Minimizing and exploiting leakage in VLSI

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally dynamic (switching) power has dominated the total power consumption of VLSI circuits. However, due to process scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. This dissertation explores techniques to reduce leakage, as well as techniques to exploit leakage currents through the use of sub-threshold circuits. This dissertation consists of two studies. In the first study, techniques to reduce leakage are presented. These include a low leakage ASIC design methodology that uses high VT sleep transistors selectively, a methodology that combines input vector control and circuit modification, and a scheme to find the optimum reverse body bias voltage to minimize leakage. As the minimum feature size of VLSI fabrication processes continues to shrink with each successive process generation (along with the value of supply voltage and therefore the threshold voltage of the devices), leakage currents increase exponentially. Leakage currents are hence seen as a necessary evil in traditional VLSI design methodologies. We present an approach to turn this problem into an opportunity. In the second study in this dissertation, we attempt to exploit leakage currents to perform computation. We use sub-threshold digital circuits and come up with ways to get around some of the pitfalls associated with sub-threshold circuit design. These include a technique that uses body biasing adaptively to compensate for Process, Voltage and Temperature (PVT) variations, a design approach that uses asynchronous micro-pipelined Network of Programmable Logic Arrays (NPLAs) to help improve the throughput of sub-threshold designs, and a method to find the optimum supply voltage that minimizes energy consumption in a circuit

Design Methodologies and CAD Tools for Leakage Power Optimization in FPGAs

The scaling of the CMOS technology has precipitated an exponential increase in both subthreshold and gate leakage currents in modern VLSI designs. Consequently, the contribution of leakage power to the total chip power dissipation for CMOS designs is increasing rapidly, which is estimated to be 40% for the current technology generations and is expected to exceed 50% by the 65nm CMOS technology. In FPGAs, the power dissipation problem is further aggravated when compared to ASIC designs because FPGA use more transistors per logic function when compared to ASIC designs. Consequently, solving the leakage power problem is pivotal to devising power-aware FPGAs in the nanometer regime. This thesis focuses on devising both architectural and CAD techniques for leakage mitigation in FPGAs. Several CAD and architectural modifications are proposed to reduce the impact of leakage power dissipation on modern FPGAs. Firstly, multi-threshold CMOS (MTCMOS) techniques are introduced to FPGAs to permanently turn OFF the unused resources of the FPGA, FPGAs are characterized with low utilization percentages that can reach 60%. Moreover, such architecture enables the dynamic shutting down of the FPGA idle parts, thus reducing the standby leakage significantly. Employing the MTCMOS technique in FPGAs requires several changes to the FPGA architecture, including the placement and routing of the sleep signals and the MTCMOS granularity. On the CAD level, the packing and placement stages are modified to allow the possibility of dynamically turning OFF the idle parts of the FPGA. A new activity generation algorithm is proposed and implemented that aims to identify the logic blocks in a design that exhibit similar idleness periods. Several criteria for the activity generation algorithm are used, including connectivity and logic function. Several versions of the activity generation algorithm are implemented to trade power savings with runtime. A newly developed packing algorithm uses the resulting activities to minimize leakage power dissipation by packing the logic blocks with similar or close activities together. By proposing an FPGA architecture that supports MTCMOS and developing a CAD tool that supports the new architecture, an average power savings of 30% is achieved for a 90nm CMOS process while incurring a speed penalty of less than 5%. This technique is further extended to provide a timing-sensitive version of the CAD flow to vary the speed penalty according to the criticality of each logic block. Secondly, a new technique for leakage power reduction in FPGAs based on the use of input dependency is developed. Both subthreshold and gate leakage power are heavily dependent on the input state. In FPGAs, the effect of input dependency is exacerbated due to the use of pass-transistor multiplexer logic, which can exhibit up to 50% variation in leakage power due to the input states. In this thesis, a new algorithm is proposed that uses bit permutation to reduce subthreshold and gate leakage power dissipation in FPGAs. The bit permutation algorithm provides an average leakage power reduction of 40% while having less than 2% impact on the performance and no penalty on the design area. Thirdly, an accurate probabilistic power model for FPGAs is developed to quantify the savings from the proposed leakage power reduction techniques. The proposed power model accounts for dynamic, short circuit, and leakage power (including both subthreshold and gate leakage power) dissipation in FPGAs. Moreover, the power model accounts for power due to glitches, which accounts for almost 20% of the dynamic power dissipation in FPGAs. The use of probabilities in the power model makes it more computationally efficient than the other FPGA power models in the literature that rely on long input sequence simulations. One of the main advantages of the proposed power model is the incorporation of spatial correlation while estimating the signal probability. Other probabilistic FPGA power models assume spatial independence among the design signals, thus overestimating the power calculations. In the proposed model, a probabilistic model is proposed for spatial correlations among the design signals. Moreover, a different variation is proposed that manages to capture most of the spatial correlations with minimum impact on runtime. Furthermore, the proposed power model accounts for the input dependency of subthreshold and gate leakage power dissipation. By comparing the proposed power model to HSpice simulation, the estimated power is within 8% and is closer to HSpice simulations than other probabilistic FPGA power models by an average of 20%

