Synthesis of On-Chip Interconnection Structures:From Point-to-Point Links to Networks-on-Chip

Packet-switched networks-on-chip (NOC) have been advocated as the solution to the challenge of organizing efficient and reliable communication structures among the components of a system-on-chip (SOC). A critical issue in designing a NOC is to determine its topology given the set of point-to-point communication requirements among these components. We present a novel approach to on-chip communication synthesis that is based on the iterative combination of two efficient computational steps: (1) an application of the k-Median algorithm to coarsely determine the global communication structure (which may turned out not be a network after all), and a (2) a variation of the shortest-path algorithm in order to finely tune the data flows on the communication channels. The application of our method to case studies taken from the literature shows that we can automatically synthesize optimal NOC topologies for multi-core on-chip processors and it offers new insights on why NOC are not necessarily a value proposition for some classes of applcation-specific SOCs

Comparative Study of Various Systems on Chips Embedded in Mobile Devices

Systems-on-chips (SoCs) are the latest incarnation of very large scale integration (VLSI) technology. A single integrated circuit can contain over 100 million transistors. Harnessing all this computing power requires designers to move beyond logic design into computer architecture, meet real-time deadlines, ensure low-power operation, and so on. These opportunities and challenges make SoC design an important field of research. So in the paper we will try to focus on the various aspects of SOC and the applications offered by it. Also the different parameters to be checked for functional verification like integration and complexity are described in brief. We will focus mainly on the applications of system on chip in mobile devices and then we will compare various mobile vendors in terms of different parameters like cost, memory, features, weight, and battery life, audio and video applications. A brief discussion on the upcoming technologies in SoC used in smart phones as announced by Intel, Microsoft, Texas etc. is also taken up. Keywords: System on Chip, Core Frame Architecture, Arm Processors, Smartphone

The impact of transistor aging on the reliability of level shifters in nano-scale CMOS technology

On-chip level shifters are the interface between parts of an Integrated Circuit (IC) that operate in different voltage levels. For this reason, they are indispensable blocks in Multi-Vdd System-on-Chips (SoCs). In this paper, we present a comprehensive analysis of the effects of Bias Temperature Instability (BTI) aging on the delay and the power consumption of level shifters. We evaluate the standard High-to-Low/Low-to-High level shifters, as well as several recently proposed level-shifter designs, implemented using a 32 nm CMOS technology. Through SPICE simulations, we demonstrate that the delay degradation due to BTI aging varies for each level shifter design: it is 83.3% on average and it exceeds 200% after 5 years of operation for the standard Low-to-High and the NDLSs level shifters, which is 10 × higher than the BTI-induced delay degradation of standard CMOS logic cells. Similarly, we show that the examined designs can suffer from an average 38.2% additional power consumption after 5 years of operation that, however, reaches 180% for the standard level-shifter and exceeds 163% for the NDLSs design. The high susceptibility of these designs to BTI is attributed to their differential signaling structure, combined with the very low supply voltage. Moreover, we show that recently proposed level-up shifter design employing a voltage step-down technique are

On-Line Dependability Enhancement of Multiprocessor SoCs by Resource Management

This paper describes a new approach towards dependable design of homogeneous multi-processor SoCs in an example satellite-navigation application. First, the NoC dependability is functionally verified via embedded software. Then the Xentium processor tiles are periodically verified via on-line self-testing techniques, by using a new IIP Dependability Manager. Based on the Dependability Manager results, faulty tiles are electronically excluded and replaced by fault-free spare tiles via on-line resource management. This integrated approach enables fast electronic fault detection/diagnosis and repair, and hence a high system availability. The dependability application runs in parallel with the actual application, resulting in a very dependable system. All parts have been verified by simulation

Modeling reconfigurable Systems-on-Chips with UML MARTE profile: an exploratory analysis

International audienceReconfigurable FPGA based Systems-on-Chip (SoC) architectures are increasingly becoming the preferred solution for implementing modern embedded systems, due to their flexible nature. However due to the tremendous amount of hardware resources available in these systems, new design methodologies and tools are required to reduce their design complexity. In this paper we present an exploratory analysis for specification of these systems, while utilizing the UML MARTE (Modeling and Analysis of Real-time and Embedded Systems) profile. Our contributions permit us to model fine grain reconfigurable FPGA based SoC architectures while extending the profile to integrate new features such as Partial Dynamic Reconfiguration supported by these modern systems. Finally we present the current limitations of the MARTE profile and ask some open questions regarding how these high level models can be effectively used as input for commercial FPGA simulation and synthesis tools. Solutions to these questions can help in creating a design flow from high level models to synthesis, placement and execution of these reconfigurable SoCs

Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure

In this paper, we present a novel coarse-grained technique for monitoring online the bias temperature instability (BTI) aging of circuits by exploiting their power gating infrastructure. The proposed technique relies on monitoring the discharge time of the virtual-power-network during standby operations, the value of which depends on the threshold voltage of the CMOS devices in a power-gated design (PGD). It does not require any distributed sensors, because the virtual-power-network is already distributed in a PGD. It consists of a hardware block for measuring the discharge time concurrently with normal standby operations and a processing block for estimating the BTI aging status of the PGD according to collected measurements. Through SPICE simulation, we demonstrate that the BTI aging estimation error of the proposed technique is less than 1% and 6.2% for PGDs with static operating frequency and dynamic voltage and frequency scaling, respectively. Its area cost is also found negligible. The power gating minimum idle time (MIT) cost induced by the energy consumed for monitoring the discharge time is evaluated on two scalar machine models using either x86 or ARM instruction sets. It is found less than 1.3× and 1.45× the original power gating MIT, respectively. We validate the proposed technique through accelerated aging experiments conducted with five actual chips that contain an ARM cortex M0 processor, manufactured with a 65 nm CMOS technology

Ultra-Low-Power Embedded SRAM Design for Battery- Operated and Energy-Harvested IoT Applications

Internet of Things (IoT) devices such as wearable health monitors, augmented reality goggles, home automation, smart appliances, etc. are a trending topic of research. Various IoT products are thriving in the current electronics market. The IoT application needs such as portability, form factor, weight, etc. dictate the features of such devices. Small, portable, and lightweight IoT devices limit the usage of the primary energy source to a smaller rechargeable or non-rechargeable battery. As battery life and replacement time are critical issues in battery-operated or partially energy-harvested IoT devices, ultra-low-power (ULP) system on chips (SoC) are becoming a widespread solution of chip makers’ choice. Such ULP SoC requires both logic and the embedded static random access memory (SRAM) in the processor to operate at very low supply voltages. With technology scaling for bulk and FinFET devices, logic has demonstrated to operate at low minimum operating voltages (VMIN). However, due to process and temperature variation, SRAMs have higher VMIN in scaled processes that become a huge problem in designing ULP SoC cores. This chapter discusses the latest published circuits and architecture techniques to minimize the SRAM VMIN for scaled bulk and FinFET technologies and improve battery life for ULP IoT applications