Adaptive Routing Approaches for Networked Many-Core Systems

Through advances in technology, System-on-Chip design is moving towards integrating tens to hundreds of intellectual property blocks into a single chip. In such a many-core system, on-chip communication becomes a performance bottleneck for high performance designs. Network-on-Chip (NoC) has emerged as a viable solution for the communication challenges in highly complex chips. The NoC architecture paradigm, based on a modular packet-switched mechanism, can address many of the on-chip communication challenges such as wiring complexity, communication latency, and bandwidth. Furthermore, the combined benefits of 3D IC and NoC schemes provide the possibility of designing a high performance system in a limited chip area. The major advantages of 3D NoCs are the considerable reductions in average latency and power consumption. There are several factors degrading the performance of NoCs. In this thesis, we investigate three main performance-limiting factors: network congestion, faults, and the lack of efficient multicast support. We address these issues by the means of routing algorithms. Congestion of data packets may lead to increased network latency and power consumption. Thus, we propose three different approaches for alleviating such congestion in the network. The first approach is based on measuring the congestion information in different regions of the network, distributing the information over the network, and utilizing this information when making a routing decision. The second approach employs a learning method to dynamically find the less congested routes according to the underlying traffic. The third approach is based on a fuzzy-logic technique to perform better routing decisions when traffic information of different routes is available. Faults affect performance significantly, as then packets should take longer paths in order to be routed around the faults, which in turn increases congestion around the faulty regions. We propose four methods to tolerate faults at the link and switch level by using only the shortest paths as long as such path exists. The unique characteristic among these methods is the toleration of faults while also maintaining the performance of NoCs. To the best of our knowledge, these algorithms are the first approaches to bypassing faults prior to reaching them while avoiding unnecessary misrouting of packets. Current implementations of multicast communication result in a significant performance loss for unicast traffic. This is due to the fact that the routing rules of multicast packets limit the adaptivity of unicast packets. We present an approach in which both unicast and multicast packets can be efficiently routed within the network. While suggesting a more efficient multicast support, the proposed approach does not affect the performance of unicast routing at all. In addition, in order to reduce the overall path length of multicast packets, we present several partitioning methods along with their analytical models for latency measurement. This approach is discussed in the context of 3D mesh networks.Siirretty Doriast

Self-healing concepts involving fine-grained redundancy for electronic systems

The start of the digital revolution came through the metal-oxide-semiconductor field-effect transistor (MOSFET) in 1959 followed by massive integration onto a silicon die by means of constant down scaling of individual components. Digital systems for certain applications require fault-tolerance against faults caused by temporary or permanent influence. The most widely used technique is triple module redundancy (TMR) in conjunction with a majority voter, which is regarded as a passive fault mitigation strategy. Design by functional resilience has been applied to circuit structures for increased fault-tolerance and towards self-diagnostic triggered self-healing. The focus of this thesis is therefore to develop new design strategies for fault detection and mitigation within transistor, gate and cell design levels. The research described in this thesis makes three contributions. The first contribution is based on adding fine-grained transistor level redundancy to logic gates in order to accomplish stuck-at fault-tolerance. The objective is to realise maximum fault-masking for a logic gate with minimal added redundant transistors. In the case of non-maskable stuck-at faults, the gate structure generates an intrinsic indication signal that is suitable for autonomous self-healing functions. As a result, logic circuitry utilising this design is now able to differentiate between gate faults and faults occurring in inter-gate connections. This distinction between fault-types can then be used for triggering selective self-healing responses. The second contribution is a logic matrix element which applies the three core redundancy concepts of spatial- temporal- and data-redundancy. This logic structure is composed of quad-modular redundant structures and is capable of selective fault-masking and localisation depending of fault-type at the cell level, which is referred to as a spatiotemporal quadded logic cell (QLC) structure. This QLC structure has the capability of cellular self-healing. Through the combination of fault-tolerant and masking logic features the QLC is designed with a fault-behaviour that is equal to existing quadded logic designs using only 33.3% of the equivalent transistor resources. The inherent self-diagnosing feature of QLC is capable of identifying individual faulty cells and can trigger self-healing features. The final contribution is focused on the conversion of finite state machines (FSM) into memory to achieve better state transition timing, minimal memory utilisation and fault protection compared to common FSM designs. A novel implementation based on content-addressable type memory (CAM) is used to achieve this. The FSM is further enhanced by creating the design out of logic gates of the first contribution by achieving stuck-at fault resilience. Applying cross-data parity checking, the FSM becomes equipped with single bit fault detection and correction

Performance evaluation of different routing algorithms in network on chip

Network on Chip (NoC) is one of the efficient on-chip communication architecture for System on Chip (SoC) where a large number of computational and storage blocks are integrated on a single chip. NoCs have tackled the disadvantages of SoCs as well as they are scalable. But an efficient routing algorithm can enhance the performance of NoC. In one chapter of the thesis three different types of routing algorithms are compared i.e. XY, OE, and DyAD. XY routing algorithm is a distributed deterministic algorithm. Odd-Even (OE) routing algorithm is distributed adaptive routing algorithm with deadlock-free ability. DyAD is a smart routing algorithm which combines the features of both deterministic and adaptive routing. In another chapter of thesis three different types of deadlock free routing algorithms are compared i.e. one deterministic routing (XY routing algorithm), three partially adaptive routing (West first, North last and Negative first) and two adaptive routing (DyXY, OE) are being compared with % of load for various traffic patterns. In another chapter of thesis, a fault tolerant algorithm is described and its performance is compared with all the deadlock free routing algorithms in a NoC having link faults and node faults. All these simulation is done in NIRGAM 2.1 simulator which is a cycle accurate systemC based simulator

