12,133 research outputs found

    Autonomous Recovery Of Reconfigurable Logic Devices Using Priority Escalation Of Slack

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    Field Programmable Gate Array (FPGA) devices offer a suitable platform for survivable hardware architectures in mission-critical systems. In this dissertation, active dynamic redundancy-based fault-handling techniques are proposed which exploit the dynamic partial reconfiguration capability of SRAM-based FPGAs. Self-adaptation is realized by employing reconfiguration in detection, diagnosis, and recovery phases. To extend these concepts to semiconductor aging and process variation in the deep submicron era, resilient adaptable processing systems are sought to maintain quality and throughput requirements despite the vulnerabilities of the underlying computational devices. A new approach to autonomous fault-handling which addresses these goals is developed using only a uniplex hardware arrangement. It operates by observing a health metric to achieve Fault Demotion using Recon- figurable Slack (FaDReS). Here an autonomous fault isolation scheme is employed which neither requires test vectors nor suspends the computational throughput, but instead observes the value of a health metric based on runtime input. The deterministic flow of the fault isolation scheme guarantees success in a bounded number of reconfigurations of the FPGA fabric. FaDReS is then extended to the Priority Using Resource Escalation (PURE) online redundancy scheme which considers fault-isolation latency and throughput trade-offs under a dynamic spare arrangement. While deep-submicron designs introduce new challenges, use of adaptive techniques are seen to provide several promising avenues for improving resilience. The scheme developed is demonstrated by hardware design of various signal processing circuits and their implementation on a Xilinx Virtex-4 FPGA device. These include a Discrete Cosine Transform (DCT) core, Motion Estimation (ME) engine, Finite Impulse Response (FIR) Filter, Support Vector Machine (SVM), and Advanced Encryption Standard (AES) blocks in addition to MCNC benchmark circuits. A iii significant reduction in power consumption is achieved ranging from 83% for low motion-activity scenes to 12.5% for high motion activity video scenes in a novel ME engine configuration. For a typical benchmark video sequence, PURE is shown to maintain a PSNR baseline near 32dB. The diagnosability, reconfiguration latency, and resource overhead of each approach is analyzed. Compared to previous alternatives, PURE maintains a PSNR within a difference of 4.02dB to 6.67dB from the fault-free baseline by escalating healthy resources to higher-priority signal processing functions. The results indicate the benefits of priority-aware resiliency over conventional redundancy approaches in terms of fault-recovery, power consumption, and resource-area requirements. Together, these provide a broad range of strategies to achieve autonomous recovery of reconfigurable logic devices under a variety of constraints, operating conditions, and optimization criteria

    Survivable algorithms and redundancy management in NASA's distributed computing systems

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    The design of survivable algorithms requires a solid foundation for executing them. While hardware techniques for fault-tolerant computing are relatively well understood, fault-tolerant operating systems, as well as fault-tolerant applications (survivable algorithms), are, by contrast, little understood, and much more work in this field is required. We outline some of our work that contributes to the foundation of ultrareliable operating systems and fault-tolerant algorithm design. We introduce our consensus-based framework for fault-tolerant system design. This is followed by a description of a hierarchical partitioning method for efficient consensus. A scheduler for redundancy management is introduced, and application-specific fault tolerance is described. We give an overview of our hybrid algorithm technique, which is an alternative to the formal approach given

    Optimised configuration of sensors for fault tolerant control of an electro-magnetic suspension system

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    For any given system the number and location of sensors can affect the closed-loop performance as well as the reliability of the system. Hence, one problem in control system design is the selection of the sensors in some optimum sense that considers both the system performance and reliability. Although some methods have been proposed that deal with some of the aforementioned aspects, in this work, a design framework dealing with both control and reliability aspects is presented. The proposed framework is able to identify the best sensor set for which optimum performance is achieved even under single or multiple sensor failures with minimum sensor redundancy. The proposed systematic framework combines linear quadratic Gaussian control, fault tolerant control and multiobjective optimisation. The efficacy of the proposed framework is shown via appropriate simulations on an electro-magnetic suspension system

    Fault-tolerant computer study

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    A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

