Построение и применение маршевых тестов для обнаружения кодочувствительных неисправностей запоминающих устройств

The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type.Показывается актуальность задачи тестирования запоминающих устройств современных вычислительных систем. Исследуются математические модели неисправностей запоминающих устройств и используемые методы тестирования наиболее сложных из них на базе классических маршевых тестов. Выделяются пассивные кодочувствительные неисправности (PNPSFk), в которых участвуют произвольные k из N ячеек памяти, где k << N, а N представляет собой емкость памяти в битах. Для этих неисправностей приводятся аналитические выражения минимальной и максимальной полноты покрытия, которые достижимы в рамках маршевых тестов. Определяется понятие примитива, описывающего в терминах элементов маршевого теста условия активизации и обнаружения неисправностей PNPSFk запоминающих устройств. Приводятся примеры построения маршевых тестов, имеющих максимальную полноту покрытия, а также маршевых тестов с минимальной временной сложностью, равной 18N. Исследуется эффективность однократного применения тестов типа MATS++, March C− и March PS для различного количества k ≤ 9 ячеек памяти, участвующих в неисправности PNPSFk. Обосновывается применимость многократного тестирования с изменяемыми адресными последовательностями, в качестве которых предлагается применять случайные последовательности адресов. Приводятся аналитические выражения для полноты покрытия сложных неисправностей PNPSFk в зависимости от кратности теста. Кроме того, даются оценки среднего значения кратности тестов MATS++, March C− и March PS, полученные на основании математической модели, которая описывает задачу собирателя купонов, и обеспечивающие обнаружение всех k2k неисправностей PNPSFk. Экспериментально показывается справедливость аналитических оценок и подтверждается высокая эффективность обнаружения неисправностей PNPSFk тестами типа March PS

Анализ и синтез маршевых тестов запоминающих устройств

The paper shows the relevance of testing storage devices in modern computing systems. Mathematical models of memory device faults and the efficiency of their detection, in particular, complex pattern sensitive faults of the PNPSFk type, based on classical march memory tests are presented. Limit estimates are given for the completeness of coverage of such faults depending on the number of memory cells involved in the fault. The necessity of synthesis of memory march tests characterized by high efficiency of PNPSFk failure detection is substantiated. The concept of a primitive providing conditions for activation and detection of various types of PNPSFk is defined. Examples of analysis and synthesis of memory march tests with different coverage of PNPSFk faults are given. The March OP memory test is synthesized, which is characterized by the maximum completeness of PNPSFk fault coverage and has the lowest time complexity compared to the known memory march tests, which provide the same comprehensiveness of coverage of complex memory device faults.В статье показывается актуальность тестирования запоминающих устройств современных вычислительных систем. Представляются математические модели неисправностей запоминающих устройств и эффективность их обнаружения, в частности, сложных кодочувствительных неисправностей типа PNPSFk, на базе классических маршевых тестов. Приводятся предельные оценки полноты покрытия подобных неисправностей в зависимости от количества запоминающих ячеек, участвующих в неисправности. Обосновывается необходимость синтеза маршевых тестов, характеризующихся высокой эффективностью обнаружения PNPSFk неисправностей. Определяется понятие примитива, обеспечивающего условия активизации и обнаружения различных видов PNPSFk. Приводятся примеры анализа и синтеза маршевых тестов, имеющих различную полноту покрытия PNPSFk неисправностей. Синтезируется маршевый тест March OP, характеризующийся максимальной полнотой покрытия неисправностей PNPSFk и имеющий минимальную временную сложность по сравнению с известными маршевыми тестами, обеспечивающими такую же полноту покрытия сложных неисправностей запоминающих устройств.

Анализ и синтез маршевых тестов запоминающих устройств

В статье показывается актуальность тестирования запоминающих устройств современных вычислительных систем. Представляются математические модели сложных кодочувствительных неисправностей типа PNPSFk, на базе классических маршевых тестов. Определяется понятие примитива, обеспечивающего условия активизации и обнаружения различных видов PNPSFk. Синтезируется маршевый тест March OP характеризующийся максимальной полнотой покрытия неисправностей PNPSFk по сравнению с известными маршевыми тестами, обеспечивающими такую же полноту покрытия сложных неисправностей запоминающих устройств

