AN EFFICIENT ERROR DETECTION AND CORRECTION METHOD FOR TIMING ERRORS

Timing errors are an important concern in nanometer CMOS technologies. A promising way to overcome the timing errors is the development of error detection and correction techniques. A local error detection and correction technique is done in this work. It is based on a new bit flipping flip flop. Whenever a timing error is detected, it is corrected by complementing the output of the corresponding flip flop. No extra circuitry is inserted in the design. Timing errors are identified and corrected within a single cycle and hence design complexity is reduced which results in reduced power consumption and low silicon area when compared to the earlier designs

inSense: A Variation and Fault Tolerant Architecture for Nanoscale Devices

Transistor technology scaling has been the driving force in improving the size, speed, and power consumption of digital systems. As devices approach atomic size, however, their reliability and performance are increasingly compromised due to reduced noise margins, difficulties in fabrication, and emergent nano-scale phenomena. Scaled CMOS devices, in particular, suffer from process variations such as random dopant fluctuation (RDF) and line edge roughness (LER), transistor degradation mechanisms such as negative-bias temperature instability (NBTI) and hot-carrier injection (HCI), and increased sensitivity to single event upsets (SEUs). Consequently, future devices may exhibit reduced performance, diminished lifetimes, and poor reliability. This research proposes a variation and fault tolerant architecture, the inSense architecture, as a circuit-level solution to the problems induced by the aforementioned phenomena. The inSense architecture entails augmenting circuits with introspective and sensory capabilities which are able to dynamically detect and compensate for process variations, transistor degradation, and soft errors. This approach creates ``smart\u27\u27 circuits able to function despite the use of unreliable devices and is applicable to current CMOS technology as well as next-generation devices using new materials and structures. Furthermore, this work presents an automated prototype implementation of the inSense architecture targeted to CMOS devices and is evaluated via implementation in ISCAS \u2785 benchmark circuits. The automated prototype implementation is functionally verified and characterized: it is found that error detection capability (with error windows from $\approx$30-400ps) can be added for less than 2\% area overhead for circuits of non-trivial complexity. Single event transient (SET) detection capability (configurable with target set-points) is found to be functional, although it generally tracks the standard DMR implementation with respect to overheads

A Novel Methodology for Error-Resilient Circuits in Near-Threshold Computing

Department of Electrical EngineeringThe main goal of designing VLSI system is high performance with low energy consumption. Actually, to realize the human-related techniques, such as internet of things (IoTs) and wearable devices, efficient power management techniques are required. Near threshold computing (NTC) is one of the most well-known techniques which is proposed for the trade-off between energy consumption and performance improvement. With this technique, the solution would be selected by the lowest energy with highest performance. However, NTC suffers a significant performance degradation, which is prone to timing errors. However, main goal of Integrated Circuit (IC) design is making the circuit to always operate correctly though worst-case condition. But, in order to make the circuit always work correctly, considerable area and power overheads may occur. As an alternative, better-than-worst-case (BTWC) design paradigm has been proposed. One of the main design of BTWC design includes error-resilient circuits which detect and correct timing errors, though they cause area and power overheads. In this thesis, we propose various design methodologies which provide an optimal implementation of error-resilient circuits. Slack-based, sensitivity-based methodology and modified Quine-McCluskey (Q-M) algorithm have been exploited to earn the minimum set of error-resilient circuits without any loss of detection ability. From sensitivity-based methodology, benchmark results show that the optimal designs reduces up to 46% monitoring area without compromising error detection ability of the initial error-resilient design. From the Quine-McCluskey (Q-M) algorithm, benchmark results show that optimal design reduces up to 72% of flip-flops which are required to be changed to error-resilient circuits without compromising an error detection ability. In addition, more power and area reduction can be possible when reasonable underestimation of error detection ability is accepted. Monte-Carlo analysis validates that our proposed method is tolerant to process variation.ope

Effect of clock gating in conditional pulse enhancement flip-flop for low power applications