    FAST : a fault detection and identification software tool

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    The aim of this work is to improve the reliability and safety of complex critical control systems by contributing to the systematic application of fault diagnosis. In order to ease the utilization of fault detection and isolation (FDI) tools in the industry, a systematic approach is required to allow the process engineers to analyze a system from this perspective. In this way, it should be possible to analyze this system to find if it provides the required fault diagnosis and redundancy according to the process criticality. In addition, it should be possible to evaluate what-if scenarios by slightly modifying the process (f.i. adding sensors or changing their placement) and evaluating the impact in terms of the fault diagnosis and redundancy possibilities. Hence, this work proposes an approach to analyze a process from the FDI perspective and for this purpose provides the tool FAST which covers from the analysis and design phase until the final FDI supervisor implementation in a real process. To synthesize the process information, a very simple format has been defined based on XML. This format provides the needed information to systematically perform the Structural Analysis of that process. Any process can be analyzed, the only restriction is that the models of the process components need to be available in the FAST tool. The processes are described in FAST in terms of process variables, components and relations and the tool performs the structural analysis of the process obtaining: (i) the structural matrix, (ii) the perfect matching, (iii) the analytical redundancy relations (if any) and (iv) the fault signature matrix. To aid in the analysis process, FAST can operate stand alone in simulation mode allowing the process engineer to evaluate the faults, its detectability and implement changes in the process components and topology to improve the diagnosis and redundancy capabilities. On the other hand, FAST can operate on-line connected to the process plant through an OPC interface. The OPC interface enables the possibility to connect to almost any process which features a SCADA system for supervisory control. When running in on-line mode, the process is monitored by a software agent known as the Supervisor Agent. FAST has also the capability of implementing distributed FDI using its multi-agent architecture. The tool is able to partition complex industrial processes into subsystems, identify which process variables need to be shared by each subsystem and instantiate a Supervision Agent for each of the partitioned subsystems. The Supervision Agents once instantiated will start diagnosing their local components and handle the requests to provide the variable values which FAST has identified as shared with other agents to support the distributed FDI process.Per tal de facilitar la utilització d'eines per la detecció i identificació de fallades (FDI) en la indústria, es requereix un enfocament sistemàtic per permetre als enginyers de processos analitzar un sistema des d'aquesta perspectiva. D'aquesta forma, hauria de ser possible analitzar aquest sistema per determinar si proporciona el diagnosi de fallades i la redundància d'acord amb la seva criticitat. A més, hauria de ser possible avaluar escenaris de casos modificant lleugerament el procés (per exemple afegint sensors o canviant la seva localització) i avaluant l'impacte en quant a les possibilitats de diagnosi de fallades i redundància. Per tant, aquest projecte proposa un enfocament per analitzar un procés des de la perspectiva FDI i per tal d'implementar-ho proporciona l'eina FAST la qual cobreix des de la fase d'anàlisi i disseny fins a la implementació final d'un supervisor FDI en un procés real. Per sintetitzar la informació del procés s'ha definit un format simple basat en XML. Aquest format proporciona la informació necessària per realitzar de forma sistemàtica l'Anàlisi Estructural del procés. Qualsevol procés pot ser analitzat, només hi ha la restricció de que els models dels components han d'estar disponibles en l'eina FAST. Els processos es descriuen en termes de variables de procés, components i relacions i l'eina realitza l'anàlisi estructural obtenint: (i) la matriu estructural, (ii) el Perfect Matching, (iii) les relacions de redundància analítica, si n'hi ha, i (iv) la matriu signatura de fallades. Per ajudar durant el procés d'anàlisi, FAST pot operar aïlladament en mode de simulació permetent a l'enginyer de procés avaluar fallades, la seva detectabilitat i implementar canvis en els components del procés i la topologia per tal de millorar les capacitats de diagnosi i redundància. Per altra banda, FAST pot operar en línia connectat al procés de la planta per mitjà d'una interfície OPC. La interfície OPC permet la possibilitat de connectar gairebé a qualsevol procés que inclogui un sistema SCADA per la seva supervisió. Quan funciona en mode en línia, el procés està monitoritzat per un agent software anomenat l'Agent Supervisor. Addicionalment, FAST té la capacitat d'implementar FDI de forma distribuïda utilitzant la seva arquitectura multi-agent. L'eina permet dividir sistemes industrials complexes en subsistemes, identificar quines variables de procés han de ser compartides per cada subsistema i generar una instància d'Agent Supervisor per cadascun dels subsistemes identificats. Els Agents Supervisor un cop activats, començaran diagnosticant els components locals i despatxant les peticions de valors per les variables que FAST ha identificat com compartides amb altres agents, per tal d'implementar el procés FDI de forma distribuïda.Postprint (published version

