73 research outputs found

    Design, Fabrication, and Run-time Strategies for Hardware-Assisted Security

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    Today, electronic computing devices are critically involved in our daily lives, basic infrastructure, and national defense systems. With the growing number of threats against them, hardware-based security features offer the best chance for building secure and trustworthy cyber systems. In this dissertation, we investigate ways of making hardware-based security into a reality with primary focus on two areas: Hardware Trojan Detection and Physically Unclonable Functions (PUFs). Hardware Trojans are malicious modifications made to original IC designs or layouts that can jeopardize the integrity of hardware and software platforms. Since most modern systems critically depend on ICs, detection of hardware Trojans has garnered significant interest in academia, industry, as well as governmental agencies. The majority of existing detection schemes focus on test-time because of the limited hardware resources available at run-time. In this dissertation, we explore innovative run-time solutions that utilize on-chip thermal sensor measurements and fundamental estimation/detection theory to expose changes in IC power/thermal profile caused by Trojan activation. The proposed solutions are low overhead and also generalizable to many other sensing modalities and problem instances. Simulation results using state-of-the-art tools on publicly available Trojan benchmarks verify that our approaches can detect Trojans quickly and with few false positives. Physically Unclonable Functions (PUFs) are circuits that rely on IC fabrication variations to generate unique signatures for various security applications such as IC authentication, anti-counterfeiting, cryptographic key generation, and tamper resistance. While the existence of variations has been well exploited in PUF design, knowledge of exactly how variations come into existence has largely been ignored. Yet, for several decades the Design-for-Manufacturability (DFM) community has actually investigated the fundamental sources of these variations. Furthermore, since manufacturing variations are often harmful to IC yield, the existing DFM tools have been geared towards suppressing them (counter-intuitive for PUFs). In this dissertation, we make several improvements over current state-of-the-art work in PUFs. First, our approaches exploit existing DFM models to improve PUFs at physical layout and mask generation levels. Second, our proposed algorithms reverse the role of standard DFM tools and extend them towards improving PUF quality without harming non-PUF portions of the IC. Finally, since our approaches occur after design and before fabrication, they are applicable to all types of PUFs and have little overhead in terms of area, power, etc. The innovative and unconventional techniques presented in this dissertation should act as important building blocks for future work in cyber security

    A hardware-embedded, delay-based PUF engine designed for use in cryptographic and authentication applications

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    Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs), as well as codes for the activation of on-chip features, require the use of embedded secret information. The generation of secret bitstrings using physical unclonable functions, or PUFs, provides several distinct advantages over conventional methods, including the elimination of costly non-volatile memory, and the potential to increase the random bits available to applications. In this dissertation, a Hardware-Embedded Delay PUF (HELP) is proposed that is designed to leverage path delay variations that occur in the core logic macros of a chip to create random bitstrings. A thorough discussion is provided of the operational details of an embedded path timing structure called REBEL that is used by HELP to provide the timing functionality upon which HELP relies for the entropy source for the cryptographic quality of the bitstrings. Further details of the FPGA-based implementation used to prove the viability of the HELP PUF concept are included, along with a discussion of the evolution of the techniques employed in realizing the final PUF engine design. The bitstrings produced by a set of 30 FPGA boards are evaluated with regard to several statistical quality metrics including uniqueness, randomness, and stability. The stability characteristics of the bitstrings are evaluated by subjecting the FPGAs to commercial-grade temperature and power supply voltage variations. In particular, this work evaluates the reproducibility of the bitstrings generated at 0C, 25C, and 70C, and 10% of the rated supply voltage. A pair of error avoidance schemes are proposed and presented that provide significant improvements to the HELP PUF\u27s resiliency against bit-flip errors in the bitstrings

    Contributions on using embedded memory circuits as physically unclonable functions considering reliability issues

