Mixed-signal CNN array chips for image processing

Due to their local connectivity and wide functional capabilities, cellular nonlinear networks (CNN) are excellent candidates for the implementation of image processing algorithms using VLSI analog parallel arrays. However, the design of general purpose, programmable CNN chips with dimensions required for practical applications raises many challenging problems to analog designers. This is basically due to the fact that large silicon area means large development cost, large spatial deviations of design parameters and low production yield. CNN designers must face different issues to keep reasonable enough accuracy level and production yield together with reasonably low development cost in their design of large CNN chips. This paper outlines some of these major issues and their solutions

Techniques of Energy-Efficient VLSI Chip Design for High-Performance Computing

How to implement quality computing with the limited power budget is the key factor to move very large scale integration (VLSI) chip design forward. This work introduces various techniques of low power VLSI design used for state of art computing. From the viewpoint of power supply, conventional in-chip voltage regulators based on analog blocks bring the large overhead of both power and area to computational chips. Motivated by this, a digital based switchable pin method to dynamically regulate power at low circuit cost has been proposed to make computing to be executed with a stable voltage supply. For one of the widely used and time consuming arithmetic units, multiplier, its operation in logarithmic domain shows an advantageous performance compared to that in binary domain considering computation latency, power and area. However, the introduced conversion error reduces the reliability of the following computation (e.g. multiplication and division.). In this work, a fast calibration method suppressing the conversion error and its VLSI implementation are proposed. The proposed logarithmic converter can be supplied by dc power to achieve fast conversion and clocked power to reduce the power dissipated during conversion. Going out of traditional computation methods and widely used static logic, neuron-like cell is also studied in this work. Using multiple input floating gate (MIFG) metal-oxide semiconductor field-effect transistor (MOSFET) based logic, a 32-bit, 16-operation arithmetic logic unit (ALU) with zipped decoding and a feedback loop is designed. The proposed ALU can reduce the switching power and has a strong driven-in capability due to coupling capacitors compared to static logic based ALU. Besides, recent neural computations bring serious challenges to digital VLSI implementation due to overload matrix multiplications and non-linear functions. An analog VLSI design which is compatible to external digital environment is proposed for the network of long short-term memory (LSTM). The entire analog based network computes much faster and has higher energy efficiency than the digital one

Analysis and Mitigation of Remote Side-Channel and Fault Attacks on the Electrical Level

In der fortlaufenden Miniaturisierung von integrierten Schaltungen werden physikalische Grenzen erreicht, wobei beispielsweise Einzelatomtransistoren eine mögliche untere Grenze für Strukturgrößen darstellen. Zudem ist die Herstellung der neuesten Generationen von Mikrochips heutzutage finanziell nur noch von großen, multinationalen Unternehmen zu stemmen. Aufgrund dieser Entwicklung ist Miniaturisierung nicht länger die treibende Kraft um die Leistung von elektronischen Komponenten weiter zu erhöhen. Stattdessen werden klassische Computerarchitekturen mit generischen Prozessoren weiterentwickelt zu heterogenen Systemen mit hoher Parallelität und speziellen Beschleunigern. Allerdings wird in diesen heterogenen Systemen auch der Schutz von privaten Daten gegen Angreifer zunehmend schwieriger. Neue Arten von Hardware-Komponenten, neue Arten von Anwendungen und eine allgemein erhöhte Komplexität sind einige der Faktoren, die die Sicherheit in solchen Systemen zur Herausforderung machen. Kryptografische Algorithmen sind oftmals nur unter bestimmten Annahmen über den Angreifer wirklich sicher. Es wird zum Beispiel oft angenommen, dass der Angreifer nur auf Eingaben und Ausgaben eines Moduls zugreifen kann, während interne Signale und Zwischenwerte verborgen sind. In echten Implementierungen zeigen jedoch Angriffe über Seitenkanäle und Faults die Grenzen dieses sogenannten Black-Box-Modells auf. Während bei Seitenkanalangriffen der Angreifer datenabhängige Messgrößen wie Stromverbrauch oder elektromagnetische Strahlung ausnutzt, wird bei Fault Angriffen aktiv in die Berechnungen eingegriffen, und die falschen Ausgabewerte zum Finden der geheimen Daten verwendet. Diese Art von Angriffen auf Implementierungen wurde ursprünglich nur im Kontext eines lokalen Angreifers mit Zugriff auf das Zielgerät behandelt. Jedoch haben bereits Angriffe, die auf der Messung der Zeit für bestimmte Speicherzugriffe basieren, gezeigt, dass die Bedrohung auch durch Angreifer mit Fernzugriff besteht. In dieser Arbeit wird die Bedrohung durch Seitenkanal- und Fault-Angriffe über Fernzugriff behandelt, welche eng mit der Entwicklung zu mehr heterogenen Systemen verknüpft sind. Ein Beispiel für neuartige Hardware im heterogenen Rechnen sind Field-Programmable Gate Arrays (FPGAs), mit welchen sich fast beliebige Schaltungen in programmierbarer Logik realisieren lassen. Diese Logik-Chips werden bereits jetzt als Beschleuniger sowohl in der Cloud als auch in Endgeräten eingesetzt. Allerdings wurde gezeigt, wie die Flexibilität dieser Beschleuniger zur Implementierung von Sensoren zur Abschätzung der Versorgungsspannung ausgenutzt werden kann. Zudem können durch eine spezielle Art der Aktivierung von großen Mengen an Logik Berechnungen in anderen Schaltungen für Fault Angriffe gestört werden. Diese Bedrohung wird hier beispielsweise durch die Erweiterung bestehender Angriffe weiter analysiert und es werden Strategien zur Absicherung dagegen entwickelt

