67,091 research outputs found
A Detail Based Method for Linear Full Reference Image Quality Prediction
In this paper, a novel Full Reference method is proposed for image quality
assessment, using the combination of two separate metrics to measure the
perceptually distinct impact of detail losses and of spurious details. To this
purpose, the gradient of the impaired image is locally decomposed as a
predicted version of the original gradient, plus a gradient residual. It is
assumed that the detail attenuation identifies the detail loss, whereas the
gradient residuals describe the spurious details. It turns out that the
perceptual impact of detail losses is roughly linear with the loss of the
positional Fisher information, while the perceptual impact of the spurious
details is roughly proportional to a logarithmic measure of the signal to
residual ratio. The affine combination of these two metrics forms a new index
strongly correlated with the empirical Differential Mean Opinion Score (DMOS)
for a significant class of image impairments, as verified for three independent
popular databases. The method allowed alignment and merging of DMOS data coming
from these different databases to a common DMOS scale by affine
transformations. Unexpectedly, the DMOS scale setting is possible by the
analysis of a single image affected by additive noise.Comment: 15 pages, 9 figures. Copyright notice: The paper has been accepted
for publication on the IEEE Trans. on Image Processing on 19/09/2017 and the
copyright has been transferred to the IEE
Image Quality Assessment Based on Detail Differences
This paper presents a novel Full Reference method for
image quality assessment based on two indices measuring
respectively detail loss and spurious detail addition. These
indices define a two dimensional (2D) state in a Virtual
Cognitive State (VCS) space. The quality estimation is
obtained as a 2D function of the VCS, empirically
determined via polynomial fitting of DMOS values of
training images. The method provides at the same time
highly accurate DMOS estimates, and a quantitative
account of the causes of quality degradation
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