Simultaneous real-time visible and infrared video with single-pixel detectors

Conventional cameras rely upon a pixelated sensor to provide spatial resolution. An alternative approach replaces the sensor with a pixelated transmission mask encoded with a series of binary patterns. Combining knowledge of the series of patterns and the associated filtered intensities, measured by single-pixel detectors, allows an image to be deduced through data inversion. In this work we extend the concept of a ‘single-pixel camera’ to provide continuous real-time video at 10 Hz , simultaneously in the visible and short-wave infrared, using an efficient computer algorithm. We demonstrate our camera for imaging through smoke, through a tinted screen, whilst performing compressive sampling and recovering high-resolution detail by arbitrarily controlling the pixel-binning of the masks. We anticipate real-time single-pixel video cameras to have considerable importance where pixelated sensors are limited, allowing for low-cost, non-visible imaging systems in applications such as night-vision, gas sensing and medical diagnostics

Lensless wide-field fluorescent imaging on a chip using compressive decoding of sparse objects.

We demonstrate the use of a compressive sampling algorithm for on-chip fluorescent imaging of sparse objects over an ultra-large field-of-view (>8 cm(2)) without the need for any lenses or mechanical scanning. In this lensfree imaging technique, fluorescent samples placed on a chip are excited through a prism interface, where the pump light is filtered out by total internal reflection after exciting the entire sample volume. The emitted fluorescent light from the specimen is collected through an on-chip fiber-optic faceplate and is delivered to a wide field-of-view opto-electronic sensor array for lensless recording of fluorescent spots corresponding to the samples. A compressive sampling based optimization algorithm is then used to rapidly reconstruct the sparse distribution of fluorescent sources to achieve approximately 10 microm spatial resolution over the entire active region of the sensor-array, i.e., over an imaging field-of-view of >8 cm(2). Such a wide-field lensless fluorescent imaging platform could especially be significant for high-throughput imaging cytometry, rare cell analysis, as well as for micro-array research

Quantum-inspired computational imaging

Computational imaging combines measurement and computational methods with the aim of forming images even when the measurement conditions are weak, few in number, or highly indirect. The recent surge in quantum-inspired imaging sensors, together with a new wave of algorithms allowing on-chip, scalable and robust data processing, has induced an increase of activity with notable results in the domain of low-light flux imaging and sensing. We provide an overview of the major challenges encountered in low-illumination (e.g., ultrafast) imaging and how these problems have recently been addressed for imaging applications in extreme conditions. These methods provide examples of the future imaging solutions to be developed, for which the best results are expected to arise from an efficient codesign of the sensors and data analysis tools.Y.A. acknowledges support from the UK Royal Academy of Engineering under the Research Fellowship Scheme (RF201617/16/31). S.McL. acknowledges financial support from the UK Engineering and Physical Sciences Research Council (grant EP/J015180/1). V.G. acknowledges support from the U.S. Defense Advanced Research Projects Agency (DARPA) InPho program through U.S. Army Research Office award W911NF-10-1-0404, the U.S. DARPA REVEAL program through contract HR0011-16-C-0030, and U.S. National Science Foundation through grants 1161413 and 1422034. A.H. acknowledges support from U.S. Army Research Office award W911NF-15-1-0479, U.S. Department of the Air Force grant FA8650-15-D-1845, and U.S. Department of Energy National Nuclear Security Administration grant DE-NA0002534. D.F. acknowledges financial support from the UK Engineering and Physical Sciences Research Council (grants EP/M006514/1 and EP/M01326X/1). (RF201617/16/31 - UK Royal Academy of Engineering; EP/J015180/1 - UK Engineering and Physical Sciences Research Council; EP/M006514/1 - UK Engineering and Physical Sciences Research Council; EP/M01326X/1 - UK Engineering and Physical Sciences Research Council; W911NF-10-1-0404 - U.S. Defense Advanced Research Projects Agency (DARPA) InPho program through U.S. Army Research Office; HR0011-16-C-0030 - U.S. DARPA REVEAL program; 1161413 - U.S. National Science Foundation; 1422034 - U.S. National Science Foundation; W911NF-15-1-0479 - U.S. Army Research Office; FA8650-15-D-1845 - U.S. Department of the Air Force; DE-NA0002534 - U.S. Department of Energy National Nuclear Security Administration)Accepted manuscrip

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter