2,806 research outputs found
Monitoring, Fault Diagnosis and Testing Real-time Systems using Analog and Digital Clocks
We give an overview of known methods for monitoring, fault diagnosis and testing problems for real-time systems using timed automata as the main model. We present techniques for constructing monitors/diagnosers/testers with analog or digital clocks. We list a number of open problems in the field
Development and analysis of the Software Implemented Fault-Tolerance (SIFT) computer
SIFT (Software Implemented Fault Tolerance) is an experimental, fault-tolerant computer system designed to meet the extreme reliability requirements for safety-critical functions in advanced aircraft. Errors are masked by performing a majority voting operation over the results of identical computations, and faulty processors are removed from service by reassigning computations to the nonfaulty processors. This scheme has been implemented in a special architecture using a set of standard Bendix BDX930 processors, augmented by a special asynchronous-broadcast communication interface that provides direct, processor to processor communication among all processors. Fault isolation is accomplished in hardware; all other fault-tolerance functions, together with scheduling and synchronization are implemented exclusively by executive system software. The system reliability is predicted by a Markov model. Mathematical consistency of the system software with respect to the reliability model has been partially verified, using recently developed tools for machine-aided proof of program correctness
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A survey on online monitoring approaches of computer-based systems
This report surveys forms of online data collection that are in current use (as well as being the subject of research to adapt them to changing technology and demands), and can be used as inputs to assessment of dependability and resilience, although they are not primarily meant for this use
High quality testing of grid style power gating
This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays introduced by the structure of the virtual voltage power-distribution-network (VPDN). To restore this loss, which could reach up to 70.3% on stuck-open faults, we propose a design-for-testability (DFT) logic that considers the impact of VPDN on fault coverage in order to constitute the proper interface between the VPDN and the DFT. The proposed logic can be easily implemented on-top of existing DFT solutions and its overhead is optimized by an algorithm that offers trade-off flexibility between test-application-time and hardware overhead. Through physical layout SPICE simulations, we show complete fault coverage recovery on stuck-open faults and 43.2% test-application-time improvement compared to a previously proposed DFT technique. To the best of our knowledge, this paper presents the first analysis of the VPDN impact on test qualit
Synchronization and fault-masking in redundant real-time systems
A real time computer may fail because of massive component failures or not responding quickly enough to satisfy real time requirements. An increase in redundancy - a conventional means of improving reliability - can improve the former but can - in some cases - degrade the latter considerably due to the overhead associated with redundancy management, namely the time delay resulting from synchronization and voting/interactive consistency techniques. The implications of synchronization and voting/interactive consistency algorithms in N-modular clusters on reliability are considered. All these studies were carried out in the context of real time applications. As a demonstrative example, we have analyzed results from experiments conducted at the NASA Airlab on the Software Implemented Fault Tolerance (SIFT) computer. This analysis has indeed indicated that in most real time applications, it is better to employ hardware synchronization instead of software synchronization and not allow reconfiguration
CMOS optical-sensor array with high output current levels and automatic signal-range centring
A CMOS compatible photosensor with high output current levels, and an area-efficient scheme for automatic signal-range centring according to illumination conditions are presented. The high output current levels allow the use of these devices in continuoustime asynchronous imagers, as well as in high-sampling-frequency applications
A brief network analysis of Artificial Intelligence publication
In this paper, we present an illustration to the history of Artificial
Intelligence(AI) with a statistical analysis of publish since 1940. We
collected and mined through the IEEE publish data base to analysis the
geological and chronological variance of the activeness of research in AI. The
connections between different institutes are showed. The result shows that the
leading community of AI research are mainly in the USA, China, the Europe and
Japan. The key institutes, authors and the research hotspots are revealed. It
is found that the research institutes in the fields like Data Mining, Computer
Vision, Pattern Recognition and some other fields of Machine Learning are quite
consistent, implying a strong interaction between the community of each field.
It is also showed that the research of Electronic Engineering and Industrial or
Commercial applications are very active in California. Japan is also publishing
a lot of papers in robotics. Due to the limitation of data source, the result
might be overly influenced by the number of published articles, which is to our
best improved by applying network keynode analysis on the research community
instead of merely count the number of publish.Comment: 18 pages, 7 figure
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Fault tolerance in super-scalar and VLIW processors
In this paper, we present a method for utilizing the spare capacity in super-scalar and very long instruction word (VLIW) processors to tolerate functional unit failures. Unlike previous work that was primarily interested in detection of transient faults, we are concerned with more permanent and/or intermittent faults which necessitate processor reconfiguration. Our method utilizes the VLIW compiler or the superscalar scheduler to insert redundant operations whenever idle functional units exist. The results of these redundant operations are used to detect and diagnose functional unit failures. For super-scalar processors, the scheduler can then utilize this information to ensure that operations are performed only on non-faulty units. In VLIW processors, this is equivalent to recompiling the code to run on the remaining non-faulty functional units. Since in certain applications, recompilation may not be possible, we consider two alternative reconfiguration strategies for VLIW processors. These strategies sacrifice storage space and execution time, respectively, in order to reconfigure without recompiling. We present Markov models that describe the behavior of processors using these different approaches and we evaluate their reliabilities. The results show that, while super-scalar and VLIW with recompilation provide the highest reliability, all proposed strategies significantly increase reliability over that of an unprotected processor
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