885 research outputs found
LSI/VLSI design for testability analysis and general approach
The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented
Progress in Certifying Hardware Model Checking Results
We present a formal framework to certify k-induction-based model checking results. The key idea is the notion of a k-witness circuit which simulates the given circuit and has a simple inductive invariant serving as proof certificate. Our approach allows to check proofs with an independent proof checker by reducing the certification problem to pure SAT checks and checking a simple QBF with one quantifier alternation. We also present Certifaiger, the resulting certification toolkit, and evaluate it on instances from the hardware model checking competition. Our experiments show the practical use of our certification method.Peer reviewe
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