3,161 research outputs found

    New double-byte error-correcting codes for memory systems

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    Error-correcting or error-detecting codes have been used in the computer industry to increase reliability, reduce service costs, and maintain data integrity. The single-byte error-correcting and double-byte error-detecting (SbEC-DbED) codes have been successfully used in computer memory subsystems. There are many methods to construct double-byte error-correcting (DBEC) codes. In the present paper we construct a class of double-byte error-correcting codes, which are more efficient than those known to be optimum, and a decoding procedure for our codes is also considered

    Error control for reliable digital data transmission and storage systems

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    A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. In this paper we present some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative alorithm to find the error locator polynomial. Two codes are considered: (1) a d sub min = 4 single-byte-error-correcting (SBEC), double-byte-error-detecting (DBED) RS code; and (2) a d sub min = 6 double-byte-error-correcting (DBEC), triple-byte-error-detecting (TBED) RS code

    Design of a fault tolerant airborne digital computer. Volume 1: Architecture

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    This volume is concerned with the architecture of a fault tolerant digital computer for an advanced commercial aircraft. All of the computations of the aircraft, including those presently carried out by analogue techniques, are to be carried out in this digital computer. Among the important qualities of the computer are the following: (1) The capacity is to be matched to the aircraft environment. (2) The reliability is to be selectively matched to the criticality and deadline requirements of each of the computations. (3) The system is to be readily expandable. contractible, and (4) The design is to appropriate to post 1975 technology. Three candidate architectures are discussed and assessed in terms of the above qualities. Of the three candidates, a newly conceived architecture, Software Implemented Fault Tolerance (SIFT), provides the best match to the above qualities. In addition SIFT is particularly simple and believable. The other candidates, Bus Checker System (BUCS), also newly conceived in this project, and the Hopkins multiprocessor are potentially more efficient than SIFT in the use of redundancy, but otherwise are not as attractive

    Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte

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    Correcting single and detecting adjacent errors has become important in memory systems using high density DRAM chips. The reason is that, in these systems, the strike of a single energetic particle can upset one or more adjacent bits. In this article, we present a simple solution for this problem based on integer codes capable of correcting single errors and detecting l -bit burst errors confined to a b -bit byte ( 1<l<b ). Unlike the classical approach, the proposed one does not rely on the use of dedicated encoding/decoding hardware. Instead, it uses the processor as both encoder and decoder. The effectiveness of such solution is demonstrated on a theoretical model of an eight-core processor. The obtained results show that it has the potential to be used in future DDR5 systems.This is the peer-reviewed version of the paper: Radonjic, A., 2020. Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte. IEEE Transactions on Device and Materials Reliability 20, 748–753. [https://doi.org/10.1109/TDMR.2020.3033511]© 20XX IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Published version: [https://hdl.handle.net/21.15107/rcub_dais_9998

    Reed Solomon codes for error control in byte organized computer memory systems

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    A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. Some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation are presented. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative algorithm to find the error locator polynomial

    Standard interface definition for avionics data bus systems

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    Data bus for avionics system of space shuttle, noting functions of interface unit, error detection and recovery, redundancy, and bus control philosoph
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