Universal Address Sequence Generator for Memory Built-in Self-test

This paper presents the universal ad-dress sequence generator (UASG) for memorybuilt-in-self-test. The studies are based on the proposed universal method for generating address se-quences with the desired properties for multirun march memory tests. As a mathematical model, a modification of the recursive relation for quasi-random sequence generation is used. For this model, a structural diagram of the hardware implementation is given, of which the basis is a storage device for storing so-called direction numbers of the generation matrix. The form of the generation matrix determines the basic properties of the generated ad-dress sequences. The proposed UASG generates a wide spectrum of different address sequences, including the stand-ard ones, such as linear, address com-plement, gray code, worst-case gate delay, 2i, next address, and pseudoran-dom. Examples of the use of the pro-posed methods are considered. The result of the practical implementation of the UASG is presented, and the main characteristics are evaluated

Towards Data Reliable, Low-Power, and Repairable Resistive Random Access Memories

A series of breakthroughs in memristive devices have demonstrated the potential of memristor arrays to serve as next generation resistive random access memories (ReRAM), which are fast, low-power, ultra-dense, and non-volatile. However, memristors' unique device characteristics also make them prone to several sources of error. Owing to the stochastic filamentary nature of memristive devices, various recoverable errors can affect the data reliability of a ReRAM. Permanent device failures further limit the lifetime of a ReRAM. This dissertation developed low-power solutions for more reliable and longer-enduring ReRAM systems. In this thesis, we first look into a data reliability issue known as write disturbance. Writing into a memristor in a crossbar could disturb the stored values in other memristors that are on the same memory line as the target cell. Such disturbance is accumulative over time which may lead to complete data corruption. To address this problem, we propose the use of two regular memristors on each word to keep track of the disturbance accumulation and trigger a refresh to restore the weakened data, once it becomes necessary. We also investigate the considerable variation in the write-time characteristics of individual memristors. With such variation, conventional fixed-pulse write schemes not only waste significant energy, but also cannot guarantee reliable completion of the write operations. We address such variation by proposing an adaptive write scheme that adjusts the width of the write pulses for each memristor. Our scheme embeds an online monitor to detect the completion of a write operation and takes into account the parasitic effect of line-shared devices in access-transistor-free memristive arrays. We further investigate the use of this method to shorten the test time of memory march algorithms by eliminating the need of a verifying read right after a write, which is commonly employed in the test sequences of march algorithms.Finally, we propose a novel mechanism to extend the lifetime of a ReRAM by protecting it against hard errors through the exploitation of a unique feature of bipolar memristive devices. Our solution proposes an unorthodox use of complementary resistive switches (a particular implementation of memristive devices) to provide an ``in-place spare'' for each memory cell at negligible extra cost. The in-place spares are then utilized by a repair scheme to repair memristive devices that have failed at a stuck-at-ON state at a page-level granularity. Furthermore, we explore the use of in-place spares in lieu of other memory reliability and yield enhancement solutions, such as error correction codes (ECC) and spare rows. We demonstrate that with the in-place spares, we can yield the same lifetime as a baseline ReRAM with either significantly fewer spare rows or a lighter-weight ECC, both of which can save on energy consumption and area

Scalable String and Suffix Sorting: Algorithms, Techniques, and Tools

This dissertation focuses on two fundamental sorting problems: string sorting and suffix sorting. The first part considers parallel string sorting on shared-memory multi-core machines, the second part external memory suffix sorting using the induced sorting principle, and the third part distributed external memory suffix sorting with a new distributed algorithmic big data framework named Thrill.Comment: 396 pages, dissertation, Karlsruher Instituts f\"ur Technologie (2018). arXiv admin note: text overlap with arXiv:1101.3448 by other author

Kansas Farmer and Mail & Breeze, v. 57, no. 50 (December 13, 1919)

