New Techniques for On-line Testing and Fault Mitigation in GPUs

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Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%

Analysis and Optimization for Pipelined Asynchronous Systems

Most microelectronic chips used today--in systems ranging from cell phones to desktop computers to supercomputers--operate in basically the same way: they synchronize the operation of their millions of internal components using a clock that is distributed globally. This global clocking is becoming a critical design challenge in the quest for building chips that offer increasingly greater functionality, higher speed, and better energy efficiency. As an alternative, asynchronous or clockless design obviates the need for global synchronization; instead, components operate concurrently and synchronize locally only when necessary. This dissertation focuses on one class of asynchronous circuits: application specific stream processing systems (i.e. those that take in a stream of data items and produce a stream of processed results.) High-speed stream processors are a natural match for many high-end applications, including 3D graphics rendering, image and video processing, digital filters and DSPs, cryptography, and networking processors. This dissertation aims to make the design, analysis, optimization, and testing of circuits in the chosen domain both fast and efficient. Although much of the groundwork has already been laid by years of past work, my work identifies and addresses four critical missing pieces: i) fast performance analysis for estimating the throughput of a fine-grained pipelined system; ii) automated and versatile design space exploration; iii) a full suite of circuit level modules that connect together to implement a wide variety of system behaviors; and iv) testing and design for testability techniques that identify and target the types of errors found only in high-speed pipelined asynchronous systems. I demonstrate these techniques on a number of examples, ranging from simple applications that allow for easy comparison to hand-designed alternatives to more complex systems, such as a JPEG encoder. I also demonstrate these techniques through the design and test of a fully asynchronous GCD demonstration chip

Design of asynchronous microprocessor for power proportionality

PhD ThesisMicroprocessors continue to get exponentially cheaper for end users following Moore’s law, while the costs involved in their design keep growing, also at an exponential rate. The reason is the ever increasing complexity of processors, which modern EDA tools struggle to keep up with. This makes further scaling for performance subject to a high risk in the reliability of the system. To keep this risk low, yet improve the performance, CPU designers try to optimise various parts of the processor. Instruction Set Architecture (ISA) is a significant part of the whole processor design flow, whose optimal design for a particular combination of available hardware resources and software requirements is crucial for building processors with high performance and efficient energy utilisation. This is a challenging task involving a lot of heuristics and high-level design decisions. Another issue impacting CPU reliability is continuous scaling for power consumption. For the last decades CPU designers have been mainly focused on improving performance, but “keeping energy and power consumption in mind”. The consequence of this was a development of energy-efficient systems, where energy was considered as a resource whose consumption should be optimised. As CMOS technology was progressing, with feature size decreasing and power delivered to circuit components becoming less stable, the energy resource turned from an optimisation criterion into a constraint, sometimes a critical one. At this point power proportionality becomes one of the most important aspects in system design. Developing methods and techniques which will address the problem of designing a power-proportional microprocessor, capable to adapt to varying operating conditions (such as low or even unstable voltage levels) and application requirements in the runtime, is one of today’s grand challenges. In this thesis this challenge is addressed by proposing a new design flow for the development of an ISA for microprocessors, which can be altered to suit a particular hardware platform or a specific operating mode. This flow uses an expressive and powerful formalism for the specification of processor instruction sets called the Conditional Partial Order Graph (CPOG). The CPOG model captures large sets of behavioural scenarios for a microarchitectural level in a computationally efficient form amenable to formal transformations for synthesis, verification and automated derivation of asynchronous hardware for the CPU microcontrol. The feasibility of the methodology, novel design flow and a number of optimisation techniques was proven in a full size asynchronous Intel 8051 microprocessor and its demonstrator silicon. The chip showed the ability to work in a wide range of operating voltage and environmental conditions. Depending on application requirements and power budget our ASIC supports several operating modes: one optimised for energy consumption and the other one for performance. This was achieved by extending a traditional datapath structure with an auxiliary control layer for adaptable and fault tolerant operation. These and other optimisations resulted in a reconfigurable and adaptable implementation, which was proven by measurements, analysis and evaluation of the chip.EPSR