110 research outputs found
Design for testability in hardware-software systems
Clearly, in today's complex systems, hardware and software approaches to DFT must work together to achieve a successful overall solution. The authors investigate existing and new concepts that may lead to a single design for test strategy in the futur
The STAR MAPS-based PiXeL detector
The PiXeL detector (PXL) for the Heavy Flavor Tracker (HFT) of the STAR
experiment at RHIC is the first application of the state-of-the-art thin
Monolithic Active Pixel Sensors (MAPS) technology in a collider environment.
Custom built pixel sensors, their readout electronics and the detector
mechanical structure are described in detail. Selected detector design aspects
and production steps are presented. The detector operations during the three
years of data taking (2014-2016) and the overall performance exceeding the
design specifications are discussed in the conclusive sections of this paper
The Telecommunications and Data Acquisition Report
Deep Space Network advanced systems, very large scale integration architecture for decoders, radar interface and control units, microwave time delays, microwave antenna holography, and a radio frequency interference survey are among the topics discussed
Apoio à depuração e teste de circuitos mistos compatíveis com a norma IEEE1149.4
Tese de doutoramento. Engenharia Electrotécnica e de Computadores. Faculdade de Engenharia. Universidade do Porto, Instituto Superior de Engenharia. Instituto Politécnico do Porto. 200
A Review on Key Issues and Challenges in Devices Level MEMS Testing
The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market
Symbolic tolerance and sensitivity analysis of large scale electronic circuits
Available from British Library Document Supply Centre-DSC:DXN029693 / BLDSC - British Library Document Supply CentreSIGLEGBUnited Kingdo
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