630 research outputs found

    Design of a 1.9 GHz low-power LFSR circuit using the Reed-Solomon algorithm for Pseudo-Random Test Pattern Generation

    Get PDF
    A linear feedback shift register (LFSR) has been frequently used in the Built-in Self-Test (BIST) designs for the pseudo-random test pattern generation. The volume of the test patterns and test power dissipation are the key features in the large complex designs. The objective of this paper is to propose a new LFSR circuit based on the proposed Reed-Solomon (RS) algorithm. The RS algorithm is created by considering the factors of the maximum length test pattern with a minimum distance over the time. Also, it has achieved an effective generation of test patterns over a stage of complexity order O (m log2 m), where m denotes the total number of message bits. We analyzed our RS LFSR mathematically using the feedback polynomial function for an area-sensitive design. However, the bit-wise stages of the proposed RS LFSR are simulated using the TSMC 130 nm IC design tool in the Mentor Graphics platform. Experimental results showed that the proposed LFSR achieved the effective pseudo-random test patterns with a low-test power dissipation (25.13 µW). Ultimately, the circuit has operated in the highest operating frequency (1.9 GHz) environment.   &nbsp

    Impact of LFSR Seeding on the Test Pattern Generator in BIST

    Get PDF
    This paper considers the problem of minimizing the power required to test a BIST based combinational circuit without modifying the test pattern generator and with no extra area or delay overhead. The objective of this paper is to analyze the impact of the polynomial and seed selection of the LFSR on the power consumed by the circuit. It is shown that proper selection of the seed of the LFSR can lead to significant decrease in the power consumption of the BIST sessions. For this purpose, a Bit Flipping LFSR is used as a test pattern generator in the BIST design. Experimental results using the ISCAS benchmark circuits are reported, showing variations of the seed selected for the LFSR, the power consumed is ranging from 5.5% to 13.5%

    KAPow: A System Identification Approach to Online Per-Module Power Estimation in FPGA Designs

    Get PDF
    In a modern FPGA system-on-chip design, it is often insufficient to simply assess the total power consumption of the entire circuit by design-time estimation or runtime power rail measurement. Instead, to make better runtime decisions, it is desirable to understand the power consumed by each individual module in the system. In this work, we combine boardlevel power measurements with register-level activity counting to build an online model that produces a breakdown of power consumption within the design. Online model refinement avoids the need for a time-consuming characterisation stage and also allows the model to track long-term changes to operating conditions. Our flow is named KAPow, a (loose) acronym for ‘K’ounting Activity for Power estimation, which we show to be accurate, with per-module power estimates as close to ±5mW of true measurements, and to have low overheads. We also demonstrate an application example in which a permodule power breakdown can be used to determine an efficient mapping of tasks to modules and reduce system-wide power consumption by over 8%

    An approach to Measure Transition Density of Binary Sequences for X-filling based Test Pattern Generator in Scan based Design

    Get PDF
    Switching activity and Transition density computation is an essential stage for dynamic power estimation and testing time reduction. The study of switching activity, transition densities and weighted switching activities of pseudo random binary sequences generated by Linear Feedback shift registers and Feed Forward shift registers plays a crucial role in design approaches of Built-In Self Test, cryptosystems, secure scan designs and other applications. This paper proposed an approach to find transition densities, which plays an important role in choosing of test pattern generator We have analyze conventional and proposed designs using our approache, This work also describes the testing time of benchmark circuits. The outcome of this paper is presented in the form of algorithm, theorems with proofs and analyses table which strongly support the same. The proposed algorithm reduces switching activity and testing time up to 51.56% and 84.61% respectively

    Run-time power and performance scaling in 28 nm FPGAs

    Get PDF

    DESIGN AUTOMATION FOR LOW POWER RFID TAGS

    Get PDF
    Radio Frequency Identification (RFID) tags are small, wireless devices capable of automated item identification, used in a variety of applications including supply chain management, asset management, automatic toll collection (EZ Pass), etc. However, the design of these types of custom systems using the traditional methods can take months for a hardware engineer to develop and debug. In this dissertation, an automated, low-power flow for the design of RFID tags has been developed, implemented and validated. This dissertation presents the RFID Compiler, which permits high-level design entry using a simple description of the desired primitives and their behavior in ANSI-C. The compiler has different back-ends capable of targeting microprocessor-based or custom hardware-based tags. For the hardware-based tag, the back-end automatically converts the user-supplied behavior in C to low power synthesizable VHDL optimized for RFID applications. The compiler also integrates a fast, high-level power macromodeling flow, which can be used to generate power estimates within 15% accuracy of industry CAD tools and to optimize the primitives and / or the behaviors, compared to conventional practices. Using the RFID Compiler, the user can develop the entire design in a matter of days or weeks. The compiler has been used to implement standards such as ANSI, ISO 18000-7, 18000-6C and 18185-7. The automatically generated tag designs were validated by targeting microprocessors such as the AD Chips EISC and FPGAs such as Xilinx Spartan 3. The corresponding ASIC implementation is comparable to the conventionally designed commercial tags in terms of the energy and area. Thus, the RFID Compiler permits the design of power efficient, custom RFID tags by a wider audience with a dramatically reduced design cycle

    A hardware-embedded, delay-based PUF engine designed for use in cryptographic and authentication applications

    Get PDF
    Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs), as well as codes for the activation of on-chip features, require the use of embedded secret information. The generation of secret bitstrings using physical unclonable functions, or PUFs, provides several distinct advantages over conventional methods, including the elimination of costly non-volatile memory, and the potential to increase the random bits available to applications. In this dissertation, a Hardware-Embedded Delay PUF (HELP) is proposed that is designed to leverage path delay variations that occur in the core logic macros of a chip to create random bitstrings. A thorough discussion is provided of the operational details of an embedded path timing structure called REBEL that is used by HELP to provide the timing functionality upon which HELP relies for the entropy source for the cryptographic quality of the bitstrings. Further details of the FPGA-based implementation used to prove the viability of the HELP PUF concept are included, along with a discussion of the evolution of the techniques employed in realizing the final PUF engine design. The bitstrings produced by a set of 30 FPGA boards are evaluated with regard to several statistical quality metrics including uniqueness, randomness, and stability. The stability characteristics of the bitstrings are evaluated by subjecting the FPGAs to commercial-grade temperature and power supply voltage variations. In particular, this work evaluates the reproducibility of the bitstrings generated at 0C, 25C, and 70C, and 10% of the rated supply voltage. A pair of error avoidance schemes are proposed and presented that provide significant improvements to the HELP PUF\u27s resiliency against bit-flip errors in the bitstrings
    corecore