Split-Drain Magnetic Field-Effect Transistor Channel Charge Trapping and Stress Induced Sensitivity Deterioration

Session EB: Materials for ApplicationsThis paper proposed an analytical model on the deterioration of magnetic sensitivity of sectorial split-drain magnetic field-effect transistors (SD-MAGFETs). The deterioration is governed by the trap fill rate at the channel boundary traps, which is geometric dependent. Experimental results are presented which show good consistency with the analytical derivation. The deterioration is the most severe at a sector angle of 54.6°, which shows a design tradeoff with sensing hysteresis. Design guidelines for sectorial SD-MAGFET to obtain high sensitivity hysteresis and slow sensitivity deterioration are also presented which provide important information for efficient design. © 2013 IEEE.published_or_final_versio

Voltage sensing based built-in current sensor for IDDQ test

Quiescent current leakage test of the VDD supply (IDDQ Test) has been proven an effective way to screen out defective chips in manufacturing of Integrated Circuits (IC). As technology advances, the traditional IDDQ test is facing more and more challenges. In this research, a practical built-in current sensor (BICS) is proposed and the design is verified by three generations of test chips. The BICS detects the signal by sensing the voltage drop on supply lines of the circuit under test (CUT). Then the sensor performs analog-to-digital conversion of the input signal using a stochastic process with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. This non-invasive procedure avoids any performance degradation of the CUT. The measurement results of test chips are presented. The sensor achieves a high IDDQ resolution with small chip area overhead. This will enable IDDQ of future technology generations

Three dimensional magnetic field sensors and array in BiCMOS technology

This thesis presents new designs of three dimensional magnetic field sensors in BiCMOS technology. The detailed design of the merged structure device by common diffusion and the high gain transduction circuit are presented. The merged structure has the advantage of less area, less external contacts and less parasitic capacitance. Cross-sensitivity is also eliminated by employing the merged structure. Three active on-chip loads are introduced to improve the sensitivity. The SPICE simulation results show that when a relative change in current ΔI/I is 0.001, about 13.6 mV and 8.5mV can be detected at the output in X(or Y) and Z directions, respectively. The experimental results from a standard (non-merged) BiCMOS magnetic sensor is presented. The 3-D sensor element has been integrated with the signal processing circuits to build a monolithic 8 x 8 sensor array. The detailed SPICE simulation results on the critical path shows the array can be operated with elimination of column-to-column offset voltages under a maximum scanning clock speed of about 0.5MHz. The array structure can find application in precise manufacturing as a position sensor

Development of GaN transducer and on-chip concentrator for galvanic current sensing

Gallium nitride (GaN) magnetic high electron mobility transistors (MagHEMTs) with different gate lengths intended for integration with magnetic flux concentrator for galvanic isolation are presented. Detailed discussions on the physical mechanisms behind the sensitivity change at room temperature with respect to gate geometry are given. The relative sensitivity of dual-drain GaN MagHEMTs with a device length of L = 65 μm and a width of W = 20 μm is measured at the highest of S = 17.21%/T and the lowest of S = 7.69%/T at VGS= -2 V and VGS= 0 V, respectively. In addition, a novel spiral magnetic flux concentrator with the conversion factor of up to FC= 96 mT/A is designed for improving the performance of the optimized MagHEMTs in ICs. It is predicted that a spiral configuration is a necessity to enhance the conversion factor for a long MagHEMT

An Integrated on-chip flux concentrator for galvanic current sensing

On-chip integration of a magnetic flux concentrator with a galvanic current sensor is proposed. Our layout utilizes a discontinuity in a magnetic via, resulting in penetration of the magnetic field into the substrate. A conversion factor of 96mT/A is predicted via simulations corresponding to a magnetic gain x1.8 in comparison to air. The permeability of the magnetic core required is 500, much lower than that reported in off-chip concentrators, resulting in a significant easing of the specifications of the material properties of the core

Dual-Drain GaN Magnetic Sensor Compatible With GaN RF Power Technology

This letter presents first–ever fabricated GaN split-current magnetic sensor device. This is the key technology needed to fully unlock the potential of GaN power technology. Device operation and key manufacturing steps are also presented. The measured relative current sensitivity is constant at 14 % T-1 for wide mT range of the magnetic field. The constant sensitivity of a fabricated sensor can be attributed to device’s 2DEG nature, i.e. its high electron concentration and mobility, and very small layer thickness

