Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization

Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient resolution for these purposes, being limited by physical diffraction and hardware deficiencies. Electron microscopy addresses optical diffraction by measuring emitted or transmitted electrons instead of photons, yielding nanometer resolution. Despite pushing back the diffraction limit, blur should still be taken into account because of practical hardware imperfections and remaining electron diffraction. Deconvolution algorithms can remove some of the blur in post-processing but they depend on knowledge of the point-spread function (PSF) and should accurately regularize noise. Any errors in the estimated PSF or noise model will reduce their effectiveness. This paper proposes a new procedure to estimate the lateral component of the point spread function of a 3D scanning electron microscope more accurately. We also propose a Bayesian maximum a posteriori deconvolution algorithm with a non-local image prior which employs this PSF estimate and previously developed noise statistics. We demonstrate visual quality improvements and show that applying our method improves the quality of subsequent segmentation steps

Structure-aware image denoising, super-resolution, and enhancement methods

Denoising, super-resolution and structure enhancement are classical image processing applications. The motive behind their existence is to aid our visual analysis of raw digital images. Despite tremendous progress in these fields, certain difficult problems are still open to research. For example, denoising and super-resolution techniques which possess all the following properties, are very scarce: They must preserve critical structures like corners, should be robust to the type of noise distribution, avoid undesirable artefacts, and also be fast. The area of structure enhancement also has an unresolved issue: Very little efforts have been put into designing models that can tackle anisotropic deformations in the image acquisition process. In this thesis, we design novel methods in the form of partial differential equations, patch-based approaches and variational models to overcome the aforementioned obstacles. In most cases, our methods outperform the existing approaches in both quality and speed, despite being applicable to a broader range of practical situations.Entrauschen, Superresolution und Strukturverbesserung sind klassische Anwendungen der Bildverarbeitung. Ihre Existenz bedingt sich in dem Bestreben, die visuelle Begutachtung digitaler Bildrohdaten zu unterstützen. Trotz erheblicher Fortschritte in diesen Feldern bedürfen bestimmte schwierige Probleme noch weiterer Forschung. So sind beispielsweise Entrauschungsund Superresolutionsverfahren, welche alle der folgenden Eingenschaften besitzen, sehr selten: die Erhaltung wichtiger Strukturen wie Ecken, Robustheit bezüglich der Rauschverteilung, Vermeidung unerwünschter Artefakte und niedrige Laufzeit. Auch im Gebiet der Strukturverbesserung liegt ein ungelöstes Problem vor: Bisher wurde nur sehr wenig Forschungsaufwand in die Entwicklung von Modellen investieret, welche anisotrope Deformationen in bildgebenden Verfahren bewältigen können. In dieser Arbeit entwerfen wir neue Methoden in Form von partiellen Differentialgleichungen, patch-basierten Ansätzen und Variationsmodellen um die oben erwähnten Hindernisse zu überwinden. In den meisten Fällen übertreffen unsere Methoden nicht nur qualitativ die bisher verwendeten Ansätze, sondern lösen die gestellten Aufgaben auch schneller. Zudem decken wir mit unseren Modellen einen breiteren Bereich praktischer Fragestellungen ab

Phase and TV Based Convex Sets for Blind Deconvolution of Microscopic Images

In this article, two closed and convex sets for blind deconvolution problem are proposed. Most blurring functions in microscopy are symmetric with respect to the origin. Therefore, they do not modify the phase of the Fourier transform (FT) of the original image. As a result blurred image and the original image have the same FT phase. Therefore, the set of images with a prescribed FT phase can be used as a constraint set in blind deconvolution problems. Another convex set that can be used during the image reconstruction process is the epigraph set of Total Variation (TV) function. This set does not need a prescribed upper bound on the total variation of the image. The upper bound is automatically adjusted according to the current image of the restoration process. Both of these two closed and convex sets can be used as a part of any blind deconvolution algorithm. Simulation examples are presented.Comment: Submitted to IEEE Selected Topics in Signal Processin

An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and accelerated imaging typically results in noisy data. Advanced denoising techniques can alleviate this, but tend to be less accessible to the community due to low-level programming environments, complex parameter tuning or a computational bottleneck. We present DenoisEM: an interactive and GPU accelerated denoising plugin for ImageJ that ensures fast parameter tuning and processing through parallel computing. Experimental results show that DenoisEM is one order of magnitude faster than related software and can accelerate data acquisition by a factor of 4 without significantly affecting data quality. Lastly, we show that image denoising benefits visualization and (semi-)automated segmentation and analysis of ultrastructure in various volume EM datasets