Energy Efficient Design for Deep Sub-micron CMOS VLSIs

Over the past decade, low power, energy efficient VLSI design has been the focal point of active research and development. The rapid technology scaling, the growing integration capacity, and the mounting active and leakage power dissipation are contributing to the growing complexity of modern VLSI design. Careful power planning on all design levels is required. This dissertation tackles the low-power, low-energy challenges in deep sub-micron technologies on the architecture and circuit levels. Voltage scaling is one of the most efficient ways for reducing power and energy. For ultra-low voltage operation, a new circuit technique which allows bulk CMOS circuits to work in the sub-0. 5V supply territory is presented. The threshold voltage of the slow PMOS transistor is controlled dynamically to get a lower threshold voltage during the active mode. Due to the reduced threshold voltage, switching speed becomes faster while active leakage current is increased. A technique to dynamically manage active leakage current is presented. Energy reduction resulting from using the proposed structure is demonstrated through simulations of different circuits with different levels of complexity. As technology scales, the mounting leakage current and degraded noise immunity impact performance especially that of high performance dynamic circuits. Dual threshold technology shows a good potential for leakage reduction while meeting performance goals. A model for optimally selecting threshold voltages and transistor sizes in wide fan-in dynamic circuits is presented. On the circuit level, a novel circuit level technique which handles the trade-off between noise immunity and energy dissipation for wide fan-in dynamic circuits is presented. Energy efficiency of the proposed wide fan-in dynamic circuit is further enhanced through efficient low voltage operation. Another direct consequence of technology scaling is the growing impact of interconnect parasitics and process variations on performance. Traditionally, worst case process, parasitics, and environmental conditions are considered. Designing for worst case guarantees a fail-safe operation but requires a large delay and voltage margins. This large margin can be recovered if the design can adapt to the actual silicon conditions. Dynamic voltage scaling is considered a key enabler in reducing such margin. An on-chip process identifier to recover the margin required due to process variations is described. The proposed architecture adjusts supply voltage using a hybrid between the one-time voltage setting and the continuous monitoring modes of operation. The interconnect impact on delay is minimized through a novel adaptive voltage scaling architecture. The proposed system recovers the large delay and voltage margins required by conventional systems by closely tracking the actual critical path at anytime. By tracking the actual critical path, the proposed system is robust and more energy efficient compared to both the conventional open-loop and closed-loop systems

Power Management for Deep Submicron Microprocessors

As VLSI technology scales, the enhanced performance of smaller transistors comes at the expense of increased power consumption. In addition to the dynamic power consumed by the circuits there is a tremendous increase in the leakage power consumption which is further exacerbated by the increasing operating temperatures. The total power consumption of modern processors is distributed between the processor core, memory and interconnects. In this research two novel power management techniques are presented targeting the functional units and the global interconnects. First, since most leakage control schemes for processor functional units are based on circuit level techniques, such schemes inherently lack information about the operational profile of higher-level components of the system. This is a barrier to the pivotal task of predicting standby time. Without this prediction, it is extremely difficult to assess the value of any leakage control scheme. Consequently, a methodology that can predict the standby time is highly beneficial in bridging the gap between the information available at the application level and the circuit implementations. In this work, a novel Dynamic Sleep Signal Generator (DSSG) is presented. It utilizes the usage traces extracted from cycle accurate simulations of benchmark programs to predict the long standby periods associated with the various functional units. The DSSG bases its decisions on the current and previous standby state of the functional units to accurately predict the length of the next standby period. The DSSG presents an alternative to Static Sleep Signal Generation (SSSG) based on static counters that trigger the generation of the sleep signal when the functional units idle for a prespecified number of cycles. The test results of the DSSG are obtained by the use of a modified RISC superscalar processor, implemented by SimpleScalar, the most widely accepted open source vehicle for architectural analysis. In addition, the results are further verified by a Simultaneous Multithreading simulator implemented by SMTSIM. Leakage saving results shows an increase of up to 146% in leakage savings using the DSSG versus the SSSG, with an accuracy of 60-80% for predicting long standby periods. Second, chip designers in their effort to achieve timing closure, have focused on achieving the lowest possible interconnect delay through buffer insertion and routing techniques. This approach, though, taxes the power budget of modern ICs, especially those intended for wireless applications. Also, in order to achieve more functionality, die sizes are constantly increasing. This trend is leading to an increase in the average global interconnect length which, in turn, requires more buffers to achieve timing closure. Unconstrained buffering is bound to adversely affect the overall chip performance, if the power consumption is added as a major performance metric. In fact, the number of global interconnect buffers is expected to reach hundreds of thousands to achieve an appropriate timing closure. To mitigate the impact of the power consumed by the interconnect buffers, a power-efficient multi-pin routing technique is proposed in this research. The problem is based on a graph representation of the routing possibilities, including buffer insertion and identifying the least power path between the interconnect source and set of sinks. The novel multi-pin routing technique is tested by applying it to the ISPD and IBM benchmarks to verify the accuracy, complexity, and solution quality. Results obtained indicate that an average power savings as high as 32% for the 130-nm technology is achieved with no impact on the maximum chip frequency