Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

International audienceThis paper introduces a low cost near-field mapping system. This system scans automatically and dynamically, in the time domain, the magnetic field emitted by integrated circuits during the execution of a repetitive set of instructions. Application of this measurement system is given to an industrial chip designed with a 180nm CMOS process. This application demonstrates the efficiency of the system but also the helpfulness of the results obtained to identify paths followed by the current and to locate the potential IR drop zones

Applications of Integrated Near-field Antennas for Diagnosis of Electromagnetic Noises in Hybrid Electronic Architectures

In modern electronic devices, increase of switching performances and integration design with new techniques and material make the compliances with the internal and external radiated behavior more and more critical. This paper present a synthetic state of challenging works to deal with this constraint. Different techniques and prototypes have been studied and developed to integrate electromagnetic sensors and probes in hybrid technology circuits. A good realistic and real-time evaluation of electromagnetic activity of these circuits should help for EMC background and designing, but also should be convenient to optimize the electromagnetic behavior during the real activity of the electronics

EMI measurement and modeling techniques for complex electronic circuits and modules

This dissertation consists of four papers. In the first paper, a combined model for predicting the most critical radiated emissions and total radiated power due to the display signals in a TV by incorporating the main processing board using the Huygens Equivalence theorem and the radiation due to the flex cable based on active probe measurements was developed. In the second paper, a frequency-tunable resonant magnetic field probe was designed in the frequency range 900-2260 MHz for near-field scanning applications for the radio frequency interference studies by using a varactor diode providing the required capacitance and the parasitic inductance of a magnetic field loop (i.e., a parallel LC circuit). Measurement results showed good agreement with the simulated results. In the third paper, a wideband microwave method was developed as a means for rapid detection of slight dissimilarities (including counterfeit) and aging effects in integrated circuits (ICs) based on measuring the complex reflection coefficient of an IC when illuminated with an open-ended rectangular waveguide probe, at K-band (18-26.5 GHz) and Ka-band (26.5-40 GHz) microwave frequencies. In the fourth paper, a method to predict radiated emissions from DC-DC converters with cables attached on the input side to a LISN and on the output side to a DC brushless motor as load based on linear terminal equivalent circuit modeling was demonstrated. The linear terminal equivalent model was extracted using measured input and output side common mode currents for various characterization impedances connected at the input and output terminals of the converter --Abstract, page iv

Radio Frequency Based Programmable Logic Controller Anomaly Detection

The research goal involved developing improved methods for securing Programmable Logic Controller (PLC) devices against unauthorized entry and mitigating the risk of Supervisory Control and Data Acquisition (SCADA) attack by detecting malicious software and/or trojan hardware. A Correlation Based Anomaly Detection (CBAD) process was developed to enable 1) software anomaly detection discriminating between various operating conditions to detect malfunctioning or malicious software, firmware, etc., and 2) hardware component discrimination discriminating between various hardware components to detect malfunctioning or counterfeit, trojan, etc., components

High Accuracy Dual Probe Station for Near Field Scanning

Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic products being able to work according to their function, they must also comply with EMC standards to avoid producing excessive EM emissions. One technique for measuring EM emissions is near field measurements. This measurement technique can be used to determine the faulty components which contribute to the failure of complying to the EMC standards. A near field measurement system consists of near field probes, digital oscilloscope, and a probe station which can control the movement of the near field probe during measurement process. In this paper, the design and development of a dual probe near field measurement system or station with high accuracy will be discussed. From instrument testing, it can be concluded that the probe station can cover ample scanning area with movement accuracy up to 0.05 mm and it is able to work well according to the test scenario. The designed probe station is verified by measurement and highly recommended to be used for near field measurements

Index to NASA Tech Briefs, 1975

This index contains abstracts and four indexes--subject, personal author, originating Center, and Tech Brief number--for 1975 Tech Briefs

The NASA SBIR product catalog

The purpose of this catalog is to assist small business firms in making the community aware of products emerging from their efforts in the Small Business Innovation Research (SBIR) program. It contains descriptions of some products that have advanced into Phase 3 and others that are identified as prospective products. Both lists of products in this catalog are based on information supplied by NASA SBIR contractors in responding to an invitation to be represented in this document. Generally, all products suggested by the small firms were included in order to meet the goals of information exchange for SBIR results. Of the 444 SBIR contractors NASA queried, 137 provided information on 219 products. The catalog presents the product information in the technology areas listed in the table of contents. Within each area, the products are listed in alphabetical order by product name and are given identifying numbers. Also included is an alphabetical listing of the companies that have products described. This listing cross-references the product list and provides information on the business activity of each firm. In addition, there are three indexes: one a list of firms by states, one that lists the products according to NASA Centers that managed the SBIR projects, and one that lists the products by the relevant Technical Topics utilized in NASA's annual program solicitation under which each SBIR project was selected