Contributing to Second Harmonic Manipulated Continuum Mode Power Amplifiers and On-Chip Flux Concentrators

The current cellular network consumes a staggering 100 TWh of energy every year. In the coming years, millions of devices will be added to the existing network to realize the Internet of Things (IoT), further increasing its power consumption. An RF power amplifier typically consumes a large proportion of the DC power in a wireless transceiver, improving its efficiency has the largest impact on the overall system. Additionally, amplifiers need to demonstrate high linearity and bandwidth to adhere to constraints imposed by wireless standards and to reduce the number of amplifiers required as an amplifier with a broader bandwidth can potentially replace several narrowband amplifiers. A typical approach to improve efficiency is to present an appropriate load at the harmonics generated by the transistor. Recently proposed continuous modes based on harmonic manipulation, such as class B/J continuum, continuous class F (CCF) and continuous class F-1 (CCF-1), have shown the capability of achieving counteracting requirements viz., high efficiency, high linearity, and broad bandwidth (with a fractional bandwidth greater than 30%). In these classes of amplifiers, the second harmonic is manipulated by placing a reactive second harmonic load and the reactive component of the fundamental load is adjusted while keeping a fixed resistive component of the fundamental load. The first contribution of this work is to investigate the reason for amplifiers designed in classes B/J continuum and CCF to achieve high efficiency at back-off and 1dB compression. In this thesis, we demonstrate that the variation of the phase of the current through the non-linear intrinsic capacitances due to the variation of the phase in the continuum of drain voltage waveforms in Class B/J/J* continuum leads to either a reduction or enhancement of intrinsic drain current. Consequently, a subset of voltage waveforms of the class B/J/J* continuum can be used to design amplifiers with higher P1dB, and efficiency at P1dB than in Class B. A simple choice of this subset is demonstrated with a 2.6GHz Class B/J/J* amplifier, achieving a P1dB of 38.1dBm and PAE at P1dB of 54.7%, the highest output power and efficiency at P1dB amongst narrowband linear amplifiers using the CGH40010 reported to date, at a comparable peak PAE of 72%. Secondly, we propose a new formulation for high-efficiency modes of power amplifiers in which both the in-phase and out-of-phase components of the second harmonic of the current are varied, in addition to the second harmonic component of the voltage. A reduction of the in-phase component of the second harmonic of current allows reduction of the phase difference between the voltage and current waveforms, thereby increasing the power factor and efficiency. Our proposed waveforms offer a continuous design space between class B/J continuum and continuous F-1 achieving an efficiency of up to 91% in theory, but over a wider set of load impedances than continuous class F-1. These waveforms require a short at third and higher harmonic impedances, which are easier to achieve at a higher frequency. The load impedances at the second harmonic are reactive and can be of any value between -j∞ and j∞, easing the amplifier design. A trade-off between linearity and efficiency exists in the newly proposed broadband design space, but we demonstrate inherent broadband capability. The fabricated narrowband amplifier using a GaN HEMT CGH40010F demonstrates 75.9% PAE and 42.2 dBm output power at 2.6 GHz, demonstrating a comparable frequency weighted efficiency for this device to that reported in the literature. IoT devices may be deployed in critical applications such as radar or 5G transceivers of an autonomous vehicle and hence need to operate free of failure. Monitoring the drain current of the RF GaN MMIC would allow to optimize the device performance and protect it from surges in its supply current. Galvanic current sensors rely on the magnetic field generated by the current as a non-invasive method of current sensing. In this thesis, our third major contribution is a planar on-chip magnetic flux concentrator, is enhance the magnetic field at the current sensor, thereby improving the current detection capability of a current sensor. Our layout utilizes a discontinuity in a magnetic via, resulting in penetration of the magnetic field into the substrate. The proposed concentrator has a magnetic gain x1.8 in comparison to air. The permeability of the magnetic core required is 500, much lower than that reported in off-chip concentrators, resulting in a significant easing of the specifications of the material properties of the core. Additionally, we explore a novel three-dimensional spiral-shaped magnetic flux concentrator. It is predicted via simulations that this geometry becomes a necessity to enhance the magnetic field for increased form factor as the magnetic field from a single planar concentrator deteriorates as its size increases