Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models

A method to translate immunity specifications of automotive modules into equivalent requirements at integrated circuit (IC) level, using linear scattering parameter models of the ICs, is presented. A technique is described to determine S-parameters of ICs by simulations based on back-annotated analog schematics. The simulation results are compared with measurement data obtained using a specially designed test board. As an example, simulation and measurement results are given for the input stage of an automotive sensor interface. A good agreement is obtained from the lowest test frequency up to 1 GHz. Above this value, the measured results seem to be dominated by package effects

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

In this paper, we propose a transmission-line modeling technique for the ISO 7637-3 capacitive coupling clamp (CCC) test. Besides modeling the test bench, special attention is devoted to the CCC itself, for which an equivalent circuit is constructed based on the concept of surface transfer impedance and surface transfer admittance. The overall model is validated by means of measurements using a nonlinear circuit as device-under-test, as such demonstrating the appositeness to mimick the CCC test in simulations during the design phase

Overview about E-Mobility Conducted Immunity Tests on ESA Communication Lines

Due to the complexity of the Automotive Electromagnetic Compatibility legislation in force, this article aims to describe a simplified overview of several technical standards relating to conducted immunity tests on electronic sub-assemblies, where communication lines are involved. The discussed automotive standards reported in this article are: ISO 11452-1 and ISO 11452-4 for continuous narrowband electromagnetic fields immunity test, bulk current injection and tubular wave coupler, IEC 61000-4-5 for immunity against surge events, IEC 61000-4-4 for electrical fast transient/burst events immunity, ISO 10605 for electrostatic discharge events immunity, ISO 7637-2 and ISO 7637-3 for transient disturbances events immunity. For each cited standard, disturbance bandwidth evaluation was performed. Practical examples are reported, with analysis and discussion of some of the adoptable disturbance countermeasures applicable on controlled area network communication lines, and possible design advantages and disadvantages with different types of filtering and suppression circuit solutions

Component-Level Mitigation Solution and System-Level Analysis Method of High-Voltage Transient ESD Event

Department of Electrical EngineeringElectrostatic discharge (ESD) is a significant phenomenon in the field of electromagnetic compatibility (EMC) that causes critical issues in the reliability and functionality of electronic devices and systems. ESD events can be classified based on the occurring environment and conditions, and the methods to address related issues vary accordingly. The two main classifications are component-level ESD events and system-level ESD events. Component-level ESD events primarily occur during repetitive and predictable stages of electronic component and product manufacturing processes. These events can be effectively addressed by eliminating the ESD hazards themselves. On the other hand, system-level ESD events are characterized by their irregular and unpredictable occurrence during the operation of electronic devices and systems. To address issues related to system-level ESD events, it is necessary to enhance ESD robustness of the system. This thesis covers research on various aspects of the ESD that encompass both component-level events and system-level events. In electronic device manufacturing process, ionizers are commonly used to effectively eliminate static charges. Among diverse ionizers, corona ionizers utilizing a high-voltage source are widely preferred for their easy installation and safety. However, the corona ionizers may induce electric overstress (EOS) to sensitive electronic devices. Also, regular maintenance is necessary to prevent particle accumulation on corona ionizers, which can interfere with their performance and lead to ESD failures. In this thesis, a novel low-voltage microwave plasma ionizer is proposed and analyzed to address the critical limitations associated with the EOS risk and particle fuzzballs in the corona ionizers. To evaluate the system-level ESD immunity of electronic products, researchers and manufacturers conduct ESD immunity tests according to international standards such as IEC 61000-4-2 and ISO 10605 for general and automotive electronic devices, respectively. However, the process of design iteration and troubleshooting to improve the ESD immunity of novel electronic devices in this test setup are time consuming and costly. To solve this problem, many studies have been conducted to predict ESD immunity by computing the system-level ESD noise in the test setup. However, the prediction of the automotive system-level ESD immunity is very difficult because the automotive ESD test setup in ISO 10605 contains complex and large structures, requiring significant computational memory and time. In this thesis, an accurate and efficient method for computing system-level ESD noise waveforms in the ISO 10605 standard using the decomposition method and split-domain approach is proposed and validated. While the standards related to the ESD immunity test primarily address ESD scenarios involving a charged human body, it is also important to consider other objects that may act as ESD sources, which can be charged with high potential. For example, in areas with low relative humidity, such as deserts, automotive parts can be damaged or malfunction if they come into contact with a charged dust cleaner during cleaning operations. In this thesis, an ESD model of a dust cleaner is proposed and the ESD failure of an automobile headlamp is analyzed using the proposed ESD model.clos

Study and application of direct RF power injection methodology and mitigation of electromagnetic interference in ADCs