    Modeling and Analysis of Fault Tolerant Multistage Interconnection Networks

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    Performance and reliability are two of the most crucial issues in today\u27s high-performance instrumentation and measurement systems. High speed and compact density multistage interconnection networks (MINs) are widely-used subsystems in different applications. New performance models are proposed to evaluate a novel fault tolerant MIN arrangement, thereby assuring performance and reliability with high confidence level. A concurrent fault detection and recovery scheme for MINs is considered by rerouting over redundant interconnection links under stringent real-time constraints for digital instrumentation as sensor networks. A switch architecture for concurrent testing and diagnosis is proposed. New performance models are developed and used to evaluate the compound effect of fault tolerant operation (inclusive of testing, diagnosis, and recovery) on the overall throughput and delay. Results are shown for single transient and permanent stuck-at faults on links and storage units in the switching elements. It is shown that performance degradation due to fault tolerance is graceful while performance degradation without fault recovery is unacceptable

    New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

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    Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

    Error Detection and Diagnosis for System-on-Chip in Space Applications

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    Tesis por compendio de publicacionesLos componentes electrónicos comerciales, comúnmente llamados componentes Commercial-Off-The-Shelf (COTS) están presentes en multitud de dispositivos habituales en nuestro día a día. Particularmente, el uso de microprocesadores y sistemas en chip (SoC) altamente integrados ha favorecido la aparición de dispositivos electrónicos cada vez más inteligentes que sostienen el estilo de vida y el avance de la sociedad moderna. Su uso se ha generalizado incluso en aquellos sistemas que se consideran críticos para la seguridad, como vehículos, aviones, armamento, dispositivos médicos, implantes o centrales eléctricas. En cualquiera de ellos, un fallo podría tener graves consecuencias humanas o económicas. Sin embargo, todos los sistemas electrónicos conviven constantemente con factores internos y externos que pueden provocar fallos en su funcionamiento. La capacidad de un sistema para funcionar correctamente en presencia de fallos se denomina tolerancia a fallos, y es un requisito en el diseño y operación de sistemas críticos. Los vehículos espaciales como satélites o naves espaciales también hacen uso de microprocesadores para operar de forma autónoma o semi autónoma durante su vida útil, con la dificultad añadida de que no pueden ser reparados en órbita, por lo que se consideran sistemas críticos. Además, las duras condiciones existentes en el espacio, y en particular los efectos de la radiación, suponen un gran desafío para el correcto funcionamiento de los dispositivos electrónicos. Concretamente, los fallos transitorios provocados por radiación (conocidos como soft errors) tienen el potencial de ser una de las mayores amenazas para la fiabilidad de un sistema en el espacio. Las misiones espaciales de gran envergadura, típicamente financiadas públicamente como en el caso de la NASA o la Agencia Espacial Europea (ESA), han tenido históricamente como requisito evitar el riesgo a toda costa por encima de cualquier restricción de coste o plazo. Por ello, la selección de componentes resistentes a la radiación (rad-hard) específicamente diseñados para su uso en el espacio ha sido la metodología imperante en el paradigma que hoy podemos denominar industria espacial tradicional, u Old Space. Sin embargo, los componentes rad-hard tienen habitualmente un coste mucho más alto y unas prestaciones mucho menores que otros componentes COTS equivalentes. De hecho, los componentes COTS ya han sido utilizados satisfactoriamente en misiones de la NASA o la ESA cuando las prestaciones requeridas por la misión no podían ser cubiertas por ningún componente rad-hard existente. En los últimos años, el acceso al espacio se está facilitando debido en gran parte a la entrada de empresas privadas en la industria espacial. Estas empresas no siempre buscan evitar el riesgo a toda costa, sino que deben perseguir una rentabilidad económica, por lo que hacen un balance entre riesgo, coste y plazo mediante gestión del riesgo en un paradigma denominado Nuevo Espacio o New Space. Estas empresas a menudo están interesadas en entregar servicios basados en el espacio con las máximas prestaciones y el mayor beneficio posibles, para lo cual los componentes rad-hard son menos atractivos debido a su mayor coste