Machine learning -- based diffractive imaging with subwavelength resolution

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present a new imaging technique capable of fast and accurate characterization of two-dimensional structures with at least wavelength/25 resolution, based on a single far-field intensity measurement. Experimentally, we realized this technique resolving the smallest-available to us 180-nm-scale features with 532-nm laser light. A comprehensive analysis of machine learning algorithms was performed to gain insight into the learning process and to understand the flow of subwavelength information through the system. Image parameterization, suitable for diffractive configurations and highly tolerant to random noise was developed. The proposed technique can be applied to new characterization tools with high spatial resolution, fast data acquisition, and artificial intelligence, such as high-speed nanoscale metrology and quality control, and can be further developed to high-resolution spectroscop

Ensemble learning of diffractive optical networks

A plethora of research advances have emerged in the fields of optics and photonics that benefit from harnessing the power of machine learning. Specifically, there has been a revival of interest in optical computing hardware, due to its potential advantages for machine learning tasks in terms of parallelization, power efficiency and computation speed. Diffractive Deep Neural Networks (D2NNs) form such an optical computing framework, which benefits from deep learning-based design of successive diffractive layers to all-optically process information as the input light diffracts through these passive layers. D2NNs have demonstrated success in various tasks, including e.g., object classification, spectral-encoding of information, optical pulse shaping and imaging, among others. Here, we significantly improve the inference performance of diffractive optical networks using feature engineering and ensemble learning. After independently training a total of 1252 D2NNs that were diversely engineered with a variety of passive input filters, we applied a pruning algorithm to select an optimized ensemble of D2NNs that collectively improve their image classification accuracy. Through this pruning, we numerically demonstrated that ensembles of N=14 and N=30 D2NNs achieve blind testing accuracies of 61.14% and 62.13%, respectively, on the classification of CIFAR-10 test images, providing an inference improvement of >16% compared to the average performance of the individual D2NNs within each ensemble. These results constitute the highest inference accuracies achieved to date by any diffractive optical neural network design on the same dataset and might provide a significant leapfrog to extend the application space of diffractive optical image classification and machine vision systems.Comment: 22 Pages, 4 Figures, 1 Tabl

Rapid Sensing of Hidden Objects and Defects using a Single-Pixel Diffractive Terahertz Processor

Terahertz waves offer numerous advantages for the nondestructive detection of hidden objects/defects in materials, as they can penetrate through most optically-opaque materials. However, existing terahertz inspection systems are restricted in their throughput and accuracy (especially for detecting small features) due to their limited speed and resolution. Furthermore, machine vision-based continuous sensing systems that use large-pixel-count imaging are generally bottlenecked due to their digital storage, data transmission and image processing requirements. Here, we report a diffractive processor that rapidly detects hidden defects/objects within a target sample using a single-pixel spectroscopic terahertz detector, without scanning the sample or forming/processing its image. This terahertz processor consists of passive diffractive layers that are optimized using deep learning to modify the spectrum of the terahertz radiation according to the absence/presence of hidden structures or defects. After its fabrication, the resulting diffractive processor all-optically probes the structural information of the sample volume and outputs a spectrum that directly indicates the presence or absence of hidden structures, not visible from outside. As a proof-of-concept, we trained a diffractive terahertz processor to sense hidden defects (including subwavelength features) inside test samples, and evaluated its performance by analyzing the detection sensitivity as a function of the size and position of the unknown defects. We validated its feasibility using a single-pixel terahertz time-domain spectroscopy setup and 3D-printed diffractive layers, successfully detecting hidden defects using pulsed terahertz illumination. This technique will be valuable for various applications, e.g., security screening, biomedical sensing, quality control, anti-counterfeiting measures and cultural heritage protection.Comment: 23 Pages, 5 Figure

Learning Wavefront Coding for Extended Depth of Field Imaging

Depth of field is an important factor of imaging systems that highly affects the quality of the acquired spatial information. Extended depth of field (EDoF) imaging is a challenging ill-posed problem and has been extensively addressed in the literature. We propose a computational imaging approach for EDoF, where we employ wavefront coding via a diffractive optical element (DOE) and we achieve deblurring through a convolutional neural network. Thanks to the end-to-end differentiable modeling of optical image formation and computational post-processing, we jointly optimize the optical design, i.e., DOE, and the deblurring through standard gradient descent methods. Based on the properties of the underlying refractive lens and the desired EDoF range, we provide an analytical expression for the search space of the DOE, which is instrumental in the convergence of the end-to-end network. We achieve superior EDoF imaging performance compared to the state of the art, where we demonstrate results with minimal artifacts in various scenarios, including deep 3D scenes and broadband imaging

Aperture Diffraction for Compact Snapshot Spectral Imaging

We demonstrate a compact, cost-effective snapshot spectral imaging system named Aperture Diffraction Imaging Spectrometer (ADIS), which consists only of an imaging lens with an ultra-thin orthogonal aperture mask and a mosaic filter sensor, requiring no additional physical footprint compared to common RGB cameras. Then we introduce a new optical design that each point in the object space is multiplexed to discrete encoding locations on the mosaic filter sensor by diffraction-based spatial-spectral projection engineering generated from the orthogonal mask. The orthogonal projection is uniformly accepted to obtain a weakly calibration-dependent data form to enhance modulation robustness. Meanwhile, the Cascade Shift-Shuffle Spectral Transformer (CSST) with strong perception of the diffraction degeneration is designed to solve a sparsity-constrained inverse problem, realizing the volume reconstruction from 2D measurements with Large amount of aliasing. Our system is evaluated by elaborating the imaging optical theory and reconstruction algorithm with demonstrating the experimental imaging under a single exposure. Ultimately, we achieve the sub-super-pixel spatial resolution and high spectral resolution imaging. The code will be available at: https://github.com/Krito-ex/CSST.Comment: accepted by International Conference on Computer Vision (ICCV) 202