Circuits and Systems Advances in Near Threshold Computing

Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing

Low-voltage embedded biomedical processor design

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.Cataloged from PDF version of thesis.Includes bibliographical references (p. 180-190).Advances in mobile electronics are fueling new possibilities in a variety of applications, one of which is ambulatory medical monitoring with body-worn or implanted sensors. Digital processors on such sensors serve to analyze signals in real-time and extract key features for transmission or storage. To support diverse and evolving applications, the processor should be flexible, and to extend sensor operating lifetime, the processor should be energy-efficient. This thesis focuses on architectures and circuits for low power biomedical signal processing. A general-purpose processor is extended with custom hardware accelerators to reduce the cycle count and energy for common tasks, including FIR and median filtering as well as computing FFTs and mathematical functions. Improvements to classic architectures are proposed to reduce power and improve versatility: an FFT accelerator demonstrates a new control scheme to reduce datapath switching activity, and a modified CORDIC engine features increased input range and decreased quantization error over conventional designs. At the system level, the addition of accelerators increases leakage power and bus loading; strategies to mitigate these costs are analyzed in this thesis. A key strategy for improving energy efficiency is to aggressively scale the power supply voltage according to application performance demands. However, increased sensitivity to variation at low voltages must be mitigated in logic and SRAM design. For logic circuits, a design flow and a hold time verification methodology addressing local variation are proposed and demonstrated in a 65nm microcontroller functioning at 0.3V. For SRAMs, a model for the weak-cell read current is presented for near-V supply voltages, and a self-timed scheme for reducing internal bus glitches is employed with low leakage overhead. The above techniques are demonstrated in a 0.5-1.OV biomedical signal processing platform in 0.13p-Lm CMOS. The use of accelerators for key signal processing enabled greater than 10x energy reduction in two complete EEG and EKG analysis applications, as compared to implementations on a conventional processor.by Joyce Y. S. Kwong.Ph.D

Low-Power Design of Digital VLSI Circuits around the Point of First Failure

As an increase of intelligent and self-powered devices is forecasted for our future everyday life, the implementation of energy-autonomous devices that can wirelessly communicate data from sensors is crucial. Even though techniques such as voltage scaling proved to effectively reduce the energy consumption of digital circuits, additional energy savings are still required for a longer battery life. One of the main limitations of essentially any low-energy technique is the potential degradation of the quality of service (QoS). Thus, a thorough understanding of how circuits behave when operated around the point of first failure (PoFF) is key for the effective application of conventional energy-efficient methods as well as for the development of future low-energy techniques. In this thesis, a variety of circuits, techniques, and tools is described to reduce the energy consumption in digital systems when operated either in the safe and conservative exact region, close to the PoFF, or even inside the inexact region. A straightforward approach to reduce the power consumed by clock distribution while safely operating in the exact region is dual-edge-triggered (DET) clocking. However, the DET approach is rarely taken, primarily due to the perceived complexity of its integration. In this thesis, a fully automated design flow is introduced for applying DET clocking to a conventional single-edge-triggered (SET) design. In addition, the first static true-single-phase-clock DET flip-flop (DET-FF) that completely avoids clock-overlap hazards of DET registers is proposed. Even though the correct timing of synchronous circuits is ensured in worst-case conditions, the critical path might not always be excited. Thus, dynamic clock adjustment (DCA) has been proposed to trim any available dynamic timing margin by changing the operating clock frequency at runtime. This thesis describes a dynamically-adjustable clock generator (DCG) capable of modifying the period of the produced clock signal on a cycle-by-cycle basis that enables the DCA technique. In addition, a timing-monitoring sequential (TMS) that detects input transitions on either one of the clock phases to enable the selection of the best timing-monitoring strategy at runtime is proposed. Energy-quality scaling techniques aimat trading lower energy consumption for a small degradation on the QoS whenever approximations can be tolerated. In this thesis, a low-power methodology for the perturbation of baseline coefficients in reconfigurable finite impulse response (FIR) filters is proposed. The baseline coefficients are optimized to reduce the switching activity of the multipliers in the FIR filter, enabling the possibility of scaling the power consumption of the filter at runtime. The area as well as the leakage power of many system-on-chips is often dominated by embedded memories. Gain-cell embedded DRAM (GC-eDRAM) is a compact, low-power and CMOS-compatible alternative to the conventional static random-access memory (SRAM) when a higher memory density is desired. However, due to GC-eDRAMs relying on many interdependent variables, the adaptation of existing memories and the design of future GCeDRAMs prove to be highly complex tasks. Thus, the first modeling tool that estimates timing, memory availability, bandwidth, and area of GC-eDRAMs for a fast exploration of their design space is proposed in this thesis

