Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry

Deflectometric methods have existed for more than a decade for slope measurement of specular freeform surfaces through utilization of the deformation of a sample pattern after reflection from a test surface. Usually, these approaches require two-directional fringe patterns to be projected on a LCD screen or ground glass and require slope integration, which leads to some complexity for the whole measuring process. This paper proposes a new mathematical measurement model for measuring topography information of freeform specular surfaces, which integrates a virtual reference specular surface into the method of active fringe reflection delfectometry and presents a straight-forward relation between height and phase. This method only requires one direction of horizontal or vertical sinusoidal fringe patterns to be projected on a LCD screen, resulting in a significant reduction in capture time over established method. Assuming the whole system has been pre-calibrated, during the measurement process, the fringe patterns are captured separately via the virtual reference and detected freeform surfaces by a CCD camera. The reference phase can be solved according to spatial geometrical relation between LCD screen and CCD camera. The captured phases can be unwrapped with a heterodyne technique and optimum frequency selection method. Based on this calculated unwrapped-phase and that proposed mathematical model, absolute height of the inspected surface can be computed. Simulated and experimental results show that this methodology can conveniently calculate topography information for freeform and structured specular surfaces without integration and reconstruction processes

Analytical evaluation of the X-ray scattering contribution to imaging degradation in grazing-incidence X-ray telescopes

The focusing performance of X-ray optics (conveniently expressed in terms of HEW, Half Energy Width) strongly depend on both mirrors deformations and photon scattering caused by the microroughness of reflecting surfaces. In particular, the contribution of X-ray Scattering (XRS) to the HEW of the optic is usually an increasing function H(E) of the photon energy E. Therefore, in future hard X-ray imaging telescopes of the future (SIMBOL-X, NeXT, Constellation-X, XEUS), the X-ray scattering could be the dominant problem since they will operate also in the hard X-ray band (i.e. beyond 10 keV). [...] Several methods were proposed in the past years to estimate the scattering contribution to the HEW, dealing with the surface microroughness expressed in terms of its Power Spectral Density (PSD), on the basis of the well-established theory of X-ray scattering from rough surfaces. We faced that problem on the basis on the same theory, but we tried a new approach: the direct, analytical translation of a given surface roughness PSD into a H(E) trend, and - vice versa - the direct translation of a H(E) requirement into a surface PSD. This PSD represents the maximum tolerable microroughness level in order to meet the H(E) requirement in the energy band of a given X-ray telescope. We have thereby found a new, analytical and widely applicable formalism to compute the XRS contribution to the HEW from the surface PSD, provided that the PSD had been measured in a wide range of spatial frequencies. The inverse problem was also solved, allowing the immediate evaluation of the mirror surface PSD from a measured function H(E). The same formalism allows establishing the maximum allowed PSD of the mirror in order to fulfill a given H(E) requirement. [...]Comment: 10 pages, 6 figures, published in Astronomy & Astrophysics, sect. "Astronomical Instrumentation". In this version, a typo in two equations has been corrected. After the correction, the other results, formulae and conclusions in the paper remain unchange

Emittance measurement study

Directional spectral emittance of black body cavitie

Radiant heat exchange in a space environment Scientific technical report, 1 Feb. - 31 Jul. 1970

Spectral and directional surface property effects on radiant heat transfer in space environmen

Perceptual Modeling and Reproduction of Gloss

The reproduction of gloss on displays is generally not based on perception and as a consequence does not guarantee the best visualization of a real material. The reproduction is composed of four different steps: measurement, modeling, rendering, and display. The minimum number of measurements required to approximate a real material is unknown. The error metrics used to approximate measurements with analytical BRDF models are not based on perception, and the best visual approximation is not always obtained. Finally, the gloss perception difference between real objects and objects seen on displays has not sufficiently been studied and might be influencing the observer judgement. This thesis proposes a systematic, scalable, and perceptually based workflow to represent real materials on displays. First, the gloss perception difference between real objects and objects seen on displays was studied. Second, the perceptual performance of the error metrics currently in use was evaluated. Third, a projection into a perceptual gloss space was defined, enabling the computation of a perceptual gloss distance measure. Fourth, the uniformity of the gloss space was improved by defining a new gloss difference equation. Finally, a systematic, scalable, and perceptually based workflow was defined using cost-effective instruments