Flip-Flops (FFs) play a fundamental role in digital designs. A clock system consumes above 25% of total system power. The use of pulse-triggered flip-flops (P-FFs) in digital design provides better performance than conventional flip-flop designs. This paper presents the design of a new power-efficient implicit pulse-triggered flip-flop suitable for low power applications. This flip-flop architecture is embedded with two key features. Firstly, the enhancement in width and height of triggering pulses during specific conditions gives a solution for the longest discharging path problem in existing P-FFs. Secondly, the clock gating concept reduces unwanted switching activities at sleep/idle mode of operation and thereby reducing dynamic power consumption. The post-layout simulation results in cadence software based on CMOS 90-nm technology shows that the proposed design features less power dissipation and better power delay performance (PDP) when compared with conventional P-FFs. Its maximum power saving against conventional designs is up to 30.65%

Design of variation-tolerant synchronizers for multiple clock and voltage domains

PhD ThesisParametric variability increasingly affects the performance of electronic circuits as the fabrication technology has reached the level of 32nm and beyond. These parameters may include transistor Process parameters (such as threshold voltage), supply Voltage and Temperature (PVT), all of which could have a significant impact on the speed and power consumption of the circuit, particularly if the variations exceed the design margins. As systems are designed with more asynchronous protocols, there is a need for highly robust synchronizers and arbiters. These components are often used as interfaces between communication links of different timing domains as well as sampling devices for asynchronous inputs coming from external components. These applications have created a need for new robust designs of synchronizers and arbiters that can tolerate process, voltage and temperature variations. The aim of this study was to investigate how synchronizers and arbiters should be designed to tolerate parametric variations. All investigations focused mainly on circuit-level and transistor level designs and were modeled and simulated in the UMC90nm CMOS technology process. Analog simulations were used to measure timing parameters and power consumption along with a “Monte Carlo” statistical analysis to account for process variations. Two main components of synchronizers and arbiters were primarily investigated: flip-flop and mutual-exclusion element (MUTEX). Both components can violate the input timing conditions, setup and hold window times, which could cause metastability inside their bistable elements and possibly end in failures. The mean-time between failures is an important reliability feature of any synchronizer delay through the synchronizer. The MUTEX study focused on the classical circuit, in addition to a number of tolerance, based on increasing internal gain by adding current sources, reducing the capacitive loading, boosting the transconductance of the latch, compensating the existing Miller capacitance, and adding asymmetry to maneuver the metastable point. The results showed that some circuits had little or almost no improvements, while five techniques showed significant improvements by reducing τ and maintaining high tolerance. Three design approaches are proposed to provide variation-tolerant synchronizers. wagging synchronizer proposed to First, the is significantly increase reliability over that of the conventional two flip-flop synchronizer. The robustness of the wagging technique can be enhanced by using robust τ latches or adding one more cycle of synchronization. The second approach is the Metastability Auto-Detection and Correction (MADAC) latch which relies on swiftly detecting a metastable event and correcting it by enforcing the previously stored logic value. This technique significantly reduces the resolution time down from uncertain synchronization technique is proposed to transfer signals between Multiple- Voltage Multiple-Clock Domains (MVD/MCD) that do not require conventional level-shifters between the domains or multiple power supplies within each domain. This interface circuit uses a synchronous set and feedback reset protocol which provides level-shifting and synchronization of all signals between the domains, from a wide range of voltage-supplies and clock frequencies. Overall, synchronizer circuits can tolerate variations to a greater extent by employing the wagging technique or using a MADAC latch, while MUTEX tolerance can suffice with small circuit modifications. Communication between MVD/MCD can be achieved by an asynchronous handshake without a need for adding level-shifters.The Saudi Arabian Embassy in London, Umm Al-Qura University, Saudi Arabi

Low-Power and Error-Resilient VLSI Circuits and Systems.