Runtime Monitoring for Dependable Hardware Design

Mit dem Voranschreiten der Technologieskalierung und der Globalisierung der Produktion von integrierten Schaltkreisen eröffnen sich eine Fülle von Schwachstellen bezüglich der Verlässlichkeit von Computerhardware. Jeder Mikrochip wird aufgrund von Produktionsschwankungen mit einem einzigartigen Charakter geboren, welcher sich durch seine Arbeitsbedingungen, Belastung und Umgebung in individueller Weise entwickelt. Daher sind deterministische Modelle, welche zur Entwurfszeit die Verlässlichkeit prognostizieren, nicht mehr ausreichend um Integrierte Schaltkreise mit Nanometertechnologie sinnvoll abbilden zu können. Der Bedarf einer Laufzeitanalyse des Zustandes steigt und mit ihm die notwendigen Maßnahmen zum Erhalt der Zuverlässigkeit. Transistoren sind anfällig für auslastungsbedingte Alterung, die die Laufzeit der Schaltung erhöht und mit ihr die Möglichkeit einer Fehlberechnung. Hinzu kommen spezielle Abläufe die das schnelle Altern des Chips befördern und somit seine zuverlässige Lebenszeit reduzieren. Zusätzlich können strahlungsbedingte Laufzeitfehler (Soft-Errors) des Chips abnormales Verhalten kritischer Systeme verursachen. Sowohl das Ausbreiten als auch das Maskieren dieser Fehler wiederum sind abhängig von der Arbeitslast des Systems. Fabrizierten Chips können ebenfalls vorsätzlich während der Produktion boshafte Schaltungen, sogenannte Hardwaretrojaner, hinzugefügt werden. Dies kompromittiert die Sicherheit des Chips. Da diese Art der Manipulation vor ihrer Aktivierung kaum zu erfassen ist, ist der Nachweis von Trojanern auf einem Chip direkt nach der Produktion extrem schwierig. Die Komplexität dieser Verlässlichkeitsprobleme machen ein einfaches Modellieren der Zuverlässigkeit und Gegenmaßnahmen ineffizient. Sie entsteht aufgrund verschiedener Quellen, eingeschlossen der Entwicklungsparameter (Technologie, Gerät, Schaltung und Architektur), der Herstellungsparameter, der Laufzeitauslastung und der Arbeitsumgebung. Dies motiviert das Erforschen von maschinellem Lernen und Laufzeitmethoden, welche potentiell mit dieser Komplexität arbeiten können. In dieser Arbeit stellen wir Lösungen vor, die in der Lage sind, eine verlässliche Ausführung von Computerhardware mit unterschiedlichem Laufzeitverhalten und Arbeitsbedingungen zu gewährleisten. Wir entwickelten Techniken des maschinellen Lernens um verschiedene Zuverlässigkeitseffekte zu modellieren, zu überwachen und auszugleichen. Verschiedene Lernmethoden werden genutzt, um günstige Überwachungspunkte zur Kontrolle der Arbeitsbelastung zu finden. Diese werden zusammen mit Zuverlässigkeitsmetriken, aufbauend auf Ausfallsicherheit und generellen Sicherheitsattributen, zum Erstellen von Vorhersagemodellen genutzt. Des Weiteren präsentieren wir eine kosten-optimierte Hardwaremonitorschaltung, welche die Überwachungspunkte zur Laufzeit auswertet. Im Gegensatz zum aktuellen Stand der Technik, welcher mikroarchitektonische Überwachungspunkte ausnutzt, evaluieren wir das Potential von Arbeitsbelastungscharakteristiken auf der Logikebene der zugrundeliegenden Hardware. Wir identifizieren verbesserte Features auf Logikebene um feingranulare Laufzeitüberwachung zu ermöglichen. Diese Logikanalyse wiederum hat verschiedene Stellschrauben um auf höhere Genauigkeit und niedrigeren Overhead zu optimieren. Wir untersuchten die Philosophie, Überwachungspunkte auf Logikebene mit Hilfe von Lernmethoden zu identifizieren und günstigen Monitore zu implementieren um eine adaptive Vorbeugung gegen statisches Altern, dynamisches Altern und strahlungsinduzierte Soft-Errors zu schaffen und zusätzlich die Aktivierung von Hardwaretrojanern zu erkennen. Diesbezüglich haben wir ein Vorhersagemodell entworfen, welches den Arbeitslasteinfluss auf alterungsbedingte Verschlechterungen des Chips mitverfolgt und dazu genutzt werden kann, dynamisch zur Laufzeit vorbeugende Techniken, wie Task-Mitigation, Spannungs- und Frequenzskalierung zu benutzen. Dieses Vorhersagemodell wurde in Software implementiert, welche verschiedene Arbeitslasten aufgrund ihrer Alterungswirkung einordnet. Um die Widerstandsfähigkeit gegenüber beschleunigter Alterung sicherzustellen, stellen wir eine Überwachungshardware vor, welche einen Teil der kritischen Flip-Flops beaufsichtigt, nach beschleunigter Alterung Ausschau hält und davor warnt, wenn ein zeitkritischer Pfad unter starker Alterungsbelastung steht. Wir geben die Implementierung einer Technik zum Reduzieren der durch das Ausführen spezifischer Subroutinen auftretenden Belastung von zeitkritischen Pfaden. Zusätzlich schlagen wir eine Technik zur Abschätzung von online Soft-Error-Schwachstellen von Speicherarrays und Logikkernen vor, welche auf der Überwachung einer kleinen Gruppe Flip-Flops des Entwurfs basiert. Des Weiteren haben wir eine Methode basierend auf Anomalieerkennung entwickelt, um Arbeitslastsignaturen von Hardwaretrojanern während deren Aktivierung zur Laufzeit zu erkennen und somit eine letzte Verteidigungslinie zu bilden. Basierend auf diesen Experimenten demonstriert diese Arbeit das Potential von fortgeschrittener Feature-Extraktion auf Logikebene und lernbasierter Vorhersage basierend auf Laufzeitdaten zur Verbesserung der Zuverlässigkeit von Harwareentwürfen

