東京アクシオンヘリオスコープ装置による太陽アクシオンの探索

学位の種別: 論文博士審査委員会委員 : （主査）東京大学教授 駒宮 幸男, 東京大学教授 宮下 精二, 東京大学教授 森 俊則, 東京大学准教授 川本 辰男, 東京大学教授 塩澤 真人University of Tokyo(東京大学

Preliminary design study. Shuttle modular scanning spectroradiometer

Fundamental concepts on which to base a detailed design for a Shuttle Modular Scanning Spectroradiometer were developed, and a preliminary design is presented. The recommended design features modularity and flexibility. It includes a 75-cm f/1.7-telescope assembly in an all-reflective Schmidt configuration, a solid state scan system (pushbroom) with high resolution over a 15 deg field of view, and ten detector channels covering the spectral range from 0.45 to 12.5 micrometers. It uses charge transfer device techniques to accommodate a large number of detector elements for earth observation measurements. Methods for in-flight radiometric calibration, for image motion compensation, and for data processing are described. Recommendations for ground support equipment are included, and interfaces with the shuttle orbiter vehicle are illustrated

Aerospace Applications of Microprocessors

An assessment of the state of microprocessor applications is presented. Current and future requirements and associated technological advances which allow effective exploitation in aerospace applications are discussed

Space telescope optical telescope assembly/scientific instruments. Phase B: Preliminary design and program definition study. Volume 2A(3): Astrometry

Wide field measurements, namely, measurements of relative angular separations between stars over a relatively wide field for parallax and proper motion determinations, were made with the third fine guidance sensor. Narrow field measurements, i.e., double star measurements, are accomplished primarily with the area photometer or faint object camera at f/96. The wavelength range required can be met by the fine guidance sensor which has a spectral coverage from 3000 to 7500 A. The field of view of the fine guidance sensor also exceeds that required for the wide field astrometric instrument. Requirements require a filter wheel for the wide field astrometer, and so one was incorporated into the design of the fine guidance sensor. The filter wheel probably would contain two neutral density filters to extend the dynamic range of the sensor and three spectral filters for narrowing effective double star magnitude difference

Design and analysis of a scanning beam interference lithography system for patterning gratings with nanometer-level distortions

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2003.Includes bibliographical references (p. 353-364).This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.This thesis describes the design and analysis of a system for patterning large-area gratings with nanometer level phase distortions. The novel patterning method, termed scanning beam interference lithography (SBIL), uses the interference fringes between two coherent laser beams to define highly coherent gratings in photo resist. The substrate is step and scanned under the interference pattern to expose large gratings. Our experimental system, the "Nanoruler", employs interference lithography optics, an X-Y air bearing stage, column referencing displacement interferometry, refractometry, a grating length-scale reference, a beam alignment system, and acousto-optic fringe locking. Supporting systems also include an environmental enclosure, a beam steering system, and vibration isolation with feedforward. The system can pattern 300 mm diameter substrates. The errors are categorized and analyzed. The image-to-substrate motion during writing is comprised of "servo error", which is calculated from interferometric measurements, and unobservable error. The Nanoruler contains a built-in metrology capability where it can measure directly the image-to-substrate motions, which includes the unobservable error. In this special metrology mode, measurements can be performed at all substrate locations and on the fly - a capability possessed by no other patterning machine. This feature is used to assess the image-to-substrate motions. On-the-fly writing and metrology is further noted to be important because periodic errors in the interferometry can be eliminated. I control the fringe placement with a novel system of stage control and acousto-optic fringe locking. The experimentally verified system performance allows control of the servo error to the limits of quantization and latency.(cont.) The impacts of stage controller performance and vibration isolation feedforward performance on unobservable errors are modeled and verified. Extremely high resonant frequency metrology frames were designed that provided unusual insensitivity to disturbances. The vibration errors are estimated to be sub angstrom (0 to 100 Hz). Based on my results and modeling, it is concluded that SBIL is capable of satisfying sub nanometer placement requirements. In my work I have demonstrated long term (1 hour) fringe placement stability of 1.4 nm, 3 (0 to 1.4 Hz). Also, the short term placement stability is less than 4 nm, 3 (O to 5 kHz). When considering the integrated intensity of the scanned image traveling at 100 mm/s, the dose placement stability is 2.1 nm, 3. The wafer mapping repeatability was shown to be 2.9 nm, 3a while measuring a 100 mm substrate. The repeatability is consistent with error models. The index of air uniformity and the thermal stability of assemblies currently limit the repeatability. An improved system of thermal control, enclosed beam paths, and lower coefficient of thermal expansion components is critical for achieving sub nanometer placement error.by Paul Thomas Konkola.Ph.D

NASA Tech Briefs, November 2005

Topics covered include: Laser System for Precise, Unambiguous Range Measurements; Flexible Cryogenic Temperature and Liquid-Level Probes; Precision Cryogenic Dilatometer; Stroboscopic Interferometer for Measuring Mirror Vibrations; Some Improvements in H-PDLCs; Multiple-Bit Differential Detection of OQPSK; Absolute Position Encoders With Vertical Image Binning; Flexible, Carbon-Based Ohmic Contacts for Organic Transistors; GaAs QWIP Array Containing More Than a Million Pixels; AutoChem; Virtual Machine Language; Two-Dimensional Ffowcs Williams/Hawkings Equation Solver; Full Multigrid Flow Solver; Doclet To Synthesize UML; Computing Thermal Effects of Cavitation in Cryogenic Liquids; GUI for Computational Simulation of a Propellant Mixer; Control Program for an Optical-Calibration Robot; SQL-RAMS; Distributing Data from Desktop to Hand-Held Computers; Best-Fit Conic Approximation of Spacecraft Trajectory; Improved Charge-Transfer Fluorescent Dyes; Stability-Augmentation Devices for Miniature Aircraft; Tool Measures Depths of Defects on a Case Tang Joint; Two Heat-Transfer Improvements for Gas Liquefiers; Controlling Force and Depth in Friction Stir Welding; Spill-Resistant Alkali-Metal-Vapor Dispenser; A Methodology for Quantifying Certain Design Requirements During the Design Phase; Measuring Two Key Parameters of H3 Color Centers in Diamond; Improved Compression of Wavelet-Transformed Images; NASA Interactive Forms Type Interface - NIFTI; Predicting Numbers of Problems in Development of Software; Hot-Electron Photon Counters for Detecting Terahertz Photons; Magnetic Variations Associated With Solar Flares; and Artificial Intelligence for Controlling Robotic Aircraft