Energy Efficient Design for Deep Sub-micron CMOS VLSIs

Over the past decade, low power, energy efficient VLSI design has been the focal point of active research and development. The rapid technology scaling, the growing integration capacity, and the mounting active and leakage power dissipation are contributing to the growing complexity of modern VLSI design. Careful power planning on all design levels is required. This dissertation tackles the low-power, low-energy challenges in deep sub-micron technologies on the architecture and circuit levels. Voltage scaling is one of the most efficient ways for reducing power and energy. For ultra-low voltage operation, a new circuit technique which allows bulk CMOS circuits to work in the sub-0. 5V supply territory is presented. The threshold voltage of the slow PMOS transistor is controlled dynamically to get a lower threshold voltage during the active mode. Due to the reduced threshold voltage, switching speed becomes faster while active leakage current is increased. A technique to dynamically manage active leakage current is presented. Energy reduction resulting from using the proposed structure is demonstrated through simulations of different circuits with different levels of complexity. As technology scales, the mounting leakage current and degraded noise immunity impact performance especially that of high performance dynamic circuits. Dual threshold technology shows a good potential for leakage reduction while meeting performance goals. A model for optimally selecting threshold voltages and transistor sizes in wide fan-in dynamic circuits is presented. On the circuit level, a novel circuit level technique which handles the trade-off between noise immunity and energy dissipation for wide fan-in dynamic circuits is presented. Energy efficiency of the proposed wide fan-in dynamic circuit is further enhanced through efficient low voltage operation. Another direct consequence of technology scaling is the growing impact of interconnect parasitics and process variations on performance. Traditionally, worst case process, parasitics, and environmental conditions are considered. Designing for worst case guarantees a fail-safe operation but requires a large delay and voltage margins. This large margin can be recovered if the design can adapt to the actual silicon conditions. Dynamic voltage scaling is considered a key enabler in reducing such margin. An on-chip process identifier to recover the margin required due to process variations is described. The proposed architecture adjusts supply voltage using a hybrid between the one-time voltage setting and the continuous monitoring modes of operation. The interconnect impact on delay is minimized through a novel adaptive voltage scaling architecture. The proposed system recovers the large delay and voltage margins required by conventional systems by closely tracking the actual critical path at anytime. By tracking the actual critical path, the proposed system is robust and more energy efficient compared to both the conventional open-loop and closed-loop systems

Implementation of signal conditioning circuitry for CO2 sensor for monitoring CO2 emissions from coal fired power plant in Neyveli Lignite Corporation (Tamil Nadu, India)

The most significant anthropogenic greenhouse gas causing global warming is carbon dioxide (CO2). Due to the increase of burning of fossil fuels by industries, the atmospheric CO2 concentration increased by more than 30% in 10 years and is expected to continue to increase. This dissertation analyses a sensor unit used to monitor the emission levels of carbon dioxide from the Neyveli Lignite Corporation (NLC) coal fired power plant which is located in the southern part of India. Most of India’s power generation sectors are based on coal fired power plants. The NLC power plant is owned by the central government of India. It can produce a maximum electric power of 2490MW. The power plant lets out significant CO2 emissions while generating electricity. These carbon dioxide emissions are the root cause for the greenhouse effect. To control the carbon dioxide emissions, in this dissertation a sensor has been designed, analysed and used to monitor the CO2 emission levels from the Neyveli Lignite Corporation. This dissertation focuses on the design and implementation of the CO2 sensor using various electronic components. In NLC, this CO2 sensor was kept under observation and tested. The CO2 emissions measured by the sensor were analysed to monitor CO2 emissions from the Neyveli Lignite Corporation and to guide measures and policy for future scenarios. This dissertation identifies and examines the CO2 emission levels and the possible environmental impacts. It also describes the advantages/disadvantages of the CO2 sensor and how this could guide the possible reduction of greenhouse gases (GHGs) to meet a green environment agenda in the future. Key environmental concerns in the coal-power sector in India include air pollution (primarily from the flue gas emissions of particulates, carbon dioxide emissions, sulphur oxides, nitrous and other hazardous chemicals) which has led to increased particulate pollution and ash disposal problems. The enforcement of regulations to reduce CO2 emissions has been weak in the southern part of India

Clock Generator Circuits for Low-Power Heterogeneous Multiprocessor Systems-on-Chip

