A Hardware Security Solution against Scan-Based Attacks

Scan based Design for Test (DfT) schemes have been widely used to achieve high fault coverage for integrated circuits. The scan technique provides full access to the internal nodes of the device-under-test to control them or observe their response to input test vectors. While such comprehensive access is highly desirable for testing, it is not acceptable for secure chips as it is subject to exploitation by various attacks. In this work, new methods are presented to protect the security of critical information against scan-based attacks. In the proposed methods, access to the circuit containing secret information via the scan chain has been severely limited in order to reduce the risk of a security breach. To ensure the testability of the circuit, a built-in self-test which utilizes an LFSR as the test pattern generator (TPG) is proposed. The proposed schemes can be used as a countermeasure against side channel attacks with a low area overhead as compared to the existing solutions in literature

Trojans in Early Design Steps—An Emerging Threat

Hardware Trojans inserted by malicious foundries during integrated circuit manufacturing have received substantial attention in recent years. In this paper, we focus on a different type of hardware Trojan threats: attacks in the early steps of design process. We show that third-party intellectual property cores and CAD tools constitute realistic attack surfaces and that even system specification can be targeted by adversaries. We discuss the devastating damage potential of such attacks, the applicable countermeasures against them and their deficiencies

Self-Partial and Dynamic Reconfiguration Implementation for AES using FPGA

This paper addresses efficient hardware/software implementation approaches for the AES (Advanced Encryption Standard) algorithm and describes the design and performance testing algorithm for embedded system. Also, with the spread of reconfigurable hardware such as FPGAs (Field Programmable Gate Array) embedded cryptographic hardware became cost-effective. Nevertheless, it is worthy to note that nowadays, even hardwired cryptographic algorithms are not so safe. From another side, the self-reconfiguring platform is reported that enables an FPGA to dynamically reconfigure itself under the control of an embedded microprocessor. Hardware acceleration significantly increases the performance of embedded systems built on programmable logic. Allowing a FPGA-based MicroBlaze processor to self-select the coprocessors uses can help reduce area requirements and increase a system's versatility. The architecture proposed in this paper is an optimal hardware implementation algorithm and takes dynamic partially reconfigurable of FPGA. This implementation is good solution to preserve confidentiality and accessibility to the information in the numeric communication

An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

Multi-core devices for safety-critical systems: a survey

Multi-core devices are envisioned to support the development of next-generation safety-critical systems, enabling the on-chip integration of functions of different criticality. This integration provides multiple system-level potential benefits such as cost, size, power, and weight reduction. However, safety certification becomes a challenge and several fundamental safety technical requirements must be addressed, such as temporal and spatial independence, reliability, and diagnostic coverage. This survey provides a categorization and overview at different device abstraction levels (nanoscale, component, and device) of selected key research contributions that support the compliance with these fundamental safety requirements.This work has been partially supported by the Spanish Ministry of Economy and Competitiveness under grant TIN2015-65316-P, Basque Government under grant KK-2019-00035 and the HiPEAC Network of Excellence. The Spanish Ministry of Economy and Competitiveness has also partially supported Jaume Abella under Ramon y Cajal postdoctoral fellowship (RYC-2013-14717).Peer ReviewedPostprint (author's final draft

Towards a Scalable Hardware/Software Co-Design Platform for Real-time Pedestrian Tracking Based on a ZYNQ-7000 Device

Currently, most designers face a daunting task to research different design flows and learn the intricacies of specific software from various manufacturers in hardware/software co-design. An urgent need of creating a scalable hardware/software co-design platform has become a key strategic element for developing hardware/software integrated systems. In this paper, we propose a new design flow for building a scalable co-design platform on FPGA-based system-on-chip. We employ an integrated approach to implement a histogram oriented gradients (HOG) and a support vector machine (SVM) classification on a programmable device for pedestrian tracking. Not only was hardware resource analysis reported, but the precision and success rates of pedestrian tracking on nine open access image data sets are also analysed. Finally, our proposed design flow can be used for any real-time image processingrelated products on programmable ZYNQ-based embedded systems, which benefits from a reduced design time and provide a scalable solution for embedded image processing products

Test Strategies for Embedded ADC Cores in a System-on-Chip, A Case Study

Testing of a deeply embedded mixed-signal core in a System-on-Chip (SoC) is a challenging issue due to the communication bottleneck in accessing the core from external automatic test equipment. Consequently, in many cases the preferred approach is built-in self-test (BIST), where the major part of test activity is performed within the unit-under-test and only final results are communicated to the external tester. IEEE Standard 1500 provides efficient test infrastructure for testing digital cores; however, its applications in mixed-signal core test remain an open issue. In this paper we address the problem of implementing BIST of a mixed-signal core in a IEEE Std 1500 test wrapper and discuss advantages and drawbacks of different test strategies. While the case study is focused on histogram based test of ADC, test strategies of other types of mixed-signal cores related to trade-off between performance (i.e., test time) and required resources are likely to follow similar conclusions