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    [eng] Moving towards Internet-of-Things (IoT) era, hardware security becomes a crucial research topic, because of the growing demand of electronic products that are remotely connected through networks. Novel hardware security primitives based on manufacturing process variability are proposed to enhance the security of the IoT systems. As a trusted root that provides physical randomness, a physically unclonable function is an essential base for hardware security. SRAM devices are becoming one of the most promising alternatives for the implementation of embedded physical unclonable functions as the start-up value of each bit-cell depends largely on the variability related with the manufacturing process. Not all bit-cells experience the same degree of variability, so it is possible that some cells randomly modify their logical starting value, while others will start-up always at the same value. However, physically unclonable function applications, such as identification and key generation, require more constant logical starting value to assure high reliability in PUF response. For this reason, some kind of post-processing is needed to correct the errors in the PUF response. Unfortunately, those cells that have more constant logic output are difficult to be detected in advance. This work characterizes by simulation the start-up value reproducibility proposing several metrics suitable for reliability estimation during design phases. The aim is to be able to predict by simulation the percentage of cells that will be suitable to be used as PUF generators. We evaluate the metrics results and analyze the start-up values reproducibility considering different external perturbation sources like several power supply ramp up times, previous internal values in the bit-cell, and different temperature scenarios. The characterization metrics can be exploited to estimate the number of suitable SRAM cells for use in PUF implementations that can be expected from a specific SRAM design.[cat] En l’era de la Internet de les coses (IoT), garantir la seguretat del hardware ha esdevingut un tema de recerca crucial, en especial a causa de la creixent demanda de productes electrònics que es connecten remotament a través de xarxes. Per millorar la seguretat dels sistemes IoT, s’han proposat noves solucions hardware basades en la variabilitat dels processos de fabricació. Les funcions físicament inclonables (PUF) constitueixen una font fiable d’aleatorietat física i són una base essencial per a la seguretat hardware. Les memòries SRAM s’estan convertint en una de les alternatives més prometedores per a la implementació de funcions físicament inclonables encastades. Això és així ja que el valor d’encesa de cada una de les cel·les que formen els bits de la memòria depèn en gran mesura de la variabilitat pròpia del procés de fabricació. No tots els bits tenen el mateix grau de variabilitat, així que algunes cel·les canvien el seu estat lògic d’encesa de forma aleatòria entre enceses, mentre que d’altres sempre assoleixen el mateix valor en totes les enceses. No obstant això, les funcions físicament inclonables, que s’utilitzen per generar claus d’identificació, requereixen un valor lògic d’encesa constant per tal d’assegurar una resposta fiable del PUF. Per aquest motiu, normalment es necessita algun tipus de postprocessament per corregir els possibles errors presents en la resposta del PUF. Malauradament, les cel·les que presenten una resposta més constant són difícils de detectar a priori. Aquest treball caracteritza per simulació la reproductibilitat del valor d’encesa de cel·les SRAM, i proposa diverses mètriques per estimar la fiabilitat de les cel·les durant les fases de disseny de la memòria. L'objectiu és ser capaç de predir per simulació el percentatge de cel·les que seran adequades per ser utilitzades com PUF. S’avaluen els resultats de diverses mètriques i s’analitza la reproductibilitat dels valors d’encesa de les cel·les considerant diverses fonts de pertorbacions externes, com diferents rampes de tensió per a l’encesa, els valors interns emmagatzemats prèviament en les cel·les, i diferents temperatures. Es proposa utilitzar aquestes mètriques per estimar el nombre de cel·les SRAM adients per ser implementades com a PUF en un disseny d‘SRAM específic.[spa] En la era de la Internet de las cosas (IoT), garantizar la seguridad del hardware se ha convertido en un tema de investigación crucial, en especial a causa de la creciente demanda de productos electrónicos que se conectan remotamente a través de redes. Para mejorar la seguridad de los sistemas IoT, se han propuesto nuevas soluciones hardware basadas en la variabilidad de los procesos de fabricación. Las funciones físicamente inclonables (PUF) constituyen una fuente fiable de aleatoriedad física y son una base esencial para la seguridad hardware. Las memorias SRAM se están convirtiendo en una de las alternativas más prometedoras para la implementación de funciones físicamente inclonables empotradas. Esto es así, puesto que el valor de encendido de cada una de las celdas que forman los bits de la memoria depende en gran medida de la variabilidad propia del proceso de fabricación. No todos los bits tienen el mismo grado de variabilidad. Así pues, algunas celdas cambian su estado lógico de encendido de forma aleatoria entre encendidos, mientras que otras siempre adquieren el mismo valor en todos los encendidos. Sin embargo, las funciones físicamente inclonables, que se utilizan para generar claves de identificación, requieren un valor lógico de encendido constante para asegurar una respuesta fiable del PUF. Por este motivo, normalmente se necesita algún tipo de posprocesado para corregir los posibles errores presentes en la respuesta del PUF. Desafortunadamente, las celdas que presentan una respuesta más constante son difíciles de detectar a priori. Este trabajo caracteriza por simulación la reproductibilidad del valor de encendido de celdas SRAM, y propone varias métricas para estimar la fiabilidad de las celdas durante las fases de diseño de la memoria. El objetivo es ser capaz de predecir por simulación el porcentaje de celdas que serán adecuadas para ser utilizadas como PUF. Se evalúan los resultados de varias métricas y se analiza la reproductibilidad de los valores de encendido de las celdas considerando varias fuentes de perturbaciones externas, como diferentes rampas de tensión para el encendido, los valores internos almacenados previamente en las celdas, y diferentes temperaturas. Se propone utilizar estas métricas para estimar el número de celdas SRAM adecuadas para ser implementadas como PUF en un diseño de SRAM específico

    Techniques for Improving Security and Trustworthiness of Integrated Circuits

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    The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects

    Embracing Low-Power Systems with Improvement in Security and Energy-Efficiency

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    As the economies around the world are aligning more towards usage of computing systems, the global energy demand for computing is increasing rapidly. Additionally, the boom in AI based applications and services has already invited the pervasion of specialized computing hardware architectures for AI (accelerators). A big chunk of research in the industry and academia is being focused on providing energy efficiency to all kinds of power hungry computing architectures. This dissertation adds to these efforts. Aggressive voltage underscaling of chips is one the effective low power paradigms of providing energy efficiency. This dissertation identifies and deals with the reliability and performance problems associated with this paradigm and innovates novel energy efficient approaches. Specifically, the properties of a low power security primitive have been improved and, higher performance has been unlocked in an AI accelerator (Google TPU) in an aggressively voltage underscaled environment. And, novel power saving opportunities have been unlocked by characterizing the usage pattern of a baseline TPU with rigorous mathematical analysis
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