Novel Design for Dual Edge Triggered Flip-Flop for High Speed Low Power Application

In area of low power VLSI, switching activity of circuit node is of great concerned to reduce dynamic power. Dynamic power is directly proportional to switching activity of nodes. Switching activity vary according to input data pattern thereby for different input data sequence different power dissipation can occur. To achieve same data throughput as in single edged triggered flip-flop (SETFF), dual edged triggered flip-flop (DETFF) is an effective way to decrease power dissipation. DETFF reduces switching activity for same data throughput. In this paper, two different design of DETFF are investigated. The technique used to design DETFF is to generate pulse at every edge of clock to trigger data and/or latch stage of circuit. A conventional and a proposed design of DETFF are surveyed. Proposed DETFF utilized different scheme to generate pulse at every edge of clock. In view of power dissipation there is no considerable improvement but delay has been greatly reduced thereby overall PDP with respect to conventional DETF

An Overlap-Contention Free True-Single-Phase Clock Dual-Edge-Triggered Flip-Flop

Dual-edge-triggered (DET) synchronous operation is a very attractive option for low-power, high-performance designs. Compared to conventional single-edge synchronous systems, DET operation is capable of providing the same throughput at half the clock frequency. This can lead to significant power savings on the clock network that is often one of the major contributors to total system power. However, in order to implement DET operation, special registers need to be introduced that sample data on both clock-edges. These registers are more complex than their single-edge counterparts, and often suffer from a certain amount of clock-overlap between the main clock and the internally generated inverted clock. This overlap can cause contention inside the cell and lead to logic failures, especially when operating at scaled power supplies and under process variations that characterize nanometer technologies. This paper presents a novel, static DET flip-flop (DET-FF) with a true-single-phase clock that completely avoids clock overlap hazards by eliminating the need for an inverted clock edge for functionality. The proposed DET FF was implemented in a standard 40nm CMOS technology, showing full functionality at low-voltage operating points, where conventional DET-FFs fail. Under a near-threshold, 500mV supply voltage, the proposed cell also provides a 35% lower CK-to-Q delay and the lowest power-delay-product compared to all considered DET-FF implementations. © 2015 IEEE

Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft-Error Mitigation

abstract: An integrated methodology combining redundant clock tree synthesis and pulse clocked latches mitigates both single event upsets (SEU) and single event transients (SET) with reduced power consumption. This methodology helps to change the hardness of the design on the fly. This approach, with minimal additional overhead circuitry, has the ability to work in three different modes of operation depending on the speed, hardness and power consumption required by design. This was designed on 90nm low-standby power (LSP) process and utilized commercial CAD tools for testing. Spatial separation of critical nodes in the physical design of this approach mitigates multi-node charge collection (MNCC) upsets. An advanced encryption system implemented with the proposed design, compared to a previous design with non-redundant clock trees and local delay generation. The proposed approach reduces energy per operation up to 18% over an improved version of the prior approach, with negligible area impact. It can save up to 2/3rd of the power consumption and reach maximum possible frequency, when used in non-redundant mode of operation.Dissertation/ThesisMasters Thesis Electrical Engineering 201

Low power VLSI design of a fir filter using dual edge triggered clocking strategy

Digital signal processing is an area of science and engineering that has developed rapidly over the past 30 years. This rapid development is a result of the significant advances in digital computer technology and integrated–circuit fabrication. DSP processors are a diverse group, most share some common features designed to support fast execution of the repetitive, numerically intensive computations characteristic of digital signal processing algorithms. The most often cited of these features is the ability to perform a multiply-accumulate operation (often called a "MAC") in a single instruction cycle. Hence in this project a DSP Processor is designed which can perform the basic DSP Operations like convolution, fourier transform and filtering. The processor designed is a simple 4-bit processor which has single data line of 8-bits and a single address bus of 16-bits. With a set of branch instructions the project DSP will operate as a CISC processor with strong math capabilities and can perform the above mentioned DSP operations. The application I have taken is the low power FIR filter using dual edge clocking strategy. It combines two novel techniques for the power reduction which is : multi stage clock gating and a symmetric two-phase level-sensitive clocking with glitch aware re-distribution of data-path registers. Simulation results confirm a 42% reduction in power over single edge triggered clocking with clock gating.Also to further reduce the power consumption the a low power latch circuit is used. Thanks to a partial pass-transistor logic, it trades time for energy, being particularly suitable for low power low-frequency applications. Simulation results confirm the power reduction. This technique discussed can be implemented to portable devices which needs longer battery life and to ASIC’

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Design and analysis of efficient QCA reversible adders

