Asynchronous Logic Design with Flip-Flop Constraints

Some techniques are presented to permit the implementation of asynchronous sequential circuits using standard flip-flops. An algorithm is presented for the RS flip-flop, and it is shown that any flow table may be realized using the algorithm (the flow table is assumed to be realizable using standard logic gates). The approach is shown to be directly applicable to synchronous circuits, and transition flip-flops (JK, D, and T) are analyzed using the ideas developed. Constraints are derived for the flow tables to meet to be realizable using transition flip-flops in asynchronous situations, and upper and lower bounds on the number of transition flip-flops required to implement a given flow table are stated

Synthesis of multiple-input change asynchronous finite state machines

Asynchronous finite state machines (AFSMS) have been limited because multiple-input changes have been disallowed. In this paper, we present an architecture and synthesis system to overcome this limitation. The AFSM marks potentially hazardous state transitions, and prevents output during them. A synthesis tool to create the AFS M incorporates novel algorithms to detect the hazardous states

Automatic synthesis of fast compact self-timed control circuits

Journal ArticleWe present a tool called MEAT which has been designed to automatically synthesize transistor level. CMOS, self-timed control circuits. MEAT has been used to specify and synthesize self-timed circuits for a fully self-timed 300,000 transistor communication coprocessor. The design is specified using finite state machines which permit burst-mode inputs. Burst-mode is a limited form of MIC (multiple input change) signalling. The primary goal of MEAT is to produce fast and compact circuits. In order to achieve this goal, MEAT implementations permit timing assumption which can by verifiably supported at the physical implementation level, and result in significant improvements in speed and area of the design. Since MEAT has been used for large designs, we have also been forced to make the algorithms efficient. The result is a tool which is efficient, easy to use by today's hardware designers since the specification is based on the commonly used finite state machine control model, and synthesize CMOS transistor implementations that are self-timed, fast and compact. The paper presents a description of the tool, the nature of the algorithms used, and examples of its use

Criteria for the Design of "fast," "safe" Asynchronous Sequential Fluidic Circuits

Engineerin

Development of Boolean calculus and its applications

The development of Boolean calculus for its application to developing digital system design methodologies that would reduce system complexity, size, cost, speed, power requirements, etc., is discussed. Synthesis procedures for logic circuits are examined particularly asynchronous circuits using clock triggered flip flops

Optimization of state assignment in a finite state machine: evaluation of a simulated annealing approach

In this research, the application of the Simulated Annealing algorithm to solve the state assignment problem in finite state machines is investigated. The state assignment is a classic NP-Complete problem in digital systems design and impacts directly on both area and power costs as well as on the design time. The solutions found in the literature uses population-based methods that consume additional computer resources. The Simulated Annealing algorithm has been chosen because it does not use populations while seeking a solution. Therefore, the objective of this research is to evaluate the impact on the quality of the solution when using the Simulated Annealing approach. The proposed solution is evaluated using the LGSynth89 benchmark and compared with other approaches in the state-of-the-art. The experimental simulations point out an average loss in solution quality of 11%, while an average processing performance of 86%. The results indicate that it is possible to have few quality losses with a significant increase in processing performance

NASA SERC 1990 Symposium on VLSI Design

This document contains papers presented at the first annual NASA Symposium on VLSI Design. NASA's involvement in this event demonstrates a need for research and development in high performance computing. High performance computing addresses problems faced by the scientific and industrial communities. High performance computing is needed in: (1) real-time manipulation of large data sets; (2) advanced systems control of spacecraft; (3) digital data transmission, error correction, and image compression; and (4) expert system control of spacecraft. Clearly, a valuable technology in meeting these needs is Very Large Scale Integration (VLSI). This conference addresses the following issues in VLSI design: (1) system architectures; (2) electronics; (3) algorithms; and (4) CAD tools

Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques

Due to the advancements in technology, electronic devices have been relied upon to operate under harsh conditions. Radiation is one of the main causes of different failures of the electronics devices. According to the operation environment, the sources of the radiation can be terrestrial or extra-terrestrial. For terrestrial the devices can be used in nuclear reactors or biomedical devices where the radiation is man-made. While for the extra- terrestrial, the devices can be used in satellites, the international space station or spaceships, where the radiation comes from various sources like the Sun. According to the operation environment the effects of radiation differ. These effects falls under two categories, total ionizing dose effect (TID) and single event effects (SEEs). TID effects can be affect the delay and leakage current of CMOS circuits negatively. The affects can therefore hinder the integrated circuits\u27 operation. Before the circuits are used, particularly in critical radiation heavy applications like military and space, testing under radiation must be done to avoid any failures during operation. The standard in testing electronic devices is generating worst case test vectors (WCTVs) and under radiation using these vectors the circuits are tested. However, the generation of these WCTVs have been very challenging so this approach is rarely used for TIDs effects. Design for testability (DFT) have been widely used in the industry for digital circuits testing applications. DFT is usually used with automatic test patterns generation software to generate test vectors against fault models of manufacturer defects for application specific integrated circuit (ASIC.) However, it was never used to generate test vectors for leakage current testing induced in ASICs exposed to TID radiation environment. The purpose of the thesis is to use DFT to identify WCTVs for leakage current failures in sequential circuits for ASIC devices exposed to TID. A novel methodology was devised to identify these test vectors. The methodology is validated and compared to previous non DFT methods. The methodology is proven to overcome the limitation of previous methodologies