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    A Detail Based Method for Linear Full Reference Image Quality Prediction

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    In this paper, a novel Full Reference method is proposed for image quality assessment, using the combination of two separate metrics to measure the perceptually distinct impact of detail losses and of spurious details. To this purpose, the gradient of the impaired image is locally decomposed as a predicted version of the original gradient, plus a gradient residual. It is assumed that the detail attenuation identifies the detail loss, whereas the gradient residuals describe the spurious details. It turns out that the perceptual impact of detail losses is roughly linear with the loss of the positional Fisher information, while the perceptual impact of the spurious details is roughly proportional to a logarithmic measure of the signal to residual ratio. The affine combination of these two metrics forms a new index strongly correlated with the empirical Differential Mean Opinion Score (DMOS) for a significant class of image impairments, as verified for three independent popular databases. The method allowed alignment and merging of DMOS data coming from these different databases to a common DMOS scale by affine transformations. Unexpectedly, the DMOS scale setting is possible by the analysis of a single image affected by additive noise.Comment: 15 pages, 9 figures. Copyright notice: The paper has been accepted for publication on the IEEE Trans. on Image Processing on 19/09/2017 and the copyright has been transferred to the IEE

    Image Quality Assessment Based on Detail Differences

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    This paper presents a novel Full Reference method for image quality assessment based on two indices measuring respectively detail loss and spurious detail addition. These indices define a two dimensional (2D) state in a Virtual Cognitive State (VCS) space. The quality estimation is obtained as a 2D function of the VCS, empirically determined via polynomial fitting of DMOS values of training images. The method provides at the same time highly accurate DMOS estimates, and a quantitative account of the causes of quality degradation
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