Oscillation-based DFT for Second-order Bandpass OTA-C Filters

This document is the Accepted Manuscript version. Under embargo until 6 September 2018. The final publication is available at Springer via https://doi.org/10.1007/s00034-017-0648-9.This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.Peer reviewedFinal Accepted Versio

Design for testability of high-order OTA-C filters

Copyright © 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ÂPeer reviewe

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

Quiescent current testing of CMOS data converters

Power supply quiescent current (IDDQ) testing has been very effective in VLSI circuits designed in CMOS processes detecting physical defects such as open and shorts and bridging defects. However, in sub-micron VLSI circuits, IDDQ is masked by the increased subthreshold (leakage) current of MOSFETs affecting the efficiency of I¬DDQ testing. In this work, an attempt has been made to perform robust IDDQ testing in presence of increased leakage current by suitably modifying some of the test methods normally used in industry. Digital CMOS integrated circuits have been tested successfully using IDDQ and IDDQ methods for physical defects. However, testing of analog circuits is still a problem due to variation in design from one specific application to other. The increased leakage current further complicates not only the design but also testing. Mixed-signal integrated circuits such as the data converters are even more difficult to test because both analog and digital functions are built on the same substrate. We have re-examined both IDDQ and IDDQ methods of testing digital CMOS VLSI circuits and added features to minimize the influence of leakage current. We have designed built-in current sensors (BICS) for on-chip testing of analog and mixed-signal integrated circuits. We have also combined quiescent current testing with oscillation and transient current test techniques to map large number of manufacturing defects on a chip. In testing, we have used a simple method of injecting faults simulating manufacturing defects invented in our VLSI research group. We present design and testing of analog and mixed-signal integrated circuits with on-chip BICS such as an operational amplifier, 12-bit charge scaling architecture based digital-to-analog converter (DAC), 12-bit recycling architecture based analog-to-digital converter (ADC) and operational amplifier with floating gate inputs. The designed circuits are fabricated in 0.5 μm and 1.5 μm n-well CMOS processes and tested. Experimentally observed results of the fabricated devices are compared with simulations from SPICE using MOS level 3 and BSIM3.1 model parameters for 1.5 μm and 0.5 μm n-well CMOS technologies, respectively. We have also explored the possibility of using noise in VLSI circuits for testing defects and present the method we have developed

Conception pour la testabilité des systèmes biomédicaux implantables

Architecture générale des systèmes implantables -- Principes de stimulation électrique -- Champs d'application des systèmes implantables -- Les particularités des circuits implantables -- Tendance future -- Conception pour la testabilité de la partie numérique des circuits implantables -- "Desigh and realization of an accurate built-in current sensor for Iddq testing and power dissipation measurement -- Conception pour la testabilité de la partie analogique des circuits implantables -- BIST for digital-to-analog and Analogo-to-digital converters -- Efficient and accurate testing of analog-to-digital converters using oscillation test method -- Design for testability of Embedded integrated operational amplifiers -- Vérification des interfaces bioélectroniques des systèmes implantables -- Monitorin the electrode and lead failures in implanted microstimulators and sensors -- Capteurs de température intégrés pour la vérification de l'état thermique des puces dédiées -- Built-in temperature sensors for on-line thermal monitoring of microelectronic structures -- Un protocole de communication fiable pour la programmation et la télémétrie des système implantables -- A reliable communication protoco for externally controlled biomedical implanted devices

On-Chip Analog Circuit Design Using Built-In Self-Test and an Integrated Multi-Dimensional Optimization Platform

