Time-dependent wave selection for information processing in excitable media

We demonstrate an improved technique for implementing logic circuits in light-sensitive chemical excitable media. The technique makes use of the constant-speed propagation of waves along defined channels in an excitable medium based on the Belousov-Zhabotinsky reaction, along with the mutual annihilation of colliding waves. What distinguishes this work from previous work in this area is that regions where channels meet at a junction can periodically alternate between permitting the propagation of waves and blocking them. These valve-like areas are used to select waves based on the length of time that it takes waves to propagate from one valve to another. In an experimental implementation, the channels which make up the circuit layout are projected by a digital projector connected to a computer. Excitable channels are projected as dark areas, unexcitable regions as light areas. Valves alternate between dark and light: every valve has the same period and phase, with a 50% duty cycle. This scheme can be used to make logic gates based on combinations of OR and AND-NOT operations, with few geometrical constraints. Because there are few geometrical constraints, compact circuits can be implemented. Experimental results from an implementation of a 4-bit input, 2-bit output integer square root circuit are given. This is the most complex logic circuit that has been implemented in BZ excitable media to date

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

Logical effort based design exploration of 64-bit adders using a mixed dynamic-CMOS/threshold-logic approach

Copyright © 2004 IEEEThis paper presents the design exploration of CMOS 64-bit adders designed using threshold logic gates based on systematic transistor level delay estimation using Logical Effort (LE). The adders are hybrid designs consisting of domino and the recently proposed Charge Recycling Threshold Logic (CRTL). The delay evaluation is based LE modeling of the delay of the domino and CRTL gates. From the initial estimations, we select the 8-bit sparse carry look-ahead/carry-select scheme. Simulations indicate a delay of less than 5 FO4, which is 1.1 FO4 or 17% faster than the nearest domino design.Peter Celinski, Said Al-Sarawi, Derek Abbott, Sorin Cotofana and Stamatis Vassiliadi

Study of Layout Techniques in Dynamic Logic Circuitry for Single Event Effect Mitigation

Dynamic logic circuits are highly suitable for high-speed applications, considering the fact that they have a smaller area and faster transition. However, their application in space or other radiation-rich environments has been significantly inhibited by their susceptibility to radiation effects. This work begins with the basic operations of dynamic logic circuits, elaborates upon the physics underlying their radiation vulnerability, and evaluates three techniques that harden dynamic logic from the layout: drain extension, pulse quenching, and a proposed method. The drain extension method adds an extra drain to the sensitive node in order to improve charge sharing, the pulse quenching scheme utilizes charge sharing by duplicating a component that offsets the transient pulse, and the proposed technique takes advantage of both. Domino buffers designed using these three techniques, along with a conventional design as reference, were modeled and simulated using a 3D TCAD tool. Simulation results confirm a significant reduction of soft error rate in the proposed technique and suggest a greater reduction with angled incidence. A 130 nm chip containing designed buffer and register chains was fabricated and tested with heavy ion irradiation. According to the experiment results, the proposed design achieved 30% soft error rate reduction, with 19%, 20%, and 10% overhead in speed, power, and area, respectively

Digital Simulations of Memristors Towards Integration with Reconfigurable Computing

The end of Moore’s Law has been predicted for decades. Demand for increased parallel computational performance has been increased by improvements in machine learning. This past decade has demonstrated the ever-increasing creativity and effort necessary to extract scaling improvements in CMOS fabrication processes. However, CMOS scaling is nearing its fundamental physical limits. A viable path for increasing performance is to break the von Neumann bottleneck. In-memory computing using emerging memory technologies (e.g. ReRam, STT, MRAM) offers a potential path beyond the end of Moore’s Law. However, there is currently very little support from industry tools for designers wishing to incorporate these devices and novel architectures. The primary issue for those using these tools is the lack of support for mixed-signal design, as HDLs such as Verilog were designed to work only with digital components. This work aims to improve the ability for designers to rapidly prototype their designs using these emerging memory devices, specifically memristors, by extending Verilog to support functional simulation of memristors with the Verilog Procedural Interface (VPI). In this work, demonstrations of the ability for the VPI to simulate memristors with the nonlinear ion-drift model and the behavior of a memristive crossbar array are presented

Digital Simulations of Memristors Towards Integration with Reconfigurable Computing

The end of Moore’s Law has been predicted for decades. Demand for increased parallel computational performance has been increased by improvements in machine learning. This past decade has demonstrated the ever-increasing creativity and effort necessary to extract scaling improvements in CMOS fabrication processes. However, CMOS scaling is nearing its fundamental physical limits. A viable path for increasing performance is to break the von Neumann bottleneck. In-memory computing using emerging memory technologies (e.g. ReRam, STT, MRAM) offers a potential path beyond the end of Moore’s Law. However, there is currently very little support from industry tools for designers wishing to incorporate these devices and novel architectures. The primary issue for those using these tools is the lack of support for mixed-signal design, as HDLs such as Verilog were designed to work only with digital components. This work aims to improve the ability for designers to rapidly prototype their designs using these emerging memory devices, specifically memristors, by extending Verilog to support functional simulation of memristors with the Verilog Procedural Interface (VPI). In this work, demonstrations of the ability for the VPI to simulate memristors with the nonlinear ion-drift model and the behavior of a memristive crossbar array are presented