Quantum-dot cellular automata (QCA) as an emerging nanotechnology are envisioned to overcome the scaling and the heat dissipation issues of the current CMOS technology. In a QCA structure, information destruction plays an essential role in the overall heat dissipation, and in turn in the power consumption of the system. Therefore, reversible logic, which significantly controls the information flow of the system, is deemed suitable to achieve ultra-low-power structures. In order to benefit from the opportunities QCA and reversible logic provide, in this paper, we first review and implement prior reversible full-adder art in QCA. We then propose a novel reversible design based on three- and five-input majority gates, and a robust one-layer crossover scheme. The new full-adder significantly advances previous designs in terms of the optimization metrics, namely cell count, area, and delay. The proposed efficient full-adder is then used to design reversible ripple-carry adders (RCAs) with different sizes (i.e., 4, 8, and 16 bits). It is demonstrated that the new RCAs lead to 33% less garbage outputs, which can be essential in terms of lowering power consumption. This along with the achieved improvements in area, complexity, and delay introduces an ultra-efficient reversible QCA adder that can be beneficial in developing future computer arithmetic circuits and architecture

Online self-test wrapper for runtime-reconfigurable systems

Reconfigurable Systems-on-a-Chip (SoC) architectures consist of microprocessors and Field Programmable Gate Arrays (FPGAs). In order to implement runtime reconfigurable systems, these SoC devices combine the ease of programmability and the flexibility that FPGAs provide. One representative of these is the new Xilinx Zynq-7000 Extensible Processing Platform (EPP), which integrates a dual-core ARM Cortex-A9 based Processing System (PS) and Programmable Logic (PL) in a single device. After power on, the PS is booted and the PL can subsequently be configured and reconfigured by the PS. Recent FPGA technologies incorporate the dynamic Partial Reconfiguration (PR) feature. PR allows new functionality to be programmed online into specific regions of the FPGA while the performance and functionality of the remaining logic is preserved. This on-the-fly reconfiguration characteristic enables designers to time-multiplex portions of hardware dynamically, load functions into the FPGA on an as-needed basis. The configuration access port on the FPGA can be used to load the configuration data from memory to the reconfigurable block, which enables the user to reconfigure the FPGA online and test runtime systems. Manufactured in the advanced 28 nm technologies, the modern generations of FPGAs are increasingly prone to latent defects and aging-related failure mechanisms. To detect faults contained in the reconfigurable gate arrays, dedicated on and off-line test methods can be employed to test the device in the field. Adaptive systems require that the fault is detected and localized, so that the faulty logic unit will not be used in future reconfiguration steps. This thesis presents the development and evaluation of a self-test wrapper for the reconfigurable parts in such hybrid SoCs. It comprises the implementation of Test Configurations (TCs) of reconfigurable components as well as the generation and application of appropriate test stimuli and response analysis. The self-test wrapper is successfully implemented and is fully compatible with the AMBA protocols. The TC implementation is based on an existing Java framework for Xilinx Virtex-5 FPGA, and extended to the Zynq-7000 EPP family. These TCs are successfully redesigned to have a full logic coverage of FPGA structures. Furthermore, the array-based testing method is adopted and the tests can be applied to any part of the reconfigurable fabric. A complete software project has been developed and built to allow the reconfiguration process to be triggered by the ARM microprocessor. Functional test of the reconfigurable architecture, online self-test execution and retrieval of results are under the control of the embedded processor. Implementation results and analysis demonstrate that TCs are successfully synthesized and can be dynamically reconfigured into the area under test, and subsequent tests can be performed accordingly

Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures

abstract: Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used for error detection and correction respectively in such architectures. Multiple node charge collection (MNCC) causes domain crossing errors (DCE) which can render the redundancy ineffectual. This dissertation describes techniques to ensure DCE mitigation with statistical confidence for various designs. Both sequential and combinatorial logic are separated using these custom and computer aided design (CAD) methodologies. Radiation vulnerability and design overhead are studied on VLSI sub-systems including an advanced encryption standard (AES) which is DCE mitigated using module level coarse separation on a 90-nm process with 99.999% DCE mitigation. A radiation hardened microprocessor (HERMES2) is implemented in both 90-nm and 55-nm technologies with an interleaved separation methodology with 99.99% DCE mitigation while achieving 4.9% increased cell density, 28.5 % reduced routing and 5.6% reduced power dissipation over the module fences implementation. A DMR register-file (RF) is implemented in 55 nm process and used in the HERMES2 microprocessor. The RF array custom design and the decoders APR designed are explored with a focus on design cycle time. Quality of results (QOR) is studied from power, performance, area and reliability (PPAR) perspective to ascertain the improvement over other design techniques. A radiation hardened all-digital multiplying pulsed digital delay line (DDL) is designed for double data rate (DDR2/3) applications for data eye centering during high speed off-chip data transfer. The effect of noise, radiation particle strikes and statistical variation on the designed DDL are studied in detail. The design achieves the best in class 22.4 ps peak-to-peak jitter, 100-850 MHz range at 14 pJ/cycle energy consumption. Vulnerability of the non-hardened design is characterized and portions of the redundant DDL are separated in custom and auto-place and route (APR). Thus, a range of designs for mission critical applications are implemented using methodologies proposed in this work and their potential PPAR benefits explored in detail.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

Fault-Tolerant Computing: An Overview

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryNASA / NAG-1-613Semiconductor Research Corporation / 90-DP-109Joint Services Electronics Program / N00014-90-J-127