Modeling and Mitigation of Soft Errors in Nanoscale SRAMs

Energetic particle (alpha particle, cosmic neutron, etc.) induced single event data upset or soft error has emerged as a key reliability concern in SRAMs in sub-100 nanometre technologies. Low operating voltage, small node capacitance, high packing density, and lack of error masking mechanisms are primarily responsible for the soft error susceptibility of SRAMs. In addition, since SRAM occupies the majority of die area in system-on-chips (SoCs) and microprocessors, different leakage reduction techniques, such as, supply voltage reduction, gated grounding, etc., are applied to SRAMs in order to limit the overall chip leakage. These leakage reduction techniques exponentially increase the soft error rate in SRAMs. The soft error rate is further accentuated by process variations, which are prominent in scaled-down technologies. In this research, we address these concerns and propose techniques to characterize and mitigate soft errors in nanoscale SRAMs. We develop a comprehensive analytical model of the critical charge, which is a key to assessing the soft error susceptibility of SRAMs. The model is based on the dynamic behaviour of the cell and a simple decoupling technique for the non-linearly coupled storage nodes. The model describes the critical charge in terms of NMOS and PMOS transistor parameters, cell supply voltage, and noise current parameters. Consequently, it enables characterizing the spread of critical charge due to process induced variations in these parameters and to manufacturing defects, such as, resistive contacts or vias. In addition, the model can estimate the improvement in critical charge when MIM capacitors are added to the cell in order to improve the soft error robustness. The model is validated by SPICE simulations (90nm CMOS) and radiation test. The critical charge calculated by the model is in good agreement with SPICE simulations with a maximum discrepancy of less than 5%. The soft error rate estimated by the model for low voltage (sub 0.8 V) operations is within 10% of the soft error rate measured in the radiation test. Therefore, the model can serve as a reliable alternative to time consuming SPICE simulations for optimizing the critical charge and hence the soft error rate at the design stage. In order to limit the soft error rate further, we propose an area-efficient multiword based error correction code (MECC) scheme. The MECC scheme combines four 32 bit data words to form a composite 128 bit ECC word and uses an optimized 4-input transmission-gate XOR logic. Thus MECC significantly reduces the area overhead for check-bit storage and the delay penalty for error correction. In addition, MECC interleaves two composite words in a row for limiting cosmic neutron induced multi-bit errors. The ground potentials of the composite words are controlled to minimize leakage power without compromising the read data stability. However, use of composite words involves a unique write operation where one data word is written while other three data words are read to update the check-bits. A power efficient word line signaling technique is developed to facilitate the write operation. A 64 kb SRAM macro with MECC is designed and fabricated in a commercial 90nm CMOS technology. Measurement results show that the SRAM consumes 534 μW at 100 MHz with a data latency of 3.3 ns for a single bit error correction. This translates into 82% per-bit energy saving and 8x speed improvement over recently reported multiword ECC schemes. Accelerated neutron radiation test carried out at TRIUMF in Vancouver confirms that the proposed MECC scheme can correct up to 85% of soft errors

Designing Method of Compact n-to-2n Decoders

What decoder is, everyone knows. The paper presents fast and efficient method of layouts design of n-to- 2n-lines decoders. Two scenarios of layout arrangement are proposed and described. Based on a few building blocks only, especially prepared, and appropriate procedure of their placement, a decoder of any size can be build. Layouts of all needed fundamental blocks were designed in CMOS technology, as standard library. Moreover, some important parameters, such area, power dissipation and delay, were assessed and compared for decoders designed with proposed method and traditional. Power consumption were considered under extended model, which takes into account changes of input vectors, not only switching activity factor. All designs were done in UMC 180 CMOS technology

Robust low-power digital circuit design in nano-CMOS technologies

Device scaling has resulted in large scale integrated, high performance, low-power, and low cost systems. However the move towards sub-100 nm technology nodes has increased variability in device characteristics due to large process variations. Variability has severe implications on digital circuit design by causing timing uncertainties in combinational circuits, degrading yield and reliability of memory elements, and increasing power density due to slow scaling of supply voltage. Conventional design methods add large pessimistic safety margins to mitigate increased variability, however, they incur large power and performance loss as the combination of worst cases occurs very rarely. In-situ monitoring of timing failures provides an opportunity to dynamically tune safety margins in proportion to on-chip variability that can significantly minimize power and performance losses. We demonstrated by simulations two delay sensor designs to detect timing failures in advance that can be coupled with different compensation techniques such as voltage scaling, body biasing, or frequency scaling to avoid actual timing failures. Our simulation results using 45 nm and 32 nm technology BSIM4 models indicate significant reduction in total power consumption under temperature and statistical variations. Future work involves using dual sensing to avoid useless voltage scaling that incurs a speed loss. SRAM cache is the first victim of increased process variations that requires handcrafted design to meet area, power, and performance requirements. We have proposed novel 6 transistors (6T), 7 transistors (7T), and 8 transistors (8T)-SRAM cells that enable variability tolerant and low-power SRAM cache designs. Increased sense-amplifier offset voltage due to device mismatch arising from high variability increases delay and power consumption of SRAM design. We have proposed two novel design techniques to reduce offset voltage dependent delays providing a high speed low-power SRAM design. Increasing leakage currents in nano-CMOS technologies pose a major challenge to a low-power reliable design. We have investigated novel segmented supply voltage architecture to reduce leakage power of the SRAM caches since they occupy bulk of the total chip area and power. Future work involves developing leakage reduction methods for the combination logic designs including SRAM peripherals

Architecture and Analysis for Next Generation Mobile Signal Processing.

Mobile devices have proliferated at a spectacular rate, with more than 3.3 billion active cell phones in the world. With sales totaling hundreds of billions every year, the mobile phone has arguably become the dominant computing platform, replacing the personal computer. Soon, improvements to today’s smart phones, such as high-bandwidth internet access, high-definition video processing, and human-centric interfaces that integrate voice recognition and video-conferencing will be commonplace. Cost effective and power efficient support for these applications will be required. Looking forward to the next generation of mobile computing, computation requirements will increase by one to three orders of magnitude due to higher data rates, increased complexity algorithms, and greater computation diversity but the power requirements will be just as stringent to ensure reasonable battery lifetimes. The design of the next generation of mobile platforms must address three critical challenges: efficiency, programmability, and adaptivity. The computational efficiency of existing solutions is inadequate and straightforward scaling by increasing the number of cores or the amount of data-level parallelism will not suffice. Programmability provides the opportunity for a single platform to support multiple applications and even multiple standards within each application domain. Programmability also provides: faster time to market as hardware and software development can proceed in parallel; the ability to fix bugs and add features after manufacturing; and, higher chip volumes as a single platform can support a family of mobile devices. Lastly, hardware adaptivity is necessary to maintain efficiency as the computational characteristics of the applications change. Current solutions are tailored specifically for wireless signal processing algorithms, but lose their efficiency when other application domains like high definition video are processed. This thesis addresses these challenges by presenting analysis of next generation mobile signal processing applications and proposing an advanced signal processing architecture to deal with the stringent requirements. An application-centric design approach is taken to design our architecture. First, a next generation wireless protocol and high definition video is analyzed and algorithmic characterizations discussed. From these characterizations, key architectural implications are presented, which form the basis for the advanced signal processor architecture, AnySP.Ph.D.Electrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/86344/1/mwoh_1.pd