Circuit designs for low-power and SEU-hardened systems

The desire to have smaller and faster portable devices is one of the primary motivations for technology scaling. Though advancements in device physics are moving at a very good pace, they might not be aggressive enough for now-a-day technology scaling trends. As a result, the MOS devices used for present day integrated circuits are pushed to the limit in terms of performance, power consumption and robustness, which are the most critical criteria for almost all applications. Secondly, technology advancements have led to design of complex chips with increasing chip densities and higher operating speeds. The design of such high performance complex chips (microprocessors, digital signal processors, etc) has massively increased the power dissipation and, as a result, the operating temperatures of these integrated circuits. In addition, due to the aggressive technology scaling the heat withstanding capabilities of the circuits is reducing, thereby increasing the cost of packaging and heat sink units. This led to the increase in prominence for smarter and more robust low-power circuit and system designs. Apart from power consumption, another criterion affected by technology scaling is robustness of the design, particularly for critical applications (security, medical, finance, etc). Thus, the need for error free or error immune designs. Until recently, radiation effects were a major concern in space applications only. With technology scaling reaching nanometer level, terrestrial radiation has become a growing concern. As a result Single Event Upsets (SEUs) have become a major challenge to robust designs. Single event upset is a temporary change in the state of a device due to a particle strike (usually from the radiation belts or from cosmic rays) which may manifest as an error at the output. This thesis proposes a novel method for adaptive digital designs to efficiently work with the lowest possible power consumption. This new technique improves options in performance, robustness and power. The thesis also proposes a new dual data rate flipflop, which reduces the necessary clock speed by half, drastically reducing the power consumption. This new dual data rate flip-flop design culminates in a proposed unique radiation hardened dual data rate flip-flop, Firebird\u27. Firebird offers a valuable addition to the future circuit designs, especially with the increasing importance of the Single Event Upsets (SEUs) and power dissipation with technology scaling.\u2

Efficacy of Multi-Threshold NULL Convention Logic in Low-Power Applications

In order for an asynchronous design paradigm such as Multi-Threshold NULL Convention Logic (MTNCL) to be adopted by industry, it is important for circuit designers to be aware of its advantages and drawbacks especially with respect to power usage. The power tradeoff between MTNCL and synchronous designs depends on many different factors including design type, circuit size, process node, and pipeline granularity. Each of these design dimensions influences the active power and the leakage power comparisons. This dissertation analyzes the effects of different design dimensions on power consumption and the associated rational for these effects. Results show that while MTNCL typically uses more active power and less leakage power than an equivalent synchronous design, the magnitude of this difference can vary greatly and trends can be observed across each of these different design dimensions. Using the results and analysis found in this work, circuit designers will be able to choose between MTNCL and synchronous architectures for a given target application based on anticipated power consumption differences

Nanometer VLSI placement and optimization for multi-objective design closure

In a VLSI physical synthesis flow, placement directly defines the interconnection, which affects many other design objectives, such as timing, power consumption, congestion, and thermal issues. With the scaling of technology, the relative interconnect delay increases dramatically. As a result, placement has become a bottleneck in deep sub-micron physical synthesis. In this dissertation, I propose several optimization algorithms from global placement, placement migration, timing driven placements, to incremental power optimizations for multi-objective VLSI design closure. The first work is DPlace, a new global placement algorithm that scales well to the modern large-scale circuit placement problems. DPlace simulates the natural diffusion process to spread cells smoothly over the placement region, and uses both analytical and discrete techniques to improve the wire length. However, global placement is never sufficient for multi-objective design closure, a variety of design objectives have to be improved incrementally, such as timing, routing congestion, signal integrity, and heat distribution. Placement migration is a critical step to address the cell overlaps appearing during incremental optimizations. To achieve high placement stability, I propose a computational geometry based placement migration flow to cope with placement changes, and a new stability metric to measure the “similarity” between two placements accurately. Our placement migration algorithm has clear advantage over conventional legalization algorithms such that the neighborhood characteristics of the original placement are preserved. For timing closure in high performance designs, I present a linear programming based incremental timing driven placement to improve the timing on critical paths directly. I further present an efficient timing driven placement algorithm (Pyramids). Two formulations of Pyramids are proposed, which are suitable for different optimization stages in a physical synthesis flow. Both approaches find the optimal location for timing of a cell in constant time, through computational geometry based approaches. For fast convergence of design closure, placement should be integrated with other optimization techniques. I propose to combine placement, gate sizing and Vt swapping techniques to reduce the total power consumption, especially the leakage power, which is becoming increasingly critical for nanometer VLSI design closure.Electrical and Computer Engineerin

CAD Tool Design for NCL and MTNCL Asynchronous Circuits

This thesis presents an implementation of a method developed to readily convert Boolean designs into an ultra-low power asynchronous design methodology called MTNCL, which combines multi-threshold CMOS (MTCMOS) with NULL Convention Logic (NCL) systems. MTNCL provides the leakage power advantages of an all high-Vt implementation with a reasonable speed penalty compared to the all low-Vt implementation, and has negligible area overhead. The proposed tool utilizes industry-standard CAD tools. This research also presents an Automated Gate-Level Pipelining with Bit-Wise Completion (AGLPBW) method to maximize throughput of delay-insensitive full-word pipelined NCL circuits. These methods have been integrated into the Mentor Graphics and Synopsis CAD tools, using a C-program, which performs the majority of the computations, such that the method can be easily ported to other CAD tool suites. Both methods have been successfully tested on circuits, including a 4-bit × 4-bit multiplier, an unsigned Booth2 multiplier, and a 4-bit/8-operation arithmetic logic unit (ALU

