Piin läpivientien luotettavuus ja elinikä termisessä rasituksessa

Through-silicon via (TSV) is one of the key technologies for three-dimensional (3D) integrated circuits (ICs). TSVs enable vertical electrical connections between components which greatly reduces interconnection lengths. Regardless of all the promise the technique has shown, there are still major obstacles surrounding reliability and the cost of fabrication of the TSV structure. The first part of the thesis is a literature survey that focuses on different failure mechanisms of TSVs. In addition, different fabrication and design choices of TSVs are presented with the focus being on their effect on reliability. The experimental part of the thesis presents reliability and lifetime assessment of tapered partially copper-filled blind TSVs under thermal cycling. The reliability test was carried out with nine samples. Six of them had 420 vias and three of them had 1400 vias in a daisy chain structure. Finite element method (FEM) was used to predict the critical failure locations of the TSV structure. Lifetime was predicted by Weibull analysis. The cross-sections of the test samples were prepared by molding, mechanical grinding and polishing and analyzed by scanning electron microscope (SEM). Electrical measurements showed almost constant resistance increase in the samples before failures were noticed. The first failed sample was noticed after 200 cycles and the last at 4000 cycles. Lifetime of TSVs under thermal cycling was proven to be acceptable with used failure criterion. According to Weibull analysis, about 10 % of the samples with 420 vias will break after 1000 cycles. Sample preparation for imaging was deemed sufficient although the grinding caused artifacts. The simulation results were compared with SEM micrographs. The images showed that the failures were located at the maximum stress areas, identified with FEM simulations, at the bottom of the via. From the SEM images, it was deduced that the defects initiated from the fabrication process and propagated due to maximum localized stress.Piin läpivienti -rakenteet ovat keskeisessä osassa kolmiulotteisten integroitujen piirien kehityksessä. Piin läpiviennit mahdollistavat komponenttien vertikaalin yhdistämisen toisiinsa, mikä lyhentää huomattavasti niiden välistä etäisyyttä. Kaikista hyvistä puolista huolimatta tekniikalla on vielä haasteita edessään. Niistä suurimmat liittyvät rakenteen luotettavuuteen ja valmistuskustannuksiin. Diplomityön kirjallisessa osuudessa keskitytään piin läpivientien erilaisiin vauriomekanismeihin. Sen lisäksi tutkitaan valmistus- ja suunnitteluratkaisujen vaikutusta läpivientien luotettavuuteen. Kokeellisen osan tarkoituksena on osittain kuparitäytettyjen kaventuvien piin läpivientien luotettavuuden ja eliniän määrittäminen termisessä syklaustestissä. Luotettavuustestaus suoritettiin yhdeksällä näytteellä, joista kuudessa oli 420 läpivientiä ja kolmessa 1400 läpivientiä ketjurakenteessa. Elementtimallintamisen avulla määritettiin kriittiset vauriokohdat läpivientirakenteessa ja elinikä määritettiin Weibull-analyysillä. Näytteiden poikkileikkauksien valmistamiseen käytettiin muovaamista, mekaanista hiomista ja kiillotusta ja analysointi suoritettiin pyyhkäisyelektronimikroskoopilla. Näytteiden resistanssi nousi tasaisesti ennen rikkoutumisten havaitsemista. Ensimmäinen rikkoutuminen huomattiin 200 syklin jälkeen ja viimeinen 4000 syklin kohdalla. Näytteiden luotettavuus osoittautui hyväksi käytetyillä kriteereillä. Weibull-analyysin mukaan 10 % 420 läpiviennin näytteistä rikkoutuu 1000 syklin jälkeen. Karkea arvio voidaan tehdä, että satunnainen läpivienti rikkoutuu 0,024 % todennäköisyydellä 1000 syklin jälkeen. Pyyhkäisyelektronimikroskoopin kuvien perusteella havaittiin, että näytteet rikkoutuivat maksimaalisen rasituksen alueella läpivientien alaosassa. Kuvien perusteella päädyttiin johtopäätökseen, että näytteiden rikkoutumisen aiheuttivat virheet, jotka ovat peräisin valmistusprosessista ja jotka etenivät rakenteessa termisen rasituksen vaikutuksesta

The International Linear Collider Technical Design Report - Volume 4: Detectors

The International Linear Collider Technical Design Report (TDR) describes in four volumes the physics case and the design of a 500 GeV centre-of-mass energy linear electron-positron collider based on superconducting radio-frequency technology using Niobium cavities as the accelerating structures. The accelerator can be extended to 1 TeV and also run as a Higgs factory at around 250 GeV and on the Z0 pole. A comprehensive value estimate of the accelerator is give, together with associated uncertainties. It is shown that no significant technical issues remain to be solved. Once a site is selected and the necessary site-dependent engineering is carried out, construction can begin immediately. The TDR also gives baseline documentation for two high-performance detectors that can share the ILC luminosity by being moved into and out of the beam line in a "push-pull" configuration. These detectors, ILD and SiD, are described in detail. They form the basis for a world-class experimental programme that promises to increase significantly our understanding of the fundamental processes that govern the evolution of the Universe.Comment: See also http://www.linearcollider.org/ILC/TDR . The full list of signatories is inside the Repor

