Improved Parameterized Algorithms for Constraint Satisfaction

For many constraint satisfaction problems, the algorithm which chooses a random assignment achieves the best possible approximation ratio. For instance, a simple random assignment for {\sc Max-E3-Sat} allows 7/8-approximation and for every \eps >0 there is no polynomial-time (7/8+\eps)-approximation unless P=NP. Another example is the {\sc Permutation CSP} of bounded arity. Given the expected fraction $\rho$ of the constraints satisfied by a random assignment (i.e. permutation), there is no (\rho+\eps)-approximation algorithm for every \eps >0, assuming the Unique Games Conjecture (UGC). In this work, we consider the following parameterization of constraint satisfaction problems. Given a set of $m$ constraints of constant arity, can we satisfy at least $\rho m +k$ constraint, where $\rho$ is the expected fraction of constraints satisfied by a random assignment? {\sc Constraint Satisfaction Problems above Average} have been posed in different forms in the literature \cite{Niedermeier2006,MahajanRamanSikdar09}. We present a faster parameterized algorithm for deciding whether $m/2+k/2$ equations can be simultaneously satisfied over ${\mathbb F}_2$. As a consequence, we obtain $O(k)$-variable bikernels for {\sc boolean CSPs} of arity $c$ for every fixed $c$, and for {\sc permutation CSPs} of arity 3. This implies linear bikernels for many problems under the "above average" parameterization, such as {\sc Max-$c$-Sat}, {\sc Set-Splitting}, {\sc Betweenness} and {\sc Max Acyclic Subgraph}. As a result, all the parameterized problems we consider in this paper admit $2^{O(k)}$-time algorithms. We also obtain non-trivial hybrid algorithms for every Max $c$-CSP: for every instance $I$, we can either approximate $I$ beyond the random assignment threshold in polynomial time, or we can find an optimal solution to $I$ in subexponential time.Comment: A preliminary version of this paper has been accepted for IPEC 201

Systems of Linear Equations over F2\mathbb{F}_2 and Problems Parameterized Above Average

In the problem Max Lin, we are given a system $Az=b$ of $m$ linear equations with $n$ variables over $\mathbb{F}_2$ in which each equation is assigned a positive weight and we wish to find an assignment of values to the variables that maximizes the excess, which is the total weight of satisfied equations minus the total weight of falsified equations. Using an algebraic approach, we obtain a lower bound for the maximum excess. Max Lin Above Average (Max Lin AA) is a parameterized version of Max Lin introduced by Mahajan et al. (Proc. IWPEC'06 and J. Comput. Syst. Sci. 75, 2009). In Max Lin AA all weights are integral and we are to decide whether the maximum excess is at least $k$, where $k$ is the parameter. It is not hard to see that we may assume that no two equations in $Az=b$ have the same left-hand side and $n={\rm rank A}$. Using our maximum excess results, we prove that, under these assumptions, Max Lin AA is fixed-parameter tractable for a wide special case: $m\le 2^{p(n)}$ for an arbitrary fixed function $p(n)=o(n)$. Max $r$-Lin AA is a special case of Max Lin AA, where each equation has at most $r$ variables. In Max Exact $r$-SAT AA we are given a multiset of $m$ clauses on $n$ variables such that each clause has $r$ variables and asked whether there is a truth assignment to the $n$ variables that satisfies at least $(1-2^{-r})m + k2^{-r}$ clauses. Using our maximum excess results, we prove that for each fixed $r\ge 2$, Max $r$-Lin AA and Max Exact $r$-SAT AA can be solved in time $2^{O(k \log k)}+m^{O(1)}.$ This improves $2^{O(k^2)}+m^{O(1)}$-time algorithms for the two problems obtained by Gutin et al. (IWPEC 2009) and Alon et al. (SODA 2010), respectively

CNN-Cert: An Efficient Framework for Certifying Robustness of Convolutional Neural Networks

Verifying robustness of neural network classifiers has attracted great interests and attention due to the success of deep neural networks and their unexpected vulnerability to adversarial perturbations. Although finding minimum adversarial distortion of neural networks (with ReLU activations) has been shown to be an NP-complete problem, obtaining a non-trivial lower bound of minimum distortion as a provable robustness guarantee is possible. However, most previous works only focused on simple fully-connected layers (multilayer perceptrons) and were limited to ReLU activations. This motivates us to propose a general and efficient framework, CNN-Cert, that is capable of certifying robustness on general convolutional neural networks. Our framework is general -- we can handle various architectures including convolutional layers, max-pooling layers, batch normalization layer, residual blocks, as well as general activation functions; our approach is efficient -- by exploiting the special structure of convolutional layers, we achieve up to 17 and 11 times of speed-up compared to the state-of-the-art certification algorithms (e.g. Fast-Lin, CROWN) and 366 times of speed-up compared to the dual-LP approach while our algorithm obtains similar or even better verification bounds. In addition, CNN-Cert generalizes state-of-the-art algorithms e.g. Fast-Lin and CROWN. We demonstrate by extensive experiments that our method outperforms state-of-the-art lower-bound-based certification algorithms in terms of both bound quality and speed.Comment: Accepted by AAAI 201

A Framework for Differential Frame-Based Matching Algorithms in Input-Queued Switches

This article is made available under terms and conditions applicable to Open Access Policy Articl

E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Multidimensional Modeling of Type I X-ray Bursts. I. Two-Dimensional Convection Prior to the Outburst of a Pure Helium Accretor

We present multidimensional simulations of the early convective phase preceding ignition in a Type I X-ray burst using the low Mach number hydrodynamics code, MAESTRO. A low Mach number approach is necessary in order to perform long-time integration required to study such phenomena. Using MAESTRO, we are able to capture the expansion of the atmosphere due to large-scale heating while capturing local compressibility effects such as those due to reactions and thermal diffusion. We also discuss the preparation of one-dimensional initial models and the subsequent mapping into our multidimensional framework. Our method of initial model generation differs from that used in previous multidimensional studies, which evolved a system through multiple bursts in one dimension before mapping onto a multidimensional grid. In our multidimensional simulations, we find that the resolution necessary to properly resolve the burning layer is an order of magnitude greater than that used in the earlier studies mentioned above. We characterize the convective patterns that form and discuss their resulting influence on the state of the convective region, which is important in modeling the outburst itself.Comment: 47 pages including 18 figures; submitted to ApJ; A version with higher resolution figures can be found at http://astro.sunysb.edu/cmalone/research/pure_he4_xrb/ms.pd