Efficient low-power operation is critically important for the success of the next-generation signal processing applications. Device and supply voltage have been continuously scaled to meet a more constrained power envelope, but scaling has created resiliency challenges, including increasing timing faults and soft errors. Our research aims at designing low-power and robust circuits and systems for signal processing by drawing circuit, architecture, and algorithm approaches. To gain an insight into the system faults due to supply voltage reduction, we researched the two primary effects that determine the minimum supply voltage (VMIN) in Intel’s tri-gate CMOS technology, namely process variations and gate-dielectric soft breakdown. We determined that voltage scaling increases the timing window that sequential circuits are vulnerable. Thus, we proposed a new hold-time violation metric to define hold-time VMIN, which has been adopted as a new design standard. Device scaling increases soft errors which affect circuit reliability. Through extensive soft error characterization using two 65nm CMOS test chips, we studied the soft error mechanisms and its dependence on supply voltage and clock frequency. This study laid the foundation of the first 65nm DSP chip design for a NASA spaceflight project. To mitigate such random errors, we proposed a new confidence-driven architecture that effectively enhances the error resiliency of deeply scaled CMOS and post-CMOS circuits. Designing low-power resilient systems can effectively leverage application-specific algorithmic approaches. To explore design opportunities in the algorithmic domain, we demonstrate an application-specific detection and decoding processor for multiple-input multiple-output (MIMO) wireless communication. To enhance the receive error rate for a robust wireless communication, we designed a joint detection and decoding technique by enclosing detection and decoding in an iterative loop to enhance both interference cancellation and error reduction. A proof-of-concept chip design was fabricated for the next-generation 4x4 256QAM MIMO systems. Through algorithm-architecture optimizations and low-power circuit techniques, our design achieves significant improvements in throughput, energy efficiency and error rate, paving the way for future developments in this area.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/110323/1/uchchen_1.pd

Methods to improve the reliability and resiliency of near/sub-threshold digital circuits

Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy required for computations by as much as 6 times. However, when operating at near/sub-threshold voltages (where the supply voltage is near or below the threshold of the transistors), imperfections in transistor manufacturing, changes in temperature, and other difficult-to-predict factors cause wide variations in the timing of Complementary Metal-Oxide Semiconductor (CMOS) circuits due to an increased sensitivity at lower voltages. These increased variations result in poor aggregate performance and cause increased rates of error occurrence in computation. This work introduces several new methods to improve the reliability of near/sub-threshold circuits. The first is a design automation technique that is used to aid in low-voltage digital standard cell synthesis. Second, two circuit-level techniques are also introduced that aim to improve the reliability and resiliency of digital circuits by means of completion/error detection. These techniques are shown to improve speed and lower energy consumption at low overheads compared to previous methods. Most importantly, these circuit-level methods are specifically designed to operate at low voltages and can themselves tolerate variations and operation in harsh environments. Finally, a test-chip prototype designed in 65nm-CMOS demonstrates the practicality and feasibility of a proposed current sensing error detector

Design and Analysis of Metastable-Hardened, High-Performance, Low-Power Flip-Flops

With rapid technology scaling, flip-flops are becoming more susceptible to metastability due to tighter timing budgets and the more prominent effects of process, temperature, and voltage variation that can result in frequent setup and hold time violations. This thesis presents a detailed methodology and analysis on the design of metastable-hardened, high-performance, and low-power flip-flops. The design of metastable-hardened flip-flops is focused on optimizing the value of τ mainly due to its exponential relationship with the metastability window δ and the mean-time-between-failure (MTBF). Through small-signal modeling, τ is determined to be a function of the load capacitance and the transconductance in the cross-coupled inverter pair for a given flip-flop architecture. In most cases, the reduction of τ comes at the expense of increased delay and power. Hence, two new design metrics, the metastability-delay-product (MDP) and the metastability-power-delay-product (MPDP), are proposed to analyze the tradeoffs between delay, power and τ. Post-layout simulation results have shown that the proposed optimum MPDP design can reduce the metastability window δ by at least an order of magnitude depending on the value of the settling time and the flip-flop architecture. In this work, we have proposed two new flip-flop designs: the pre-discharge flip-flop (PDFF) and the sense-amplifier-transmission-gate (SATG) based flip-flop. Both flip-flop architectures facilitate the usage in both single and dual-supply systems as reduced clock-swing flip-flop and level-converting flip-flop. With a cross-coupled inverter in the master-stage that increases the overall transconductance and a small load transistor associated with the critical node, the architecture of both the PDFF and the SATG is very attractive for the design of metastable-hardened, high-performance, and low-power flip-flops. The amount of overhead in delay, power, and area is all less than 10% under the optimum MPDP design scheme when compared to the traditional optimum PDP design. In designing for metastable-hardened and soft-error tolerant flip-flops, the main methodology is to improve the metastability performance in the master-stage while applying the soft-error tolerant cell in the slave-stage for protection against soft-error. The proposed flip-flops, PDFF-SE and SATG-SE, both utilize a cross-coupled inverter on the critical path in the master-stage and generate the required differential signals to facilitate the usage of the Quatro soft-error tolerant cell in the slave-stage