Nowadays, the rapid development of system-on-chip (SoC) market introduces tremendous complexity into the integrated circuit (IC) design. Meanwhile, the IC fabrication process is scaling down to allow higher density of integration but makes the chips more sensitive to the process-voltage-temperature (PVT) variations. A successful IC product not only imposes great pressure on the IC designers, who have to handle wider variations and enforce more design margins, but also challenges the test procedure, leading to more check points and longer test time. To relax the designers’ burden and reduce the cost of testing, it is valuable to make the IC chips able to test and tune itself to some extent. In this dissertation, a fully integrated in-situ design validation and optimization (VO) hardware for analog circuits is proposed. It implements in-situ built-in self-test (BIST) techniques for analog circuits. Based on the data collected from BIST, the error between the measured and the desired performance of the target circuit is evaluated using a cost function. A digital multi-dimensional optimization engine is implemented to adaptively adjust the analog circuit parameters, seeking the minimum value of the cost function and achieving the desired performance. To verify this concept, study cases of a 2nd/4th active-RC band-pass filter (BPF) and a 2nd order Gm-C BPF, as well as all BIST and optimization blocks, are adopted on-chip. Apart from the VO system, several improved BIST techniques are also proposed in this dissertation. A single-tone sinusoidal waveform generator based on a finite-impulse-response (FIR) architecture, which utilizes an optimization algorithm to enhance its spur free dynamic range (SFDR), is proposed. It achieves an SFDR of 59 to 70 dBc from 150 to 850 MHz after the optimization procedure. A low-distortion current-steering two-tone sinusoidal signal synthesizer based on a mixing-FIR architecture is also proposed. The two-tone synthesizer extends the FIR architecture to two stages and implements an up-conversion mixer to generate the two tones, achieving better than -68 dBc IM3 below 480 MHz LO frequency without calibration. Moreover, an on-chip RF receiver linearity BIST methodology for continuous and discrete-time hybrid baseband chain is proposed. The proposed receiver chain implements a charge-domain FIR filter to notch the two excitation signals but expose the third order intermodulation (IM3) tones. It simplifies the linearity measurement procedure–using a power detector is enough to analyze the receiver’s linearity. Finally, a low cost fully digital built-in analog tester for linear-time-invariant (LTI) analog blocks is proposed. It adopts a time-to-digital converter (TDC) to measure the delays corresponded to a ramp excitation signal and is able to estimate the pole or zero locations of a low-pass LTI system

Fault simulation for structural testing of analogue integrated circuits

In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply current monitoring is obtained by removing the DC component of the supply current prior to measurement

Τεχνικές ελέγχου ορθής λειτουργίας και διόρθωσης επιδόσεων τηλεπικοινωνιακών ολοκληρωμένων κυκλωμάτων υψηλών συχνοτήτων

Στη διατριβή αυτή παρουσιάζονται τεχνικές ελέγχου ορθής λειτουργίας και διόρθωσης επιδόσεων κατάλληλες για αναλογικά ολοκληρωμένα κυκλώματα RF. Ειδικότερα, προτείνεται η ενοποίηση των διαδικασιών ελέγχου ορθής λειτουργίας και διόρθωσης των επιδόσεων ενός κυκλώματος με την αξιοποίηση ενός συνόλου βέλτιστα επιλεγμένων παρατηρήσιμων μεγεθών. Η επεξεργασία των μεγεθών αυτών καθιστά δυνατή, αφενός, την ανίχνευση ελαττωμάτων και, αφετέρου, την πρόγνωση των επιδόσεων του κυκλώματος η οποία επιτρέπει την εξέταση της συμμόρφωσής του προς τις προδιαγραφές, καθώς και τη διόρθωση της συμπεριφοράς του. Προκειμένου να αντιμετωπισθεί το πρόβλημα της προσβασιμότητας στα παρατηρήσιμα μεγέθη προτείνεται ενσωματωμένη τεχνική μέτρησής τους, ενώ αναπτύσσεται μέθοδος για την ελαχιστοποίηση της αβεβαιότητας που υπεισέρχεται στο ίδιο το σύστημα μέτρησης. Εφαρμόζονται, επίσης, αλγόριθμοι επιλογής με σκοπό την μείωση του αριθμού των παρατηρήσιμων μεγεθών, μέσω μιας διαδικασίας βελτιστοποίησης η οποία οδηγεί στη μείωση του κόστους ελέγχου ορθής λειτουργίας με τον περιορισμό της πολυπλοκότητας και της χρονικής διάρκειας διεξαγωγής του. Η αποδοτικότητα των προτεινόμενων τεχνικών επιβεβαιώνεται με την εφαρμογή τους σε τυπικό μίκτη RF τεχνολογίας 0.18μm CMOS, από τον οποίο λαμβάνονται αποτελέσματα προσομοιώσεων που αξιολογούνται και συγκρίνονται με αντίστοιχες συμβατικές τεχνικές.Testing and performance calibration techniques suitable for integrated RF circuits are presented in this dissertation. Specifically, a common approach is proposed for the testing and calibration procedures, that exploits a set of optimally selected observables. The processing of these observables enables defect detection, and also the prediction of the circuit’s performance which allows the examination of compliance with the specifications and performance calibration, as well. In order to address the problem of accessibility to test observables, a built-in technique is proposed, while a method to minimize the uncertainty introduced in the measurement system itself is also described. The application of selection algorithms is explored, aiming to reduce the number of test observables through an optimization procedure that leads to test cost savings due to the reduction of the test conduction complexity and time. The efficiency of the proposed techniques is validated by their application to a typical RF mixer designed in a 0.18um CMOS technology. Simulation results are obtained and assessed, while comparison with similar conventional techniques is also provided