y menores prestaciones que los componentes COTS existentes. Sin embargo, los componentes COTS no han sido específicamente diseñados para su uso en el espacio y típicamente no incluyen técnicas específicas para evitar que los efectos de la radiación afecten su funcionamiento. Los componentes COTS se comercializan tal cual son, y habitualmente no es posible modificarlos para mejorar su resistencia a la radiación. Además, los elevados niveles de integración de los sistemas en chip (SoC) complejos de altas prestaciones dificultan su observación y la aplicación de técnicas de tolerancia a fallos. Este problema es especialmente relevante en el caso de los microprocesadores. Por tanto, existe un gran interés en el desarrollo de técnicas que permitan conocer y mejorar el comportamiento de los microprocesadores COTS bajo radiación sin modificar su arquitectura y sin interferir en su funcionamiento para facilitar su uso en el espacio y con ello maximizar las prestaciones de las misiones espaciales presentes y futuras. En esta Tesis se han desarrollado técnicas novedosas para detectar, diagnosticar y mitigar los errores producidos por radiación en microprocesadores y sistemas en chip (SoC) comerciales, utilizando la interfaz de traza como punto de observación. La interfaz de traza es un recurso habitual en los microprocesadores modernos, principalmente enfocado a soportar las tareas de desarrollo y depuración del software durante la fase de diseño. Sin embargo, una vez el desarrollo ha concluido, la interfaz de traza típicamente no se utiliza durante la fase operativa del sistema, por lo que puede ser reutilizada sin coste. La interfaz de traza constituye un punto de conexión viable para observar el comportamiento de un microprocesador de forma no intrusiva y sin interferir en su funcionamiento. Como resultado de esta Tesis se ha desarrollado un módulo IP capaz de recabar y decodificar la información de traza de un microprocesador COTS moderno de altas prestaciones. El IP es altamente configurable y personalizable para adaptarse a diferentes aplicaciones y tipos de procesadores. Ha sido diseñado y validado utilizando el dispositivo Zynq-7000 de Xilinx como plataforma de desarrollo, que constituye un dispositivo COTS de interés en la industria espacial. Este dispositivo incluye un procesador ARM Cortex-A9 de doble núcleo, que es representativo del conjunto de microprocesadores hard-core modernos de altas prestaciones. El IP resultante es compatible con la tecnología ARM CoreSight, que proporciona acceso a información de traza en los microprocesadores ARM. El IP incorpora técnicas para detectar errores en el flujo de ejecución y en los datos de la aplicación ejecutada utilizando la información de traza, en tiempo real y con muy baja latencia. El IP se ha validado en campañas de inyección de fallos y también en radiación con protones y neutrones en instalaciones especializadas. También se ha combinado con otras técnicas de tolerancia a fallos para construir técnicas híbridas de mitigación de errores. Los resultados experimentales obtenidos demuestran su alta capacidad de detección y potencialidad en el diagnóstico de errores producidos por radiación. El resultado de esta Tesis, desarrollada en el marco de un Doctorado Industrial entre la Universidad Carlos III de Madrid (UC3M) y la empresa Arquimea, se ha transferido satisfactoriamente al entorno empresarial en forma de un proyecto financiado por la Agencia Espacial Europea para continuar su desarrollo y posterior explotación.Commercial electronic components, also known as Commercial-Off-The-Shelf (COTS), are present in a wide variety of devices commonly used in our daily life. Particularly, the use of microprocessors and highly integrated System-on-Chip (SoC) devices has fostered the advent of increasingly intelligent electronic devices which sustain the lifestyles and the progress of modern society. Microprocessors are present even in safety-critical systems, such as vehicles, planes, weapons, medical devices, implants, or power plants. In any of these cases, a fault could involve severe human or economic consequences. However, every electronic system deals continuously with internal and external factors that could provoke faults in its operation. The capacity of a system to operate correctly in presence of faults is known as fault-tolerance, and it becomes a requirement in the design and operation of critical systems. Space vehicles such as satellites or spacecraft also incorporate microprocessors to operate autonomously or semi-autonomously during their service life, with the additional difficulty that they cannot be repaired once in-orbit, so they are considered critical systems. In addition, the harsh conditions in space, and specifically radiation effects, involve a big challenge for the correct operation of electronic devices. In