In this work concepts and circuits for local clock generation in low-power heterogeneous multiprocessor systems-on-chip (MPSoCs) are researched and developed. The targeted systems feature a globally asynchronous locally synchronous (GALS) clocking architecture and advanced power management functionality, as for example fine-grained ultra-fast dynamic voltage and frequency scaling (DVFS). To enable this functionality compact clock generators with low chip area, low power consumption, wide output frequency range and the capability for ultra-fast frequency changes are required. They are to be instantiated individually per core. For this purpose compact all digital phase-locked loop (ADPLL) frequency synthesizers are developed. The bang-bang ADPLL architecture is analyzed using a numerical system model and optimized for low jitter accumulation. A 65nm CMOS ADPLL is implemented, featuring a novel active current bias circuit which compensates the supply voltage and temperature sensitivity of the digitally controlled oscillator (DCO) for reduced digital tuning effort. Additionally, a 28nm ADPLL with a new ultra-fast lock-in scheme based on single-shot phase synchronization is proposed. The core clock is generated by an open-loop method using phase-switching between multi-phase DCO clocks at a fixed frequency. This allows instantaneous core frequency changes for ultra-fast DVFS without re-locking the closed loop ADPLL. The sensitivity of the open-loop clock generator with respect to phase mismatch is analyzed analytically and a compensation technique by cross-coupled inverter buffers is proposed. The clock generators show small area (0.0097mm2 (65nm), 0.00234mm2 (28nm)), low power consumption (2.7mW (65nm), 0.64mW (28nm)) and they provide core clock frequencies from 83MHz to 666MHz which can be changed instantaneously. The jitter performance is compliant to DDR2/DDR3 memory interface specifications. Additionally, high-speed clocks for novel serial on-chip data transceivers are generated. The ADPLL circuits have been verified successfully by 3 testchip implementations. They enable efficient realization of future low-power MPSoCs with advanced power management functionality in deep-submicron CMOS technologies.In dieser Arbeit werden Konzepte und Schaltungen zur lokalen Takterzeugung in heterogenen Multiprozessorsystemen (MPSoCs) mit geringer Verlustleistung erforscht und entwickelt. Diese Systeme besitzen eine global-asynchrone lokal-synchrone Architektur sowie Funktionalität zum Power Management, wie z.B. das feingranulare, schnelle Skalieren von Spannung und Taktfrequenz (DVFS). Um diese Funktionalität zu realisieren werden kompakte Taktgeneratoren benötigt, welche eine kleine Chipfläche einnehmen, wenig Verlustleitung aufnehmen, einen weiten Bereich an Ausgangsfrequenzen erzeugen und diese sehr schnell ändern können. Sie sollen individuell pro Prozessorkern integriert werden. Dazu werden kompakte volldigitale Phasenregelkreise (ADPLLs) entwickelt, wobei eine bang-bang ADPLL Architektur numerisch modelliert und für kleine Jitterakkumulation optimiert wird. Es wird eine 65nm CMOS ADPLL implementiert, welche eine neuartige Kompensationsschlatung für den digital gesteuerten Oszillator (DCO) zur Verringerung der Sensitivität bezüglich Versorgungsspannung und Temperatur beinhaltet. Zusätzlich wird eine 28nm CMOS ADPLL mit einer neuen Technik zum schnellen Einschwingen unter Nutzung eines Phasensynchronisierers realisiert. Der Prozessortakt wird durch ein neuartiges Phasenmultiplex- und Frequenzteilerverfahren erzeugt, welches es ermöglicht die Taktfrequenz sofort zu ändern um schnelles DVFS zu realisieren. Die Sensitivität dieses Frequenzgenerators bezüglich Phasen-Mismatch wird theoretisch analysiert und durch Verwendung von kreuzgekoppelten Taktverstärkern kompensiert. Die hier entwickelten Taktgeneratoren haben eine kleine Chipfläche (0.0097mm2 (65nm), 0.00234mm2 (28nm)) und Leistungsaufnahme (2.7mW (65nm), 0.64mW (28nm)). Sie stellen Frequenzen von 83MHz bis 666MHz bereit, welche sofort geändert werden können. Die Schaltungen erfüllen die Jitterspezifikationen von DDR2/DDR3 Speicherinterfaces. Zusätzliche können schnelle Takte für neuartige serielle on-Chip Verbindungen erzeugt werden. Die ADPLL Schaltungen wurden erfolgreich in 3 Testchips erprobt. Sie ermöglichen die effiziente Realisierung von zukünftigen MPSoCs mit Power Management in modernsten CMOS Technologien

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Degradation in FPGAs: Monitoring, Modeling and Mitigation

This dissertation targets the transistor aging degradation as well as the associated thermal challenges in FPGAs (since there is an exponential relation between aging and chip temperature). The main objectives are to perform experimentation, analysis and device-level model abstraction for modeling the degradation in FPGAs, then to monitor the FPGA to keep track of aging rates and ultimately to propose an aging-aware FPGA design flow to mitigate the aging