Two-Dimensional Electronic Materials and Devices: Opportunities and Challenges

The unprecedented growth of the Internet of Things (IoT) and the 4th Industrial Revolution (Industry 4.0) not only demands dimensional scaling of device technologies but also new types of applications beyond today’s electronics. Two-dimensional (2D) materials, a group of layered crystals (such as graphene and MoS2) with unique properties, have emerged as promising candidates for IoT and Industry 4.0 since they can, not only extend the scaling with unprecedented performance and energy efficiency but also exhibit high potential for novel electronic devices. However, such nanomaterials suffer from significant challenges in process integration, especially in the modules that involves the formation of interfaces between 2D materials and conventional bulk materials. Thus, realizing high-performance energy-efficient 2D electronic devices has been challenging. This dissertation focuses on understanding the fundamental issues in such 2D materials (such as contacts, interfaces and doping) and in identifying applications uniquely enabled by these materials.First, a comprehensive treatment of metal contacts to 2D semiconductors, which has been a huge hurdle for 2D electronic technologies, will be presented. As a pioneering study, new interface physics originating from the unique dimensionality and surface properties have been revealed [1]. Solutions to minimize contact resistance are described though techniques of interface hybridization [2] and seamless contacts [3], [4]. These techniques transform 2D semiconductors from solely scientifically-interesting materials into high-performance field-effect transistor (FET) technologies, such as MoS2 FETs with record-low contact resistances [5], [6] and WSe2 FETs with record-high drive current and mobility [7]. Beyond metal interfaces, dielectric interface is crucial for preserving the carrier mobility in 2D channels, for which a solution enabled by buffer layers has been proposed [8]. On the other hand, the vertical van der Waals interfaces between 2D and 3D semiconductors, which retain the advantages of pristine ultra-thin 2D films as well as maximized tunneling area/field, have been studied and exploited into a novel beyond-silicon transistor technology – the first 2D channel tunnel FET (TFET) [9], which beat the fundamental limitation in the switching behavior of transistors. Recent results from the engineering of such 2D-3D semiconductor interfaces by surface reduction/passivation are described, showing a significant boost of drive current. While conventional diffusion/ion implantation methods are infeasible for 2D materials, two efficient doping techniques that are specific for 2D materials – surface doping [10], [11] and intercalation doping [12] are presented. The theoretical study of surface doping using ab-initio methods helped develop a novel doping scheme that uniquely exploits the Lewis-base like pedigree of 2D semiconductors without disturbing the structural integrity of the 2D atomic layer configuration [13], as well as a novel electrocatalyst based on MoS2 that achieved record high hydrogen evolution reaction (HER) performance [14]. On the other hand, intercalation doping has been employed to demonstrate graphene based transparent electrodes with the best combination of transmittance and sheet resistance [12], and also the first graphene interconnects with excellent performance, reliability and energy-efficiency [15], [16]. Moreover, by uniquely exploiting the high kinetic inductance and conductivity of intercalation doped graphene, a fundamentally different on-chip inductor has been demonstrated [17], [18], with both small form-factors and high inductance values, that were once thought unachievable in tandem. This 2D technique provides an attractive solution to the longstanding scaling problem of analog/radio-frequency electronics and opens up an unconventional pathway for the development of future ultra-compact wireless communication systems. Finally, a novel dissipative quantum transport methodology based on Büttiker probes with band-to-band tunneling capability is developed for 2D FETs [19]. Subsequently, gate-induced-drain-leakage (GIDL), one of the main leakage mechanisms in FETs especially access transistors, is evaluated for the first time for 2D FETs. The results establish the advantages of certain 2D semiconductors in greatly reducing GIDL and thereby support use of such materials in future memory technologies.The dissertation concludes with a vision for how a smart life can be realized in the future by harnessing the capabilities of various 2D technologies in the era of IoT and Industry 4.0.