Published as: Kansas Farmer, Vol. 1, no. 1 (May 1, 1863)-v. 57, no. 49 (Dec. 6, 1919); Kansas Farmer and Mail & Breeze, Vol. 57, no. 50 (Dec 13, 1919)-v. 64, no. 9 (Feb 27, 1926); Kansas Farmer, Mail & Breeze, Vol. 64, no. 10 (Mar. 6, 1926)-v. 70, no. 1 (Jan. 9, 1932); Kansas Farmer Continuing Mail & Breeze, Vol. 70, no. 2 (Jan. 23, 1932)-v. 76, no. 8 (Apr. 22, 1939); Kansas Farmer, Mail & Breeze, Vol. 76, no. 9 (May 6, 1939)-v. 77, no. 20 (Oct. 5, 1940); Kansas Farmer Continuing Mail & Breeze, Vol. 77, no. 21 (Oct. 19, 1940)-v. 91, no. 3 (Feb. 6, 1954).Issued by Kansas Farmer Co., 1863-1919; Kansas Farmer and Mail & Breeze, 1919-1926; Kansas Farmer, 1926-1954.Missing issues and volumes arranged chronologically by date and journal name: Kansas Farmer: vol. 6, nos. 2-8, 10 and 12 (1869); vol. 9, no. 10 (1872); vol. 14, no. 50 (1876); vol. 18, nos. 1, 12 and 13 (1880); vol. 24. no. 16 (1886); vol. 35 (1897); vol. 38 (1900); vol. 41, nos. 52 and 53 (1903); vol. 42, nos. 17 and 35 (1904); vol. 48, nos. 11 and 53 (1910); vol. 50, nos. 45-50 (1912); vol. 53 (1915); vol. 56 (1918); vol. 49, no. 39 (1919); Kansas Farmer, Continuing Mail & Breeze: vol. 73 (1935); vol. 85, nos. 9-17 (1948); and The Farmers Mail and Breeze: vol. 49, no. 39 (1919).Call number: S544.3.K3 K3

The Papers of Thomas A. Edison

This newest volume in the acclaimed Papers of Thomas A. Edison covers one year in the life of America's greatest inventor—1878. That year Edison, whom a New York newspaper in the spring first called "the Wizard of Menlo Park," developed the phonograph, one of his most famous inventions; made a breakthrough in the development of telephone transmitters, which made the instrument commercially viable; and announced the advent of domestic electric lighting, with only a few weeks' worth of tinkering necessary to complete its design (the announcement sent gas-company stocks plummeting; the research and development went on for four years).These inventions brought Edison financial support for his work and attention from the public. In January investors in the Edison Speaking Phonograph Company agreed to fund development work on the phonograph. The invention made Edison internationally famous and in May he traveled to Washington, D.C., to show the phonograph at the National Academy of Sciences, to Congress, and to President Rutherford B. Hayes at the White House. That same month Western Union agreed to pay Edison an annual salary of $6,000 for his telephone inventions, although other support from the company declined following the death of its president, William Orton. The stress of unceasing public attention, including a trans-Atlantic dispute over the question of who invented the microphone, led an exhausted Edison to travel west during the summer to witness a solar eclipse but also to seek rest. His six-week trip took him to San Francisco and the Yosemite region of California. Edison began working on electric lighting after his return and in October the Edison Electric Light Company was formed to support his research

Viet Nam Generation, Volume 7, Number 1-2

Edited by Dan Duffy and Kali Tal. Contributing editors: Renny Christopher. David DeRose, Alan Farrell. Cynthia Fuchs, William M. King. Bill Shields, Tony Williams, and David Willson

Ben Jonson\u27s Volpone : A Critical Variorum edition

Ben Jonson\u27s Volpone: A Critical Variorum provides modern scholars with a comprehensive bibliographic reference work devoted to Jonson\u27s early seventeenth-century dramatic comedy and its four hundred years of critical commentary. By joining together Jonson\u27s Volpone and the work\u27s full complement of editorial information and critical material, this Variorum edition illuminates the play\u27s entire history of critical reception and literary interpretation within a format that allows readers and researchers to follow the evolving lines of influence peculiar to the work\u27s critical tradition and to locate new areas of investigation. Based upon an authoritative copy of the 1607 quarto, the Variorum reprints Jonson\u27s primary text above a continuous subset of line-by-line annotations that reflects the history of glosses and notes produced by the play\u27s legion of editors and commentators. At a glance, readers may review each footnote\u27s chronological survey of the editorial insights and critical remarks related to either the elucidation of the text\u27s dramatic language or the identification of Jonson\u27s historical and literary allusions. Those early observations that have since developed into larger critical debates receive fuller treatments within the variorum\u27s extensive collection of appendices. Drawing upon printed materials ranging from the earliest contemporary allusions to established critical works to the latest journal articles, each subsection of the Appendix provides a chronological distillation of the most significant contributions made to the play\u27s long history of textual scholarship, literary interpretation, or theatrical evaluation. Among its expansive range of topics, the Variorum\u27s appendices compile and organize the critical material and textual information related to the play\u27s printing and editorial histories; Jonson\u27s source materials and literary influences; and literary studies of the play\u27s genre, themes, language, and characters. In addition to its footnoted annotations and fully developed appendices, this variorum edition also provides a complete bibliographic catalogue of critical materials and resources pertinent to the study of the text