52,166 research outputs found
Developing the knowledge-based human resources that support the implementation of the National Dual Training System (NDTS): evaluation of TVET teacher's competency at MARA Training Institutions
Development in the world of technical and vocational education and training (TVET)
on an ongoing basis is a challenge to the profession of the TVET-teachers to
maintain their performance. The ability of teachers to identify the competencies
required by their profession is very critical to enable them to make improvements in
teaching and learning. For a broader perspective the competency needs of the labour
market have to be matched by those developed within the vocational learning
processes. Consequently, this study has focused on developing and validating the
new empirical based TVET-teacher competency profile and evaluating teacher’s
competency. This study combines both quantitative and qualitative research
methodology that was designed to answer all the research questions. The new
empirical based competency profile development and TVET-teacher evaluation was
based upon an instructional design model. In addition, a modified Delphi technique
has also been adopted throughout the process. Initially, 98 elements of competencies
were listed by expert panel and rated by TVET institutions as important. Then,
analysis using manual and statistical procedure found that 112 elements of
competencies have emerged from seventeen (17) clusters of competencies. Prior to
that, using the preliminary TVET-teacher competency profile, the level of TVETteacher
competencies was found to be Proficient and the finding of 112 elements of
competencies with 17 clusters was finally used to develop the new empirical based
competency profile for MARA TVET-teacher. Mean score analysis of teacher
competencies found that there were gaps in teacher competencies between MARA
institutions (IKM) and other TVET institutions, where MARA-teacher was
significantly better than other TVET teacher. ANOVA and t-test analysis showed
that there were significant differences between teacher competencies among all
TVET institutions in Malaysia. On the other hand, the study showed that teacher’s
age, grade and year of experience are not significant predictors for TVET-teacher
competency. In the context of mastering the competency, the study also found that
three competencies are classified as most difficult or challenging, twelve
competencies are classified as should be improved, and eight competencies are
classified as needed to be trained. Lastly, to make NDTS implementation a reality
for MARA the new empirical based competency profile and the framework for
career development and training pathway were established. This Framework would
serve as a significant tool to develop the knowledge based human resources needed.
This will ensure that TVET-teachers at MARA are trained to be knowledgeable,
competent, and professional and become a pedagogical leader on an ongoing basis
towards a world class TVET-education system
Study to develop process controls for line certification on hybrid microcircuits Final report, Nov. 1970 - Feb. 1971
Basic process steps for fabrication of thick or thin film microcircuits for NASA us
The Conference on High Temperature Electronics
The status of and directions for high temperature electronics research and development were evaluated. Major objectives were to (1) identify common user needs; (2) put into perspective the directions for future work; and (3) address the problem of bringing to practical fruition the results of these efforts. More than half of the presentations dealt with materials and devices, rather than circuits and systems. Conference session titles and an example of a paper presented in each session are (1) User requirements: High temperature electronics applications in space explorations; (2) Devices: Passive components for high temperature operation; (3) Circuits and systems: Process characteristics and design methods for a 300 degree QUAD or AMP; and (4) Packaging: Presently available energy supply for high temperature environment
The STAR MAPS-based PiXeL detector
The PiXeL detector (PXL) for the Heavy Flavor Tracker (HFT) of the STAR
experiment at RHIC is the first application of the state-of-the-art thin
Monolithic Active Pixel Sensors (MAPS) technology in a collider environment.
Custom built pixel sensors, their readout electronics and the detector
mechanical structure are described in detail. Selected detector design aspects
and production steps are presented. The detector operations during the three
years of data taking (2014-2016) and the overall performance exceeding the
design specifications are discussed in the conclusive sections of this paper
Advances on CMOS image sensors
This paper offers an introduction to the technological advances of image sensors designed using
complementary metal–oxide–semiconductor (CMOS) processes along the last decades. We review
some of those technological advances and examine potential disruptive growth directions for CMOS
image sensors and proposed ways to achieve them. Those advances include breakthroughs on
image quality such as resolution, capture speed, light sensitivity and color detection and advances on
the computational imaging. The current trend is to push the innovation efforts even further as the
market requires higher resolution, higher speed, lower power consumption and, mainly, lower cost
sensors. Although CMOS image sensors are currently used in several different applications from
consumer to defense to medical diagnosis, product differentiation is becoming both a requirement and
a difficult goal for any image sensor manufacturer. The unique properties of CMOS process allows the
integration of several signal processing techniques and are driving the impressive advancement of the
computational imaging. With this paper, we offer a very comprehensive review of methods,
techniques, designs and fabrication of CMOS image sensors that have impacted or might will impact
the images sensor applications and markets
Saturn integrated circuit reliability test program Final report, 28 Jun. 1966 - 1 Jul. 1967
Literature survey and test program to study reliability of linear integrated circuit
Influence of material quality and process-induced defects on semiconductor device performance and yield
An overview of major causes of device yield degradation is presented. The relationships of device types to critical processes and typical defects are discussed, and the influence of the defect on device yield and performance is demonstrated. Various defect characterization techniques are described and applied. A correlation of device failure, defect type, and cause of defect is presented in tabular form with accompanying illustrations
Product assurance technology for custom LSI/VLSI electronics
The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification
Design and develop a MOS magnetic memory Final report, 11 Mar. - 11 Sep. 1966
Interface problems between plated wire magnetic memory and MO
The Commercial Application of Missile/Space Technology, Parts 1 and 2
This report is concerned with the transfer of technology from missile and space programs to non-missile/space applications in the United States. It presents the findings of a University of Denver Research Institute study sponsored by a National Aeronautics and Space Administration (NASA) grant awarded in November 1961. Initial stimulation for the unsolicited proposal leading to this study came from a 1960 Brookings Institution report to NASA, Proposed Studies on the Implications of Peaceful Space Activities for Human Affairs
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