6 research outputs found

    Technology-generic tool for interconnect reliability projections in 3D integrated circuits

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    Supervised by Donald E. Troxel and Carl V. Thompson.Also issued as Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.Includes bibliographical references (p. 107-112).by Syed Mohiul Alam

    Technology-generic tool for interconnect reliability projections in 3D integrated circuits

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    Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.Includes bibliographical references (p. 107-112).Recent developments in semiconductor processing technology has enabled the fabrication of a single integrated circuit (IC) with multiple device-interconnect layers or wafers stacked on each other. This approach is commonly referred to as the 3D integration of ICs. Although there has been significant research on the impact of 3D integration on chip size, interconnect delay, and overall system performance, the reliability issues in the 3D interconnect arrays are largely unknown. In this research, a novel Reliability Computer Aided Design (RCAD) tool ERNI-3D has been developed for reliability analysis of interconnects in a 3D IC. Using this tool, circuit designers can get interactive feedback on the reliability of their circuits associated with electromigration, 3D bonding, and joule heating. Based on a joint probability distribution, a full-chip reliability model combines all reliability figures from different components to give a useful number for the designers' reference. This initial version of ERNI-3D treats 3D circuits with two wafers or device-interconnect layers in the stack. However, the data-structures and algorithms in the tool are generic enough to make it compatible with 3D circuits with more than two device-interconnect layers, and to allow incorporation of more sophisticated reliability models in the future. Since 3D integration technology is not yet widespread, and no CAD tool supports IC layouts for such a technology, a novel layout methodology has been implemented in 3DMagic by extending MAGIC, a widely used layout editor in academia. Apart from the CAD tool work, this research has also led to the development of, and interesting experiments with, some 3D circuits for testing ERNI-3D. The test circuits investigated are a 3D 8-bit adder and an FPGA.by Syed Mohiul Alam.S.M

    Modeling and simulation of VLSI interconnections with moments

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    Also issued as Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1989.Includes bibliographical references.Supported in part by the Joint Services Electronics Program. DAAL03-86-K-0002Steven Paul McCormick

    Graph-based representations and coupled verification of VLSI schematics and layouts

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    Includes bibliographical references (p. 199-202).Work supported by the Air Force Office of Scientific Research. AFSOR 86-0164 Work supported by IBM and Analog Devices.Cyrus S. Bamji

    The Telecommunications and Data Acquisition Report

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    This publication, one of a series formerly titled The Deep Space Network Progress Report, documents DSN progress in flight project support, tracking and data acquisition research and technology, network engineering, hardware and software implementation, and operations. In addition, developments in Earth-based radio technology as applied to geodynamics, astrophysics and the radio search for extraterrestrial intelligence are reported

    Recognition of VLSI module isomorphism

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    The purpose of this study is to determine whether or not a program could be developed to examine isomorphism between parts of a VLSI layout. Many simulation files, obtained through Magic's hierarchical extractor, were analyzed in order to develop a C program to accomplish recognition in several types of gates. This recognition gives signatures in order to check for isomorphism. The development and design of the algorithms used in different parts of the program are described. Results demonstrate that recognition of elements in a CMOS circuit is possible, even with moderate complexity structures. An appendix with the C program listings is included.http://archive.org/details/recognitionofvls1094530728Lieutenant, Hellenic NavyApproved for public release; distribution is unlimited.Approved for public release; distribution is unlimited
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