Design of robust ultra-low power platform for in-silicon machine learning

The rapid development of machine learning plays a key role in enabling next generation computing systems with enhanced intelligence. Present day machine learning systems adopt an "intelligence in the cloud" paradigm, resulting in heavy energy cost despite state-of-the-art performance. It is therefore of great interest to design embedded ultra-low power (ULP) platforms with in-silicon machine learning capability. A self-contained ULP platform consists of the energy delivery, sensing and information processing subsystems. This dissertation proposes techniques to design and optimize the ULP platform for in-silicon machine learning by exploring a trade-off that exists between energy-efficiency and robustness. This trade-off arises when the information processing functionality is integrated into the energy delivery, sensing, or emerging stochastic fabrics (e.g., CMOS operating in near-threshold voltage or voltage overscaling, and beyond CMOS devices). This dissertation presents the Compute VRM (C-VRM) to embed the information processing into the energy delivery subsystem. The C-VRM employs multiple voltage domain stacking and core swapping to achieve high total system energy efficiency in near/sub-threshold region. A prototype IC of the C-VRM is implemented in a 1.2 V, 130 nm CMOS process. Measured results indicate that the C-VRM has up to 44.8% savings in system-level energy per operation compared to the conventional system, and an efficiency ranging from 79% to 83% over an output voltage range of 0.52 V to 0.6 V. This dissertation further proposes the Compute Sensor approach to embed information processing into the sensing subsystem. The Compute Sensor eliminates both the traditional sensor-processor interface, and the high-SNR/high-energy digital processing by moving feature extraction and classification functions into the analog domain. Simulation results in 65 nm CMOS show that the proposed Compute Sensor can achieve a detection accuracy greater than 94.7% using the Caltech101 dataset, which is within 0.5% of that achieved by an ideal digital implementation. The performance is achieved with 7x to 17x lower energy than the conventional architecture for the same level of accuracy. To further explore the energy-efficiency vs. robustness trade-off, this dissertation explores the use of highly energy efficient but unreliable stochastic fabrics to implement in-silicon machine learning kernels. In order to perform reliable computation on the stochastic fabrics, this dissertation proposes to employ statistical error compensation (SEC) as an effective error compensation technique. This dissertation makes a contribution to the portfolio of SEC by proposing embedded algorithmic noise tolerance (E-ANT) for low overhead error compensation. E-ANT operates by reusing part of the main block as estimator and thus embedding the estimator into the main block. System level simulation results in a commercial 45 nm CMOS process show that E-ANT achieves up to 38% error tolerance and up to 51% energy savings compared with an uncompensated system. This dissertation makes a contribution to the theoretical understanding of stochastic fabrics by proposing a class of probabilistic error models that can accurately model the hardware errors on the stochastic fabrics. The models are validated in a commercial 45 nm CMOS process and employed to evaluate the performance of machine learning kernels in the presence of hardware errors. Performance prediction of a support vector machine (SVM) based classifier using these models indicates that the probability of detection P_{det} estimated using the proposed model is within 3% for timing errors due to voltage overscaling when the error rate p_η ≤ 80%, within 5% for timing errors due to process variation in near threshold-voltage (NTV) region (0.3 V-0.7 V) and within 2% for defect errors when the defect rate p_{saf} is between 10^{-3} and 20%, compared with HDL simulation results. Employing the proposed error model and evaluation methodology, this dissertation explores the use of distributed machine learning architectures, named classifier ensemble, to enhance the robustness of in-silicon machine learning kernels. Comparative study of distributed architectures (i.e., random forest (RF)) and centralized architectures (i.e., SVM) is performed in a commercial 45 nm CMOS process. Employing the UCI machine learning repository as input, it is determined that RF-based architectures are significantly more robust than SVM architectures in presence of timing errors in the NTV region (0.3 V- 0.7 V). Additionally, an error weighted voting technique that incorporates the timing error statistics of the NTV circuit fabric is proposed to further enhance the robustness of RF architectures. Simulation results confirm that the error weighted voting technique achieves a P_{det} that varies by only 1.4%, which is 12x lower compared to centralized architectures

