Full-Duplex Cloud Radio Access Network: Stochastic Design and Analysis

Full-duplex (FD) has emerged as a disruptive communications paradigm for enhancing the achievable spectral efficiency (SE), thanks to the recent major breakthroughs in self-interference (SI) mitigation. The FD versus half-duplex (HD) SE gain, in cellular networks, is however largely limited by the mutual-interference (MI) between the downlink (DL) and the uplink (UL). A potential remedy for tackling the MI bottleneck is through cooperative communications. This paper provides a stochastic design and analysis of FD enabled cloud radio access network (C-RAN) under the Poisson point process (PPP)-based abstraction model of multi-antenna radio units (RUs) and user equipments (UEs). We consider different disjoint and user-centric approaches towards the formation of finite clusters in the C-RAN. Contrary to most existing studies, we explicitly take into consideration non-isotropic fading channel conditions and finite-capacity fronthaul links. Accordingly, upper-bound expressions for the C-RAN DL and UL SEs, involving the statistics of all intended and interfering signals, are derived. The performance of the FD C-RAN is investigated through the proposed theoretical framework and Monte-Carlo (MC) simulations. The results indicate that significant FD versus HD C-RAN SE gains can be achieved, particularly in the presence of sufficient-capacity fronthaul links and advanced interference cancellation capabilities

5G Cellular: Key Enabling Technologies and Research Challenges

The evolving fifth generation (5G) cellular wireless networks are envisioned to provide higher data rates, enhanced end-user quality-of-experience (QoE), reduced end-to-end latency, and lower energy consumption. This article presents several emerging technologies, which will enable and define the 5G mobile communications standards. The major research problems, which these new technologies breed, as well as the measurement and test challenges for 5G systems are also highlighted.Comment: IEEE Instrumentation and Measurement Magazine, to appear in the June 2015 issue. arXiv admin note: text overlap with arXiv:1406.6470 by other author