Low-Memory Techniques for Routing and Fault-Tolerance on the Fat-Tree Topology

Actualmente, los clústeres de PCs están considerados como una alternativa eficiente a la hora de construir supercomputadores en los que miles de nodos de computación se conectan mediante una red de interconexión. La red de interconexión tiene que ser diseñada cuidadosamente, puesto que tiene una gran influencia sobre las prestaciones globales del sistema. Dos de los principales parámetros de diseño de las redes de interconexión son la topología y el encaminamiento. La topología define la interconexión de los elementos de la red entre sí, y entre éstos y los nodos de computación. Por su parte, el encaminamiento define los caminos que siguen los paquetes a través de la red. Las prestaciones han sido tradicionalmente la principal métrica a la hora de evaluar las redes de interconexión. Sin embargo, hoy en día hay que considerar dos métricas adicionales: el coste y la tolerancia a fallos. Las redes de interconexión además de escalar en prestaciones también deben hacerlo en coste. Es decir, no sólo tienen que mantener su productividad conforme aumenta el tamaño de la red, sino que tienen que hacerlo sin incrementar sobremanera su coste. Por otra parte, conforme se incrementa el número de nodos en las máquinas de tipo clúster, la red de interconexión debe crecer en concordancia. Este incremento en el número de elementos de la red de interconexión aumenta la probabilidad de aparición de fallos, y por lo tanto, la tolerancia a fallos es prácticamente obligatoria para las redes de interconexión actuales. Esta tesis se centra en la topología fat-tree, ya que es una de las topologías más comúnmente usadas en los clústeres. El objetivo de esta tesis es aprovechar sus características particulares para proporcionar tolerancia a fallos y un algoritmo de encaminamiento capaz de equilibrar la carga de la red proporcionando una buena solución de compromiso entre las prestaciones y el coste.Gómez Requena, C. (2010). Low-Memory Techniques for Routing and Fault-Tolerance on the Fat-Tree Topology [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/8856Palanci

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Multiple Permanent Faults Mitigation Through Bit-Shuffling for Network-on-Chip Architecture

International audienceSince several decades, fault tolerance has become a major research field, due to transistor shrinking and core number increasing in System-on-Chip (SoC). Especially, faults occurring at the Network-on-Chips (NoCs) of those systems have a significant impact, since NoCs are the key component of on-chip communication. Several fault tolerant approaches have been proposed, which are, however, limited against multiple permanent faults. To reduce the impact of these faults on the data communications, we propose a bit-shuffling method for fault tolerant NoCs. The proposed approach exploits, at runtime, the position of the permanent faults and changes the order of bits inside a flit. Our bit-shuffling method reduces as much as possible the fault impact, by transferring the faults from Most Significant Bits (MSBs) towards Least Significant Bits (LSBs). With this technique, we show that, in presence of multiple permanent faults, the Mean Square Error (MSE) on the payload transmission is reduce from 10 17 to 10 5 under three permanent fault for 32-bit unsigned integers. This technique also ensures the correct transmission of headers under multiple permanent faults

Wafer-scale integration of semiconductor memory.

This work is directed towards a study of full-slice or "wafer-scale integrated" - semiconductor memory. Previous approaches to full slice technology are studied and critically compared. It is shown that a fault-tolerant, fixed-interconnection approach offers many advantages; such a technique forms the basis of the experimental work. The disadvantages of the conventional technology are reviewed to illustrate the potential improvements in cost, packing density and reliability obtainable with wafer-scale integration (W.S.l). Iterative chip arrays are modelled by a pseudorandom fault distribution; algorithms to control the linking of adjacent good - chips into linear chains are proposed and investigated by computer simulation. It is demonstrated that long chains may be produced at practicable yield levels. The on-chip control circuitry and the external control electronics required to implement one particular algorithm are described in relation to a TTL simulation of an array of 4 X 4 integrated circuit chips. A layout of the on-chip control logic is shown to require (in 40 dynamic MOS circuitry) an area equivalent to ~250 shift register stages -a reasonable overhead on large memories. Structures are proposed to extend the fixed-interconnection, fault-tolerant concept to parallel/serial organised memory - covering RAM, ROM and Associative Memory applications requiring up to~ 2M bits of storage. Potential problem areas in implementing W.S.I are discussed and it is concluded that current technology is capable of manufacturing such devices. A detailed cost comparison of the conventional and W.S.I approaches to large serial memories illustrates the potential savings available with wafer-scale integration. The problem of gaining industrial acceptance for W.S.I is discussed in relation to known and anticipated views- of new technology. The thesis concludes with suggestions for further work in the general field of wafer-scale integration