A wearable heart monitor at the ear using ballistocardiogram (BCG) and electrocardiogram (ECG) with a nanowatt ECG heartbeat detection circuit

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2013.Cataloged from PDF version of thesis.Includes bibliographical references (p. 132-137).This work presents a wearable heart monitor at the ear that uses the ballistocardiogram (BCG) and the electrocardiogram (ECG) to extract heart rate, stroke volume, and pre-ejection period (PEP) for the application of continuous heart monitoring. Being a natural anchoring point, the ear is demonstrated as a viable location for the integrated sensing of physiological signals. The source of periodic head movements is identified as a type of BCG, which is measured using an accelerometer. The head BCG's principal peaks (J-waves) are synchronized to heartbeats. Ensemble averaging is used to obtain consistent J-wave amplitudes, which are related to stroke volume. The ECG is sensed locally near the ear using a single-lead configuration. When the BCG and the ECG are used together, an electromechanical duration called the RJ interval can be obtained. Because both head BCG and ECG have low signal-to-noise ratios, cross-correlation is used to statistically extract the RJ interval. The ear-worn device is wirelessly connected to a computer for real time data recording. A clinical test involving hemodynamic maneuvers is performed on 13 subjects. The results demonstrate a linear relationship between the J-wave amplitude and stroke volume, and a linear relationship between the RJ interval and PEP. While the clinical device uses commercial components, a custom integrated circuit for ECG heartbeat detection is designed with the goal of reducing power consumption and device size. With 58nW of power consumption, the ECG circuit replaces the traditional instrumentation amplifier, analog-to-digital converter, and signal processor with a single chip solution. The circuit demonstrates a topology that takes advantage of the ECG's characteristics to extract R-wave timings at the chest and the ear in the presence of baseline drift, muscle artifact, and signal clipping.by David Da He.Ph.D

Radiation Tolerant Electronics, Volume II

Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade.After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects

Low Voltage Circuit Design Techniques for Cubic-Millimeter Computing.

Cubic-millimeter computers complete with microprocessors, memories, sensors, radios and power sources are becomingly increasingly viable. Power consumption is one of the last remaining barriers to cubic-millimeter computing and is the subject of this work. In particular, this work focuses on minimizing power consumption in digital circuits using low voltage operation. Chapter 2 includes a general discussion of low voltage circuit behavior, specifically that at subthreshold voltages. In Chapter 3, the implications of transistor scaling on subthreshold circuits are considered. It is shown that the slow scaling of gate oxide relative to the device channel length leads to a 60% reduction in Ion/Ioff between the 90nm and 32nm nodes, which results in sub-optimal static noise margins, delay, and power consumption. It is also shown that simple modifications to gate length and doping can alleviate some of these problems. Three low voltage test-chips are discussed for the remainder of this work. The first test-chip implements the Subliminal Processor (Chapter 4), a sub-200mV 8-bit microprocessor fabricated in a 0.13µm technology. Measurements first show that the Subliminal Processor consumes only 3.5pJ/instruction at Vdd=350mV. Measurements of 20 dies then reveal that proper body biasing can eliminate performance variations and reduce mean energy substantially at low voltage. Finally, measurements are used to explore the effectiveness of body biasing, voltage scaling, and various gate sizing techniques for improving speed. The second test-chip implements the Phoenix Processor (Chapter 5), a low voltage 8-bit microprocessor optimized for minimum power operation in standby mode. The Phoenix Processor was fabricated in a 0.18µm technology in an area of only 915x915µm2. The aggressive standby mode strategy used in the Phoenix Processor is discussed thoroughly. Measurements at Vdd=0.5V show that the test-chip consumes 226nW in active mode and only 35.4pW in standby mode, making an on-chip battery a viable option. Finally, the third test-chip implements a low voltage image sensor (Chapter 6). A 128x128 image sensor array was fabricated in a 0.13µm technology. Test-chip measurements reveal that operation below 0.6V is possible with power consumption of only 1.9µW at 0.6V. Extensive characterization is presented with specific emphasis on noise characteristics and power consumption.Ph.D.Electrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/62233/1/hansons_1.pd