Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

Trace-based automated logical debugging for high-level synthesis generated circuits

In this paper we present an approach for debugging hardware designs generated by High-Level Synthesis (HLS), relieving users from the burden of identifying the signals to trace and from the error-prone task of manually checking the traces. The necessary steps are performed after HLS, independently of it and without affecting the synthesized design. For this reason our methodology should be easily adaptable to any HLS tools. The proposed approach makes full use of HLS compile time informations. The executions of the simulated design and the original C program can be compared, checking if there are discrepancies between values of C variables and signals in the design. The detection is completely automated, that is, it does not need any input but the program itself and the user does not have to know anything about the overall compilation process. The design can be validated on a given set of test cases and the discrepancies are detected by the tool. Relationships between the original high-level source code and the generated HDL are kept by the compiler and shown to the user. The granularity of such discrepancy analysis is per-operation and it includes the temporary variables inserted by the compiler. As a consequence the design can be debugged as is, with no restrictions on optimizations available during HLS. We show how this methodology can be used to identify different kind of bugs: 1) introduced by the HLS tool used for the synthesis; 2) introduced using buggy libraries of hardware components for HLS; 3) undefined behavior bugs in the original high-level source code

Transparent In-Circuit Assertions for FPGAs

Commonly used in software design, assertions are statements placed into a design to ensure that its behaviour matches that expected by a designer. Although assertions apply equally to hardware design, they are typically supported only for logic simulation, and discarded prior to physical implementation. We propose a new HDL-agnostic language for describing latency-insensitive assertions and novel methods to add such assertions transparently to an already placed-and-routed circuit without affecting the existing design. We also describe how this language and associated methods can be used to implement semi-transparent exception handling. The key to our work is that by treating hardware assertions and exceptions as being oblivious or less sensitive to latency, assertion logic need only use spare FPGA resources. We use network-flow techniques to route necessary signals to assertions via spare flip-flops, eliminating any performance degradation, even on large designs (92% of slices in one test). Experimental evaluation shows zero impact on critical-path delay, even on large benchmarks operating above 200MHz, at the cost of a small power penalty

Using Efficient Path Profiling to Optimize Memory Consumption of On-Chip Debugging for High-Level Synthesis

High-Level Synthesis (HLS) for FPGAs is attracting popularity and is increasingly used to handle complex systems with multiple integrated components. To increase performance and efficiency, HLS flows now adopt several advanced optimization techniques. Aggressive optimizations and system level integration can cause the introduction of bugs that are only observable on-chip. Debugging support for circuits generated with HLS is receiving a considerable attention. Among the data that can be collected on chip for debugging, one of the most important is the state of the Finite State Machines (FSM) controlling the components of the circuit. However, this usually requires a large amount of memory to trace the behavior during the execution. This work proposes an approach that takes advantage of the HLS information and of the structure of the FSM to compress control flow traces and to integrate optimized components for on-chip debugging. The generated checkers analyze the FSM execution on-fly, automatically notifying when a bug is detected, localizing it and providing data about its cause. The traces are compressed using a software profiling technique, called Efficient Path Profiling (EPP), adapted for the debugging of hardware accelerators generated with HLS. With this technique, the size of the memory used to store control flow traces can be reduced up to 2 orders of magnitude, compared to state-of-the-art

Achieving Functional Correctness in Large Interconnect Systems.

In today's semi-conductor industry, large chip-multiprocessors and systems-on-chip are being developed, integrating a large number of components on a single chip. The sheer size of these designs and the intricacy of the communication patterns they exhibit have propelled the development of network-on-chip (NoC) interconnects as the basis for the communication infrastructure in these systems. Faced with the interconnect's growing size and complexity, several challenges hinder its effective validation. During the interconnect's development, the functional verification process relies heavily on the use of emulation and post-silicon validation platforms. However, detecting and debugging errors on these platforms is a difficult endeavour due to the limited observability, and in turn the low verification capabilities, they provide. Additionally, with the inherent incompleteness of design-time validation efforts, the potential of design bugs escaping into the interconnect of a released product is also a concern, as these bugs can threaten the viability of the entire system. This dissertation provides solutions to enable the development of functionally correct interconnect designs. We first address the challenges encountered during design-time verification efforts, by providing two complementary mechanisms that allow emulation and post-silicon verification frameworks to capture a detailed overview of the functional behaviour of the interconnect. Our first solution re-purposes the contents of in-flight traffic to log debug data from the interconnect's execution. This approach enables the validation of the interconnect using synthetic traffic workloads, while attaining over 80% observability of the routes followed by packets and capturing valuable debugging information. We also develop an alternative mechanism that boosts observability by taking periodic snapshots of execution, thus extending the verification capabilities to run both synthetic traffic and real-application workloads. The collected snapshots enhance detection and debugging support, and they provide observability of over 50% of packets and reconstructs at least half of each of their routes. Moreover, we also develop error detection and recovery solutions to address the threat of design bugs escaping into the interconnect's runtime operation. Our runtime techniques can overcome communication errors without needing to store replicate copies of all in-flight packets, thereby achieving correctness at minimal area costsPhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116741/1/rawanak_1.pd

Fault Tolerant Electronic System Design

Due to technology scaling, which means reduced transistor size, higher density, lower voltage and more aggressive clock frequency, VLSI devices may become more sensitive against soft errors. Especially for those devices used in safety- and mission-critical applications, dependability and reliability are becoming increasingly important constraints during the development of system on/around them. Other phenomena (e.g., aging and wear-out effects) also have negative impacts on reliability of modern circuits. Recent researches show that even at sea level, radiation particles can still induce soft errors in electronic systems. On one hand, processor-based system are commonly used in a wide variety of applications, including safety-critical and high availability missions, e.g., in the automotive, biomedical and aerospace domains. In these fields, an error may produce catastrophic consequences. Thus, dependability is a primary target that must be achieved taking into account tight constraints in terms of cost, performance, power and time to market. With standards and regulations (e.g., ISO-26262, DO-254, IEC-61508) clearly specify the targets to be achieved and the methods to prove their achievement, techniques working at system level are particularly attracting. On the other hand, Field Programmable Gate Array (FPGA) devices are becoming more and more attractive, also in safety- and mission-critical applications due to the high performance, low power consumption and the flexibility for reconfiguration they provide. Two types of FPGAs are commonly used, based on their configuration memory cell technology, i.e., SRAM-based and Flash-based FPGA. For SRAM-based FPGAs, the SRAM cells of the configuration memory highly susceptible to radiation induced effects which can leads to system failure; and for Flash-based FPGAs, even though their non-volatile configuration memory cells are almost immune to Single Event Upsets induced by energetic particles, the floating gate switches and the logic cells in the configuration tiles can still suffer from Single Event Effects when hit by an highly charged particle. So analysis and mitigation techniques for Single Event Effects on FPGAs are becoming increasingly important in the design flow especially when reliability is one of the main requirements