Gate-Level Simulation of Quantum Circuits

While thousands of experimental physicists and chemists are currently trying to build scalable quantum computers, it appears that simulation of quantum computation will be at least as critical as circuit simulation in classical VLSI design. However, since the work of Richard Feynman in the early 1980s little progress was made in practical quantum simulation. Most researchers focused on polynomial-time simulation of restricted types of quantum circuits that fall short of the full power of quantum computation. Simulating quantum computing devices and useful quantum algorithms on classical hardware now requires excessive computational resources, making many important simulation tasks infeasible. In this work we propose a new technique for gate-level simulation of quantum circuits which greatly reduces the difficulty and cost of such simulations. The proposed technique is implemented in a simulation tool called the Quantum Information Decision Diagram (QuIDD) and evaluated by simulating Grover's quantum search algorithm. The back-end of our package, QuIDD Pro, is based on Binary Decision Diagrams, well-known for their ability to efficiently represent many seemingly intractable combinatorial structures. This reliance on a well-established area of research allows us to take advantage of existing software for BDD manipulation and achieve unparalleled empirical results for quantum simulation

Automatic verification of pipelined microprocessors

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.Includes bibliographical references (p. 71-72).by Vishal Lalit Bhagwati.M.S

Fast Heuristic and Exact Algorithms for Two-Level Hazard-Free Logic Minimization

None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and automated circuit partitioning techniques. This paper introduces two new 2-level logic minimizers:ESPRESSO-HF, a heuristic method which is loosely based on ESPRESSO-II, and IMPYMIN, an exact method based on implicit data structures. Both minimizers can solve all currently available examples, which range up to 32 inputs and 33 outputs.These include examples that have never been solved before.For examples that can be solved by other minimizers our methods are several orders of magnitude faster. As by-products of these algorithms, we also present two additional results. First, we introduce a fast new algorithm to check if a hazard-free covering problem can feasibly be solved. Second, we introduce a novel formulation of the 2-level hazard-free logic minimization problem by capturing hazard-freedom constraints within a synchronous function by adding new variables

Fast Heuristic and Exact Algorithms for Two-Level Hazard-Free Logic Minimization

None of the available minimizers for 2-level hazard-free logic minimization can synthesize very large circuits. This limitation has forced researchers to resort to manual and automated circuit partitioning techniques. This paper introduces two new 2-level logic minimizers:ESPRESSO-HF, a heuristic method which is loosely based on ESPRESSO-II, and IMPYMIN, an exact method based on implicit data structures. Both minimizers can solve all currently available examples, which range up to 32 inputs and 33 outputs.These include examples that have never been solved before.For examples that can be solved by other minimizers our methods are several orders of magnitude faster. As by-products of these algorithms, we also present two additional results. First, we introduce a fast new algorithm to check if a hazard-free covering problem can feasibly be solved. Second, we introduce a novel formulation of the 2-level hazard-free logic minimization problem by capturing hazard-freedom constraints within a synchronous function by adding new variables

An overview of decision table literature 1982-1995.

This report gives an overview of the literature on decision tables over the past 15 years. As much as possible, for each reference, an author supplied abstract, a number of keywords and a classification are provided. In some cases own comments are added. The purpose of these comments is to show where, how and why decision tables are used. The literature is classified according to application area, theoretical versus practical character, year of publication, country or origin (not necessarily country of publication) and the language of the document. After a description of the scope of the interview, classification results and the classification by topic are presented. The main body of the paper is the ordered list of publications with abstract, classification and comments.

Highly Automated Formal Verification of Arithmetic Circuits

This dissertation investigates the problems of two distinctive formal verification techniques for verifying large scale multiplier circuits and proposes two approaches to overcome some of these problems. The first technique is equivalence checking based on recurrence relations, while the second one is the symbolic computation technique which is based on the theory of Gröbner bases. This investigation demonstrates that approaches based on symbolic computation have better scalability and more robustness than state-of-the-art equivalence checking techniques for verification of arithmetic circuits. According to this conclusion, the thesis leverages the symbolic computation technique to verify floating-point designs. It proposes a new algebraic equivalence checking, in contrast to classical combinational equivalence checking, the proposed technique is capable of checking the equivalence of two circuits which have different architectures of arithmetic units as well as control logic parts, e.g., floating-point multipliers

IC design for reliability

textAs the feature size of integrated circuits goes down to the nanometer scale, transient and permanent reliability issues are becoming a significant concern for circuit designers. Traditionally, the reliability issues were mostly handled at the device level as a device engineering problem. However, the increasing severity of reliability challenges and higher error rates due to transient upsets favor higher-level design for reliability (DFR). In this work, we develop several methods for DFR at the circuit level. A major source of transient errors is the single event upset (SEU). SEUs are caused by high-energy particles present in the cosmic rays or emitted by radioactive contaminants in the chip packaging materials. When these particles hit a N+/P+ depletion region of an MOS transistor, they may generate a temporary logic fault. Depending on where the MOS transistor is located and what state the circuit is at, an SEU may result in a circuit-level error. We analyze SEUs both in combinational logic and memories (SRAM). For combinational logic circuit, we propose FASER, a Fast Analysis tool of Soft ERror susceptibility for cell-based designs. The efficiency of FASER is achieved through its static and vector-less nature. In order to evaluate the impact of SEU on SRAM, a theory for estimating dynamic noise margins is developed analytically. The results allow predicting the transient error susceptibility of an SRAM cell using a closedform expression. Among the many permanent failure mechanisms that include time-dependent oxide breakdown (TDDB), electro-migration (EM), hot carrier effect (HCE), and negative bias temperature instability (NBTI), NBTI has recently become important. Therefore, the main focus of our work is NBTI. NBTI occurs when the gate of PMOS is negatively biased. The voltage stress across the gate generates interface traps, which degrade the threshold voltage of PMOS. The degraded PMOS may eventually fail to meet timing requirement and cause functional errors. NBTI becomes severe at elevated temperatures. In this dissertation, we propose a NBTI degradation model that takes into account the temperature variation on the chip and gives the accurate estimation of the degraded threshold voltage. In order to account for the degradation of devices, traditional design methods add guard-bands to ensure that the circuit will function properly during its lifetime. However, the worst-case based guard-bands lead to significant penalty in performance. In this dissertation, we propose an effective macromodel-based reliability tracking and management framework, based on a hybrid network of on-chip sensors, consisting of temperature sensors and ring oscillators. The model is concerned specifically with NBTIinduced transistor aging. The key feature of our work, in contrast to the traditional tracking techniques that rely solely on direct measurement of the increase of threshold voltage or circuit delay, is an explicit macromodel which maps operating temperature to circuit degradation (the increase of circuit delay). The macromodel allows for costeffective tracking of reliability using temperature sensors and is also essential for enabling the control loop of the reliability management system. The developed methods improve the over-conservatism of the device-level, worstcase reliability estimation techniques. As the severity of reliability challenges continue to grow with technology scaling, it will become more important for circuit designers/CAD tools to be equipped with the developed methods.Electrical and Computer Engineerin