particular, radiation-induced soft errors have the potential to become one of the major risks for the reliability of systems in space. Large space missions, typically publicly funded as in the case of NASA or European Space Agency (ESA), have followed historically the requirement to avoid the risk at any expense, regardless of any cost or schedule restriction. Because of that, the selection of radiation-resistant components (known as rad-hard) specifically designed to be used in space has been the dominant methodology in the paradigm of traditional space industry, also known as “Old Space”. However, rad-hard components have commonly a much higher associated cost and much lower performance that other equivalent COTS devices. In fact, COTS components have already been used successfully by NASA and ESA in missions that requested such high performance that could not be satisfied by any available rad-hard component. In the recent years, the access to space is being facilitated in part due to the irruption of private companies in the space industry. Such companies do not always seek to avoid the risk at any cost, but they must pursue profitability, so they perform a trade-off between risk, cost, and schedule through risk management in a paradigm known as “New Space”. Private companies are often interested in deliver space-based services with the maximum performance and maximum benefit as possible. With such objective, rad-hard components are less attractive than COTS due to their higher cost and lower performance. However, COTS components have not been specifically designed to be used in space and typically they do not include specific techniques to avoid or mitigate the radiation effects in their operation. COTS components are commercialized “as is”, so it is not possible to modify them to improve their susceptibility to radiation effects. Moreover, the high levels of integration of complex, high-performance SoC devices hinder their observability and the application of fault-tolerance techniques. This problem is especially relevant in the case of microprocessors. Thus, there is a growing interest in the development of techniques allowing to understand and improve the behavior of COTS microprocessors under radiation without modifying their architecture and without interfering with their operation. Such techniques may facilitate the use of COTS components in space and maximize the performance of present and future space missions. In this Thesis, novel techniques have been developed to detect, diagnose, and mitigate radiation-induced errors in COTS microprocessors and SoCs using the trace interface as an observation point. The trace interface is a resource commonly found in modern microprocessors, mainly intended to support software development and debugging activities during the design phase. However, it is commonly left unused during the operational phase of the system, so it can be reused with no cost. The trace interface constitutes a feasible connection point to observe microprocessor behavior in a non-intrusive manner and without disturbing processor operation. As a result of this Thesis, an IP module has been developed capable to gather and decode the trace information of a modern, high-end, COTS microprocessor. The IP is highly configurable and customizable to support different applications and processor types. The IP has been designed and validated using the Xilinx Zynq-7000 device as a development platform, which is an interesting COTS device for the space industry. This device features a dual-core ARM Cortex-A9 processor, which is a good representative of modern, high-end, hard-core microprocessors. The resulting IP is compatible with the ARM CoreSight technology, which enables access to trace information in ARM microprocessors. The IP is able to detect errors in the execution flow of the microprocessor and in the application data using trace information, in real time and with very low latency. The IP has been validated in fault injection campaigns and also under proton and neutron irradiation campaigns in specialized facilities. It has also been combined with other fault-tolerance techniques to build hybrid error mitigation approaches. Experimental results demonstrate its high detection capabilities and high potential for the diagnosis of radiation-induced errors. The result of this Thesis, developed in the framework of an Industrial Ph.D. between the University Carlos III of Madrid (UC3M) and the company Arquimea, has been successfully transferred to the company business as a project sponsored by European Space Agency to continue its development and subsequent commercialization.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidenta: María Luisa López Vallejo.- Secretario: Enrique San Millán Heredia.- Vocal: Luigi Di Lill
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