redundancia a nivel de tareas con el uso de módulos hardware (IP cores) ya disponibles, que minimiza en consecuencia el tiempo de desarrollo. Se replica la ejecución de las tareas y se utiliza protección de memoria para garantizar que un SEU pueda afectar a lo sumo a una sola de las réplicas. Se desarrolló una implementación para prueba de concepto que fue validada mediante inyección de fallas. Los resultados muestran la efectividad de la arquitectura, y el análisis de los recursos utilizados muestra que la arquitectura propuesta es efectiva en reducir la ocupación con respecto a la redundancia modular con N réplicas, a un costo accesible en términos de tiempo de ejecución. La parte principal de esta tesis se enfoca en el área de auto-test en campo basado en software para la detección de fallas permanentes. Se propone un conjunto de métodos de observación utilizando hardware existente o ad-hoc, con el fin de obtener una mejor cobertura, en particular de las fallas de performance. Se presenta una extensa evaluación cuantitativa de los métodos propuestos, que incluye una comparación con los métodos tradicionalmente utilizados en tests de fin de fabricación y en campo. Los resultados muestran que los métodos propuestos son un buen complemento del método tradicionalmente usado que consiste en observar el valor final del contenido de memoria. Además muestran que una adecuada combinación de estos métodos complementarios permite alcanzar casi los mismos valores de cobertura de fallas que se obtienen mediante la observación continua de todas las salidas del procesador, método comúnmente usado en tests de fin de fabricación, pero que usualmente no está disponible en campo. Un subproducto muy interesante de lo arriba expuesto es la descripción detallada del procedimiento para calcular la cobertura de fallas lograda mediante tests funcionales en campo por medio de un simulador de fallas convencional, una herramienta que usualmente se aplica en escenarios de test de fin de fabricación. Finalmente, otro resultado relevante en el área de test es un método para detectar fallas permanentes dentro de la lógica de coherencia de cache que está integrada en el controlador de cache de cada procesador en un sistema multi procesador. El método está basado en la ejecución de un programa de test en forma coordinada por parte de los diferentes procesadores. Por construcción, el método cubre completamente las fallas de la lógica mencionad

A survey on software testability

Context: Software testability is the degree to which a software system or a unit under test supports its own testing. To predict and improve software testability, a large number of techniques and metrics have been proposed by both practitioners and researchers in the last several decades. Reviewing and getting an overview of the entire state-of-the-art and state-of-the-practice in this area is often challenging for a practitioner or a new researcher. Objective: Our objective is to summarize the body of knowledge in this area and to benefit the readers (both practitioners and researchers) in preparing, measuring and improving software testability. Method: To address the above need, the authors conducted a survey in the form of a systematic literature mapping (classification) to find out what we as a community know about this topic. After compiling an initial pool of 303 papers, and applying a set of inclusion/exclusion criteria, our final pool included 208 papers. Results: The area of software testability has been comprehensively studied by researchers and practitioners. Approaches for measurement of testability and improvement of testability are the most-frequently addressed in the papers. The two most often mentioned factors affecting testability are observability and controllability. Common ways to improve testability are testability transformation, improving observability, adding assertions, and improving controllability. Conclusion: This paper serves for both researchers and practitioners as an "index" to the vast body of knowledge in the area of testability. The results could help practitioners measure and improve software testability in their projects

Real-time fault injection using enhanced on-chip debug infrastructures

The rapid increase in the use of microprocessor-based systems in critical areas, where failures imply risks to human lives, to the environment or to expensive equipment, significantly increased the need for dependable systems, able to detect, tolerate and eventually correct faults. The verification and validation of such systems is frequently performed via fault injection, using various forms and techniques. However, as electronic devices get smaller and more complex, controllability and observability issues, and sometimes real time constraints, make it harder to apply most conventional fault injection techniques. This paper proposes a fault injection environment and a scalable methodology to assist the execution of real-time fault injection campaigns, providing enhanced performance and capabilities. Our proposed solutions are based on the use of common and customized on-chip debug (OCD) mechanisms, present in many modern electronic devices, with the main objective of enabling the insertion of faults in microprocessor memory elements with minimum delay and intrusiveness. Different configurations were implemented starting from basic Components Off-The-Shelf (COTS) microprocessors, equipped with real-time OCD infrastructures, to improved solutions based on modified interfaces, and dedicated OCD circuitry that enhance fault injection capabilities and performance. All methodologies and configurations were evaluated and compared concerning performance gain and silicon overhead

A Test Vector Minimization Algorithm Based On Delta Debugging For Post-Silicon Validation Of Pcie Rootport

In silicon hardware design, such as designing PCIe devices, design verification is an essential part of the design process, whereby the devices are subjected to a series of tests that verify the functionality. However, manual debugging is still widely used in post-silicon validation and is a major bottleneck in the validation process. The reason is a large number of tests vectors have to be analyzed, and this slows process down. To solve the problem, a test vector minimizer algorithm is proposed to eliminate redundant test vectors that do not contribute to reproduction of a test failure, hence, improving the debug throughput. The proposed methodology is inspired by the Delta Debugging algorithm which is has been used in automated software debugging but not in post-silicon hardware debugging. The minimizer operates on the principle of binary partitioning of the test vectors, and iteratively testing each subset (or complement of set) on a post-silicon System-Under-Test (SUT), to identify and eliminate redundant test vectors. Test results using test vector sets containing deliberately introduced erroneous test vectors show that the minimizer is able to isolate the erroneous test vectors. In test cases containing up to 10,000 test vectors, the minimizer requires about 16ns per test vector in the test case when only one erroneous test vector is present. In a test case with 1000 vectors including erroneous vectors, the same minimizer requires about 140μs per erroneous test vector that is injected. Thus, the minimizer’s CPU consumption is significantly smaller than the typical amount of time of a test running on SUT. The factors that significantly impact the performance of the algorithm are number of erroneous test vectors and distribution (spacing) of the erroneous vectors. The effect of total number of test vectors and position of the erroneous vectors are relatively minor compared to the other two. The minimization algorithm therefore was most effective for cases where there are only a few erroneous test vectors, with large number of test vectors in the set