There are many publications available in literature regarding the DPI (Direct Power Injection) technique for electronic systems, but few works specifically addressed for mixed-signal converters, which are components existent in almost all electronic devices. IEC 62132-4(International Electrotechnical Commission, 2006) and 62132-1(International Electrotechnical Commission, 2006) standards describe a method for measuring immunity of integrated circuits (IC) in the presence of conducted RF disturbances. This method ensures a high degree of repeatability and correlation of immunity measurements. Knowledge of the electromagnetic immunity of an IC allows the designer to decide if the system will need external protection, and how much effort should be directed to this solution. In this context, the purpose of this work is the study and application of the DPI methodology for injection of EMI in a mixed-signal programmable device, evaluating mitigation possibilities, with special focus on the analog-to-digital converters (ADCs). The main objective is to evaluate the impact of electromagnetic interference (EMI) on different converters (two Successive Approximation Register ADCs, operating with distinct sampling rate and a Sigma-Delta ADC) of the Cypress Semiconductor Programmable SoC (System-on-Chip), PSoC 5LP. Additionally a previously proposed fault tolerance methodology, based on triplication with hardware and time diversity is tested. Results show distinct behaviors of each converter to conducted EMI. Finally, the tested tolerance technique showed to be suitable to reduce error rate of such data acquisition system operating under EMI disturbance.Existem muitas publicações disponíveis na literatura sobre a técnica de DPI (Direct Power Injection ou injeção direta de energia) para sistemas eletrônicos, mas poucos trabalhos direcionados para conversores de sinais mistos, que são componentes existentes em quase todos os dispositivos eletrônicos. As normas IEC 62132-4 (IEC, 2006) e 62132-1 (IEC, 2006) descrevem um método para medir a imunidade de circuitos integrados (CI) na presença de distúrbios de RF conduzidos. Este método garante um alto grau de repetibilidade e correlação das medições da imunidade. O conhecimento da imunidade eletromagnética de um CI permite que o projetista decida se o sistema precisará de proteção externa e quanto esforço deve ser direcionado para esta solução. Nesse contexto, o objetivo deste trabalho é o estudo e aplicação da metodologia DPI para injeção de interferência eletromagnética em um dispositivo programável de sinal misto, avaliando as possibilidades de mitigação, com foco especial em conversores analógico-digitais (ADCs). O principal objetivo é avaliar o impacto da interferência eletromagnética em diferentes conversores (dois ADCs baseados em aproximação sucessiva, operando com taxa de amostragem distintas e um ADC do tipo Sigma-Delta) do SoC(System-on-Chip) programável da Cypress Semiconductor, PSoC 5LP. Além disso, é testada uma metodologia de tolerância a falhas proposta anteriormente, baseada em triplicação com diversidade de hardware e temporal. Os resultados mostram comportamentos distintos de cada conversor para a interferência eletromagnética conduzida. Finalmente, a técnica de tolerância testada mostrou-se adequada para reduzir a taxa de erros desse sistema de aquisição de dados operando sob perturbação eletromagnética

Electrical Optimization of a Plug-In Hybrid Electric Vehicle

Hybrid electric vehicles electrification and optimization is a prominent part of today’s automotive industry. GM and the Department of Energy challenge 16 universities across North America to redesign a Chevrolet Camaro into a hybrid electric vehicle. This thesis will address how Embry Riddle Aeronautical University’s EcoCAR team electrified and optimized the vehicle. The objective of the thesis is to optimize the electric portion of the vehicle, particularly the low voltage circuitry. Prior work is discussed in detail on the vehicle communication bus, building the power distribution unit and the approach the electrical team took when building the electric portion of the vehicle. Simulations were done based on manufacturer data and bench tests to create an ideal model. Data was collected from the vehicle and compared to the ideal model to determine errors in the electrical system. An emphasis was placed on critical and high power components to simplify the simulation model. The issues found were alleviated by conducting research, using research analysis, physically changing the system or by implementing control strategies. Most of the issues came from the power distribution unit and implementation techniques such as grounding. The MOSFETs within the power distribution unit was not fully turning on and off, and which was due to a slow RC time constant occurring on the gate of the transistors. By replacing the resistors, this issue was mitigated. Every problem found was properly mitigated to an acceptable industry or research standard

Validation of automotive electromagnetic models

The problems of modelling the electromagnetic characteristics of vehicles and the experimental validation of such models are considered. The validity of the measurement methods that are applied in model validation exercises is of particular concern. A philosophy for approaching the validation of automotive electromagnetic models of realistic complexity is presented. Mathematical modelling of the key elements of the measurement processes is proposed as the only reliable mechanism for addressing these issues. Areas considered include: basic elements of numerical models; geometrical fidelity requirements for model elements; calibration and use of experimental transducers; the inclusion of cables in electromagnetic models; essential content for vehicle models. A number of practical measurement processes are also investigated using numerical methods, leading to recommendations for improved practices in: calibration of transducers for current measurement at high frequencies; measurement of radiated emissions from vehicles; identification of range requirements for simple methods of determining antenna gain and related characteristics in EMC test facilities. The impact of such measures on the success of model validation studies for automotive applications is demonstrated. It is concluded that experimental results are no less in need of validation than the numerical results that are, more conventionally, judged against them