[1] J. Kang, D. Sarkar, W. Liu, D. Jena, and K. Banerjee, “A computational study of metal-contacts to beyond-graphene 2D semiconductor materials,” in IEEE International Electron Devices Meeting, 2012, pp. 407–410.[2] J. Kang, W. Liu, D. Sarkar, D. Jena, and K. Banerjee, “Computational Study of Metal Contacts to Monolayer Transition-Metal Dichalcogenide Semiconductors,” Phys. Rev. X, vol. 4, no. 3, p. 31005, Jul. 2014.[3] J. Kang, D. Sarkar, Y. Khatami, and K. Banerjee, “Proposal for all-graphene monolithic logic circuits,” Appl. Phys. Lett., vol. 103, no. 8, p. 83113, 2013.[4] A. Allain, J. Kang, K. Banerjee, and A. Kis, “Electrical contacts to two-dimensional semiconductors,” Nat. Mater., vol. 14, no. 12, pp. 1195–1205, 2015.[5] W. Liu et al., “High-performance few-layer-MoS2 field-effect-transistor with record low contact-resistance,” in IEEE International Electron Devices Meeting, 2013, pp. 499–502.[6] J. Kang, W. Liu, and K. Banerjee, “High-performance MoS2 transistors with low-resistance molybdenum contacts,” Appl. Phys. Lett., vol. 104, no. 9, p. 93106, Mar. 2014.[7] W. Liu, J. Kang, D. Sarkar, Y. Khatami, D. Jena, and K. Banerjee, “Role of metal contacts in designing high-performance monolayer n-type WSe2 field effect transistors.,” Nano Lett., vol. 13, no. 5, pp. 1983–90, May 2013.[8] J. Kang, W. Liu, and K. Banerjee, “Computational Study of Interfaces between 2D MoS2 and Surroundings,” in 45th IEEE Semiconductor Interface Specialists Conference, 2014.[9] D. Sarkar et al., “A subthermionic tunnel field-effect transistor with an atomically thin channel,” Nature, vol. 526, no. 7571, pp. 91–95, Sep. 2015.[10] Y. Khatami, W. Liu, J. Kang, and K. Banerjee, “Prospects of graphene electrodes in photovoltaics,” in Proceedings of SPIE, 2013, vol. 8824, p. 88240T–88240T–6.[11] D. Sarkar et al., “Functionalization of Transition Metal Dichalcogenides with Metallic Nanoparticles: Implications for Doping and Gas-Sensing,” Nano Lett., vol. 15, no. 5, pp. 2852–2862, May 2015.[12] W. Liu, J. Kang, and K. Banerjee, “Characterization of FeCl3 intercalation doped CVD few-layer graphene,” IEEE Electron Device Lett., vol. 37, no. 9, pp. 1246–1249, Sep. 2016.[13] S. Lei et al., “Surface functionalization of two-dimensional metal chalcogenides by Lewis acid–base chemistry,” Nat. Nanotechnol., vol. 11, no. 5, pp. 465–471, Feb. 2016.[14] J. Li, J. Kang, Q. Cai, W. Hong, C. Jian, and W. Liu, “Boosting Hydrogen Evolution Performance of MoS2 by Band Structure Engineering,” Adv. Mater. Interfaces, vol. 1700303, 2017.[15] J. Jiang et al., “Intercalation doped multilayer-graphene-nanoribbons for next-generation interconnects,” Nano Lett., vol. 17, no. 3, pp. 1482–1488, Mar. 2017.[16] J. Jiang, J. Kang, and K. Banerjee, “Characterization of Self - Heating and Current - Carrying Capacity of Intercalation Doped Graphene - Nanoribbon Interconnects,” in IEEE International Reliability Physics Symposium, 2017, p. 6B.1.1-6B.1.6.[17] X. Li et al., “Graphene inductors for high-frequency applications - design, fabrication, characterization, and study of skin effect,” in IEEE International Electron Devices Meeting, 2014, p. 5.4.1-5.4.4.[18] J. Kang et al., under review.[19] J. Kang et al., under review

Safety and Reliability - Safe Societies in a Changing World

The contributions cover a wide range of methodologies and application areas for safety and reliability that contribute to safe societies in a changing world. These methodologies and applications include: - foundations of risk and reliability assessment and management - mathematical methods in reliability and safety - risk assessment - risk management - system reliability - uncertainty analysis - digitalization and big data - prognostics and system health management - occupational safety - accident and incident modeling - maintenance modeling and applications - simulation for safety and reliability analysis - dynamic risk and barrier management - organizational factors and safety culture - human factors and human reliability - resilience engineering - structural reliability - natural hazards - security - economic analysis in risk managemen

Full Proceedings, 2018

Full conference proceedings for the 2018 International Building Physics Association Conference hosted at Syracuse University

Topical Workshop on Electronics for Particle Physics

The purpose of the workshop was to present results and original concepts for electronics research and development relevant to particle physics experiments as well as accelerator and beam instrumentation at future facilities; to review the status of electronics for the LHC experiments; to identify and encourage common efforts for the development of electronics; and to promote information exchange and collaboration in the relevant engineering and physics communities