A review: microstructure and properties of tin-silver-copper lead-free solder series for the applications of electronics

Purpose: The research on lead-free solder alloys has increased in past decades due to awareness of the environmental impact of lead contents in soldering alloys. This has led to the introduction and development of different grades of lead-free solder alloys in the global market. Tin-silver-copper is a lead-free alloy which has been acknowledged by different consortia as a good alternative to conventional tin-lead alloy. The purpose of this paper is to provide comprehensive knowledge about the tin-silver-copper series. Design/methodology/approach: The approach of this study reviews the microstructure and some other properties of tin-silver-copper series after the addition of indium, titanium, iron, zinc, zirconium, bismuth, nickel, antimony, gallium, aluminium, cerium, lanthanum, yttrium, erbium, praseodymium, neodymium, ytterbium, nanoparticles of nickel, cobalt, silicon carbide, aluminium oxide, zinc oxide, titanium dioxide, cerium oxide, zirconium oxide and titanium diboride, as well as carbon nanotubes, nickel-coated carbon nanotubes, single-walled carbon nanotubes and graphene-nano-sheets. Findings: The current paper presents a comprehensive review of the tin-silver-copper solder series with possible solutions for improving their microstructure, melting point, mechanical properties and wettability through the addition of different elements/nanoparticles and other materials. Originality/value: This paper summarises the useful findings of the tin-silver-copper series comprehensively. This information will assist in future work for the design and development of novel lead-free solder alloys. © 2019, Emerald Publishing Limited

MICROSTRUCTURAL CHARACTERIZATION AND THERMAL CYCLING RELIABILITY OF SOLDERS UNDER ISOTHERMAL AGING AND ELECTRICAL CURRENT

Solder joints on printed circuit boards provide electrical and mechanical connections between electronic devices and metallized patterns on boards. These solder joints are often the cause of failure in electronic packages. Solders age under storage and operational life conditions, which can include temperature, mechanical loads, and electrical current. Aging occurring at a constant temperature is called isothermal aging. Isothermal aging leads to coarsening of the bulk microstructure and increased interfacial intermetallic compounds at the solder-pad interface. The coarsening of the solder bulk degrades the creep properties of solders, whereas the voiding and brittleness of interfacial intermetallic compounds leads to mechanical weakness of the solder joint. Industry guidelines on solder interconnect reliability test methods recommend preconditioning the solder assemblies by isothermal aging before conducting reliability tests. The guidelines assume that isothermal aging simulates a "reasonable use period," but do not relate the isothermal aging levels with specific use conditions. Studies on the effect of isothermal aging on the thermal cycling reliability of tin-lead and tin-silver-copper solders are limited in scope, and results have been contradictory. The effect of electrical current on solder joints has been has mostly focused on current densities above 104A/cm2 with high ambient temperature (≥100oC), where electromigration, thermomigration, and Joule heating are the dominant failure mechanisms. The effect of current density below 104A/cm2 on temperature cycling fatigue of solders has not been established. This research provides the relation between isothermal aging and the thermal cycling reliability of select Sn-based solders. The Sn-based solders with 3%, 1%, and 0% silver content that have replaced tin-lead are studied and compared against tin-lead solder. The activation energy and growth exponents of the Arrhenius model for the intermetallic growth in the solders are provided. An aging metric to quantify the aging of solder joints, in terms of phase size in the solder bulk and interfacial intermetallic compound thickness at the solder-pad interface, is established. Based on the findings of thermal cycling tests on aged solder assemblies, recommendations are made for isothermal aging of solders before thermal cycling tests. Additionally, the effect of active electrical current at 103 A/cm2 on thermal cycling reliability is reported

Modelling of the reliability of flip chip lead-free solder joints at high-temperature excursions

At high-temperature operations of electronic control devices, Tin-Silver-Copper (SnAgCu) alloy solder joints used to assemble the component of the devices are functioning at homologous temperature above 0.8. In such ambient temperatures, solder alloys have limited mechanical strength and will be sensitive to strain rate. The sensitivity of solder properties to creep/visco-plastic deformation increases the rate of accumulation of plastic damage in the alloy and decreases the number of cycles to failure (Nf) of the joints. Most untimely rupture of solder joints in high-temperature electronics (HTE) system usually culminates in colossal loss of resources and lives. Typical incidences are reported in recent automotive and aircraft crashes as well as the collapse of oil-well logging equipment. To increase the mean time to failure (MTTF) of solder joints in HTE, an in-depth understanding and accurate prediction of the response of solder joints to thermally induced plastic strain damage is crucial. This study concerns the prediction of the reliability of lead-free solder joints in a flip chip (FC) model FC48D6.3C457 which is mounted on a substrate and the assembly subjected to high-temperature excursions. The research investigates the effect of the high-temperature operations on reliability of the joints. In addition, the investigation examines the impact of control factors (component stand-off height (CSH), inter-metallic compound (IMC) thickness, number of thermal cycle and solder volume) on Nf of the joints. A model developed in the course of this investigation was employed to create the assembly solder joints architecture. The development of the model and creation of the bump profile involve a combination of both analytical and construction methods. The assembled package on a printed circuit board (PCB) was subjected to accelerated temperature cycle (ATC) employing IEC standard 60749-25 in parts. The cycled temperature range is between -38 oC and 157 oC. Deformation behaviour of SnAgCu alloy solder in the joints is captured using Anand’s visco-plasticity model and the response of other materials in the assembly were simulated with appropriate model. The results demonstrate that the reliability of solder joints operating at elevated temperatures is dependent on CSH, thickness of IMC and solder volume. It also shows that incorporating the IMC layer in the geometric models significantly improves the level of accuracy of fatigue life prediction to ± 22.5% (from the ± 25% which is currently generally accepted). The findings also illustrate that the magnitude of the predicted damage and fatigue life are functions of the number of ATC employed. The extensive set of results from the modelling study has demonstrated the need for incorporating the IMC layer in the geometric model to ensure greater accuracy in the prediction of solder joint service life. The technique developed for incorporating the IMC layer will be of value to R&D engineers and scientists engaged in high-temperature applications in the automotive, aerospace and oil-well logging sectors. The results have been disseminated through peer reviewed journals and also presentations at international conferences