Architectural level delay and leakage power modelling of manufacturing process variation

PhD ThesisThe effect of manufacturing process variations has become a major issue regarding the estimation of circuit delay and power dissipation, and will gain more importance in the future as device scaling continues in order to satisfy market place demands for circuits with greater performance and functionality per unit area. Statistical modelling and analysis approaches have been widely used to reflect the effects of a variety of variational process parameters on system performance factor which will be described as probability density functions (PDFs). At present most of the investigations into statistical models has been limited to small circuits such as a logic gate. However, the massive size of present day electronic systems precludes the use of design techniques which consider a system to comprise these basic gates, as this level of design is very inefficient and error prone. This thesis proposes a methodology to bring the effects of process variation from transistor level up to architectural level in terms of circuit delay and leakage power dissipation. Using a first order canonical model and statistical analysis approach, a statistical cell library has been built which comprises not only the basic gate cell models, but also more complex functional blocks such as registers, FIFOs, counters, ALUs etc. Furthermore, other sensitive factors to the overall system performance, such as input signal slope, output load capacitance, different signal switching cases and transition types are also taken into account for each cell in the library, which makes it adaptive to an incremental circuit design. The proposed methodology enables an efficient analysis of process variation effects on system performance with significantly reduced computation time compared to the Monte Carlo simulation approach. As a demonstration vehicle for this technique, the delay and leakage power distributions of a 2-stage asynchronous micropipeline circuit has been simulated using this cell library. The experimental results show that the proposed method can predict the delay and leakage power distribution with less than 5% error and at least 50,000 times faster computation time compare to 5000-sample SPICE based Monte Carlo simulation. The methodology presented here for modelling process variability plays a significant role in Design for Manufacturability (DFM) by quantifying the direct impact of process variations on system performance. The advantages of being able to undertake this analysis at a high level of abstraction and thus early in the design cycle are two fold. First, if the predicted effects of process variation render the circuit performance to be outwith specification, design modifications can be readily incorporated to rectify the situation. Second, knowing what the acceptable limits of process variation are to maintain design performance within its specification, informed choices can be made regarding the implementation technology and manufacturer selected to fabricate the design

A micropower centroiding vision processor

Published versio

Analysis and Mitigation of Remote Side-Channel and Fault Attacks on the Electrical Level

In der fortlaufenden Miniaturisierung von integrierten Schaltungen werden physikalische Grenzen erreicht, wobei beispielsweise Einzelatomtransistoren eine mögliche untere Grenze für Strukturgrößen darstellen. Zudem ist die Herstellung der neuesten Generationen von Mikrochips heutzutage finanziell nur noch von großen, multinationalen Unternehmen zu stemmen. Aufgrund dieser Entwicklung ist Miniaturisierung nicht länger die treibende Kraft um die Leistung von elektronischen Komponenten weiter zu erhöhen. Stattdessen werden klassische Computerarchitekturen mit generischen Prozessoren weiterentwickelt zu heterogenen Systemen mit hoher Parallelität und speziellen Beschleunigern. Allerdings wird in diesen heterogenen Systemen auch der Schutz von privaten Daten gegen Angreifer zunehmend schwieriger. Neue Arten von Hardware-Komponenten, neue Arten von Anwendungen und eine allgemein erhöhte Komplexität sind einige der Faktoren, die die Sicherheit in solchen Systemen zur Herausforderung machen. Kryptografische Algorithmen sind oftmals nur unter bestimmten Annahmen über den Angreifer wirklich sicher. Es wird zum Beispiel oft angenommen, dass der Angreifer nur auf Eingaben und Ausgaben eines Moduls zugreifen kann, während interne Signale und Zwischenwerte verborgen sind. In echten Implementierungen zeigen jedoch Angriffe über Seitenkanäle und Faults die Grenzen dieses sogenannten Black-Box-Modells auf. Während bei Seitenkanalangriffen der Angreifer datenabhängige Messgrößen wie Stromverbrauch oder elektromagnetische Strahlung ausnutzt, wird bei Fault Angriffen aktiv in die Berechnungen eingegriffen, und die falschen Ausgabewerte zum Finden der geheimen Daten verwendet. Diese Art von Angriffen auf Implementierungen wurde ursprünglich nur im Kontext eines lokalen Angreifers mit Zugriff auf das Zielgerät behandelt. Jedoch haben bereits Angriffe, die auf der Messung der Zeit für bestimmte Speicherzugriffe basieren, gezeigt, dass die Bedrohung auch durch Angreifer mit Fernzugriff besteht. In dieser Arbeit wird die Bedrohung durch Seitenkanal- und Fault-Angriffe über Fernzugriff behandelt, welche eng mit der Entwicklung zu mehr heterogenen Systemen verknüpft sind. Ein Beispiel für neuartige Hardware im heterogenen Rechnen sind Field-Programmable Gate Arrays (FPGAs), mit welchen sich fast beliebige Schaltungen in programmierbarer Logik realisieren lassen. Diese Logik-Chips werden bereits jetzt als Beschleuniger sowohl in der Cloud als auch in Endgeräten eingesetzt. Allerdings wurde gezeigt, wie die Flexibilität dieser Beschleuniger zur Implementierung von Sensoren zur Abschätzung der Versorgungsspannung ausgenutzt werden kann. Zudem können durch eine spezielle Art der Aktivierung von großen Mengen an Logik Berechnungen in anderen Schaltungen für Fault Angriffe gestört werden. Diese Bedrohung wird hier beispielsweise durch die Erweiterung bestehender Angriffe weiter analysiert und es werden Strategien zur Absicherung dagegen entwickelt