Pre-validation of SoC via hardware and software co-simulation

Abstract. System-on-chips (SoCs) are complex entities consisting of multiple hardware and software components. This complexity presents challenges in their design, verification, and validation. Traditional verification processes often test hardware models in isolation until late in the development cycle. As a result, cooperation between hardware and software development is also limited, slowing down bug detection and fixing. This thesis aims to develop, implement, and evaluate a co-simulation-based pre-validation methodology to address these challenges. The approach allows for the early integration of hardware and software, serving as a natural intermediate step between traditional hardware model verification and full system validation. The co-simulation employs a QEMU CPU emulator linked to a register-transfer level (RTL) hardware model. This setup enables the execution of software components, such as device drivers, on the target instruction set architecture (ISA) alongside cycle-accurate RTL hardware models. The thesis focuses on two primary applications of co-simulation. Firstly, it allows software unit tests to be run in conjunction with hardware models, facilitating early communication between device drivers, low-level software, and hardware components. Secondly, it offers an environment for using software in functional hardware verification. A significant advantage of this approach is the early detection of integration errors. Software unit tests can be executed at the IP block level with actual hardware models, a task previously only possible with costly system-level prototypes. This enables earlier collaboration between software and hardware development teams and smoothens the transition to traditional system-level validation techniques.Järjestelmäpiirin esivalidointi laitteiston ja ohjelmiston yhteissimulaatiolla. Tiivistelmä. Järjestelmäpiirit (SoC) ovat monimutkaisia kokonaisuuksia, jotka koostuvat useista laitteisto- ja ohjelmistokomponenteista. Tämä monimutkaisuus asettaa haasteita niiden suunnittelulle, varmennukselle ja validoinnille. Perinteiset varmennusprosessit testaavat usein laitteistomalleja eristyksissä kehityssyklin loppuvaiheeseen saakka. Tämän myötä myös yhteistyö laitteisto- ja ohjelmistokehityksen välillä on vähäistä, mikä hidastaa virheiden tunnistamista ja korjausta. Tämän diplomityön tavoitteena on kehittää, toteuttaa ja arvioida laitteisto-ohjelmisto-yhteissimulointiin perustuva esivalidointimenetelmä näiden haasteiden ratkaisemiseksi. Menetelmä mahdollistaa laitteiston ja ohjelmiston varhaisen integroinnin, toimien luonnollisena välietappina perinteisen laitteistomallin varmennuksen ja koko järjestelmän validoinnin välillä. Yhteissimulointi käyttää QEMU suoritinemulaattoria, joka on yhdistetty rekisterinsiirtotason (RTL) laitteistomalliin. Tämä mahdollistaa ohjelmistokomponenttien, kuten laiteajureiden, suorittamisen kohdejärjestelmän käskysarja-arkkitehtuurilla (ISA) yhdessä kellosyklitarkkojen RTL laitteistomallien kanssa. Työ keskittyy kahteen yhteissimulaation pääsovellukseen. Ensinnäkin se mahdollistaa ohjelmiston yksikkötestien suorittamisen laitteistomallien kanssa, varmistaen kommunikaation laiteajurien, matalan tason ohjelmiston ja laitteistokomponenttien välillä. Toiseksi se tarjoaa ympäristön ohjelmiston käyttämiseen toiminnallisessa laitteiston varmennuksessa. Merkittävä etu tästä lähestymistavasta on integraatiovirheiden varhainen havaitseminen. Ohjelmiston yksikkötestejä voidaan suorittaa jo IP-lohkon tasolla oikeilla laitteistomalleilla, mikä on aiemmin ollut mahdollista vain kalliilla järjestelmätason prototyypeillä. Tämä mahdollistaa aikaisemman ohjelmisto- ja laitteistokehitystiimien välisen yhteistyön ja helpottaa siirtymistä perinteisiin järjestelmätason validointimenetelmiin

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

Automatic Detection, Validation and Repair of Race Conditions in Interrupt-Driven Embedded Software

Interrupt-driven programs are widely deployed in safety-critical embedded systems to perform hardware and resource dependent data operation tasks. The frequent use of interrupts in these systems can cause race conditions to occur due to interactions between application tasks and interrupt handlers (or two interrupt handlers). Numerous program analysis and testing techniques have been proposed to detect races in multithreaded programs. Little work, however, has addressed race condition problems related to hardware interrupts. In this paper, we present SDRacer, an automated framework that can detect, validate and repair race conditions in interrupt-driven embedded software. It uses a combination of static analysis and symbolic execution to generate input data for exercising the potential races. It then employs virtual platforms to dynamically validate these races by forcing the interrupts to occur at the potential racing points. Finally, it provides repair candidates to eliminate the detected races. We evaluate SDRacer on nine real-world embedded programs written in C language. The results show that SDRacer can precisely detect and successfully fix race conditions.Comment: This is a draft version of the published paper. Ke Wang provides suggestions for improving the paper and README of the GitHub rep