Analog-Digital System Modeling for Electromagnetic Susceptibility Prediction

The thesis is focused on the noise susceptibility of communication networks. These analog-mixed signal systems operate in an electrically noisy environment, in presence of multiple equipments connected by means of long wiring. Every module communicates using a transceiver as an interface between the local digital signaling and the data transmission through the network. Hence, the performance of the IC transceiver when affected by disturbances is one of the main factors that guarantees the EM immunity of the whole equipment. The susceptibility to RF and transient disturbances is addressed at component level on a CAN transceiver as a test case, highlighting the IC features critical for noise immunity. A novel procedure is proposed for the IC modeling for mixed-signal immunity simulations of communication networks. The procedure is based on a gray-box approach, modeling IC ports with a physical circuit and the internal links with a behavioural block. The parameters are estimated from time and frequency domain measurements, allowing accurate and efficient reproduction of non-linear device switching behaviours. The effectiveness of the modeling process is verified by applying the proposed technique to a CAN transceiver, involved in a real immunity test on a data communication link. The obtained model is successfully implemented in a commercial solver to predict both the functional signals and the RF noise immunity at component level. The noise immunity at system level is then evaluated on a complete communication network, analyzing the results of several tests on a realistic CAN bus. After developing models for wires and injection probes, a noise immunity test in avionic environment is carried out in a simulation environment, observing good overall accuracy and efficiency

Contribution to improve the EMI performance of electrical drive systems in vehicles with special consideration of power semiconductor modules

Diese Arbeit dient als Beitrag zur Verbesserung des EMV-Verhaltens elektrischer Antriebssysteme in Fahrzeugen, wobei der Fokus auf dem Leistungshalbleitermodul für die Automobilanwendung liegt. Für ein besseres und tieferes Verständnis der Quelle von leitungsgebundenen Störungen werden die EMV-Mechanismen und -Effekte im Zusammenhang mit dem Leistungsmodul im Antriebssystem durch Simulationen und Messungen untersucht. Der Einfluss der Diode Reverse Recovery Effekte auf das EMV-Verhalten wird quantitativ mit verschiedenen Lastströmen sowie mit verschiedenen Diodentypen, wie z.B. SiC-Schottky-Dioden, analysiert. Durch Simulationen wird der Einfluss des Leistungsmoduls auf das System untersucht; auf dieser Basis wird die Bedeutung verschiedener Faktoren innerhalb und außerhalb des Leistungsmoduls für das EMV-Verhalten bewertet. Zur Validierung der Simulationsergebnisse wird der Messaufbau für eine konventionelle EMV-Messung für die Automobilanwendung vorgestellt. Die Messergebnisse belegen, dass die Simulationsmodelle unter bestimmten Randbedingungen für zukünftige Leistungsmodulkonstruktionen zur EMV-Vorhersage verwendbar sind. Basierend auf dem Verständnis, wie es aus den Simulationen und Messergebnissen hergeleitet wurde, werden konkrete Optimierungskonzepte für ein inhärent störungsarmes Leistungsmodul entwickelt und realisiert. Dessen EMV-Verhalten sowie der Aufwand des Musterbaus aus Sicht des Leistungsmodulherstellers werden anhand verschiedenen Kriterien verglichen und bewertet. Außerdem wird das dynamische und Kurzschlussverhalten der Prototypen einschließlich der Stromverteilung zwischen den Halbleiterchips charakterisiert. In dieser Arbeit wird ein neuartiges Testverfahren vorgestellt, mit dem es möglich ist, das leitungsgebundene EMV-Verhalten von Leistungsmodulen abzuschätzen, ohne den gesamten Testaufbau wie bei einer konventionellen EMV-Messung zu erstellen. Diese Charakterisierung kann anschließend in der Phase der Inverterentwicklung verwendet werden, um ein geeignetes Modul auszuwählen und den erwarteten Aufwand zur Einhaltung der EMV Standards zu bewerten.This work serves as a contribution to improve the EMI performance of electrical drive systems in vehicles; the focus is on the power semiconductor module for automotive application. For a better and deeper understanding of the conducted EMI source, the conducted EMI mechanisms and effects in the drive system are investigated through simulations as well as measurements with special consideration of power modules: The influence of the diode recovery effects on the EMI performance is quantitatively analyzed with different load currents, as well as with different types of diodes, e.g. SiC Schottky barrier diode. Through the simulation, the influence coming from the power module to the system is clarified; the importance of different factors inside and outside of the power module regarding EMI performance are therefore evaluated. To validate the simulation results, the setup and test bench for a conventional EMI measurement for the typical automotive application are presented. Through the measurement results it is proven that the simulation models are usable under certain boundary conditions for future power module designs with regard to the EMI prediction. Based on the understanding and the conclusions from the simulation and measurement results, concrete EMI optimization concepts for an inherently low-interference power module are developed and realized. The EMI performance as well as the feasibility of the sample modules are compared and evaluated under different criteria from the power module manufacturer’s point of view. Besides, the dynamic and short-circuit performances of the sample modules, regarding to the current distribution on the semiconductor chips, are characterized. A novel test procedure is introduced in this work, by which it is possible to estimate the conducted EMI performance of power modules without building the whole test setup like in a conventional EMI measurement. This characterization can subsequently be used in the phase of converter development to select a suitable device and evaluate the expected effort to comply with EMI standards