Repeater insertion to minimise delay in coupled interconnects.

Signalling over long interconnect is a dominant issue in electronic chip design in current technologies, with the device sizes getting smaller and smaller and the circuits becoming ever larger. Repeater insertion is a well established technique to minimise the propagation delay over long resistive interconnect. In deep sub-micron technologies, as the wires are spaced closer and closer together and signal rise and fall times go into the sub-nano second region, the coupling between interconnects assumes great significance. The resulting crosstalk has implications on the data throughput and on signal integrity. Depending on the data correlation on the coupled lines, the delay can either decrease or increase. In this paper we attempt to quantify the effect of worst-case capacitive crosstalk in parallel buses and look at how it affects repeater insertion in particular. We develop analytic expressions for the delay, buffer size and number that are suitable in a-priori timing analyses and signal integrity estimations. All equations are checked against a dynamic circuit simulator (SPECTRE

Characterisation of crosstalk defects in submicron CMOS VLSI interconnects

The main problem addressed in this research work is a crosstalk defect, which is defined as an unexpected signal change due to the coupling between signals or power lines. Here its characteristic under 3 proposed models is investigated to find whether such a noise could lead to real logic faults in IC systems. As a result, mathematical analysis for various bus systems was established, with 3 main factors found to determine the amount of crosstalk: i) how the input buffers are sized; ii) the physical arrangements of the tracks; and iii) the number of switching tracks involved. Minimum sizes of the width and separation lead to the highest crosstalk while increasing in the length does not contribute much variation. Higher level of crosstalk is also found in higher metal layers due mainly to the reduced capacitance to the substrate. The crosstalk is at its maximum when the track concerned is the middle track of a bus connected to a weak buffer while the other signal lines are switching. From this information, the worse-case analysis for various bus configurations is proposed for 0.7, 0.5 and 0.35 µ CMOS technologies. For most of conventional logic circuits, a crosstalk as large as about a half of the supply voltage is required if a fault is to occur. For the buffer circuits the level of crosstalk required depends very much on the transition voltage, which is in turn controlled by the sizing of its n and p MOS transistors forming the buffer. It is concluded that in general case if crosstalk can be kept to be no larger that 30% of the supply voltage the circuit can be said to be very reliable and virtually free from crosstalk fault. Finally test structures are suggested so that real measurements can be made to verify the simulation result

Custom Integrated Circuits

Contains reports on six research projects.U.S. Air Force - Office of Scientific Research (Contract F49620-84-C-0004)Analog Devices, Inc.Defense Advanced Research Projects Agency (Contract N00014-80-C-0622)National Science Foundation (Grant ECS83-10941

On signalling over through-silicon via (TSV) interconnects in 3-D integrated circuits.

This paper discusses signal integrity (SI) issues and signalling techniques for Through Silicon Via (TSV) interconnects in 3-D Integrated Circuits (ICs). Field-solver extracted parasitics of TSVs have been employed in Spice simulations to investigate the effect of each parasitic component on performance metrics such as delay and crosstalk and identify a reduced-order electrical model that captures all relevant effects. We show that in dense TSV structures voltage-mode (VM) signalling does not lend itself to achieving high data-rates, and that current-mode (CM) signalling is more effective for high throughput signalling as well as jitter reduction. Data rates, energy consumption and coupled noise for the different signalling modes are extracted

Optimal Positions of Twists in Global On-Chip Differential Interconnects

Abstract—Crosstalk limits the achievable data rate of global on-chip interconnects on large CMOS ICs. This is especially the case, if low-swing signaling is used to reduce power consumption. Differential interconnects provide a solution for most crosstalk and noise sources, but not for neighbor-to-neighbor crosstalk in a data bus. This neighbor-to-neighbor crosstalk can be reduced with twists in the differential interconnect-pairs. To reduce via resistance and metal layer use, we use as few twists as possible by placing only one twist in every even interconnect-pair and only two twists in every odd interconnect-pair. Analysis shows that there are optimal positions for the twists, which depend on the termination impedances of the interconnects. Theory and measurements on a 10 mm long bus in 0.13 μm CMOS show that only one twist at 50% of the even interconnect-pairs, two twists at 30% and 70% of the odd interconnect-pairs and both a low-ohmic source and a low-ohmic load impedance are very effective in mitigating the crosstalk