On basis variables for efficient error detection

The development of dependable software invariably entails the design and location of error detection mechanisms. This software artefact type captures predicates over program variables in order to facilitate error detection. To ease the design of detectors, it is important to have (i) knowledge of the set of variables to be included in a predicate and (ii) an understanding of the structure of the predicate. In this paper, we address these problems by relating a previously defined software metric to the variables that feature in efficient error detection predicates. Specifically, based on fault injection analysis of three software systems, we show that error detection predicates based on the 25% most important variables in a software module provide a similar level efficiency to those predicates that are based on all variables and variables with high importance value appear at lower depths in the generated decision tree, thus implying that these variables provide the most information with regard to system failure and, hence, should be protected to provide proper software function. The implication of these results is that, in order to develop efficient error detection predicates, it is sufficient to only have knowledge of a basis set of important variables, simplifying the design of efficient detectors

Fault Injection Analytics: A Novel Approach to Discover Failure Modes in Cloud-Computing Systems

Cloud computing systems fail in complex and unexpected ways due to unexpected combinations of events and interactions between hardware and software components. Fault injection is an effective means to bring out these failures in a controlled environment. However, fault injection experiments produce massive amounts of data, and manually analyzing these data is inefficient and error-prone, as the analyst can miss severe failure modes that are yet unknown. This paper introduces a new paradigm (fault injection analytics) that applies unsupervised machine learning on execution traces of the injected system, to ease the discovery and interpretation of failure modes. We evaluated the proposed approach in the context of fault injection experiments on the OpenStack cloud computing platform, where we show that the approach can accurately identify failure modes with a low computational cost.Comment: IEEE Transactions on Dependable and Secure Computing; 16 pages. arXiv admin note: text overlap with arXiv:1908.1164

Systematic Model-based Design Assurance and Property-based Fault Injection for Safety Critical Digital Systems

With advances in sensing, wireless communications, computing, control, and automation technologies, we are witnessing the rapid uptake of Cyber-Physical Systems across many applications including connected vehicles, healthcare, energy, manufacturing, smart homes etc. Many of these applications are safety-critical in nature and they depend on the correct and safe execution of software and hardware that are intrinsically subject to faults. These faults can be design faults (Software Faults, Specification faults, etc.) or physically occurring faults (hardware failures, Single-event-upsets, etc.). Both types of faults must be addressed during the design and development of these critical systems. Several safety-critical industries have widely adopted Model-Based Engineering paradigms to manage the design assurance processes of these complex CPSs. This thesis studies the application of IEC 61508 compliant model-based design assurance methodology on a representative safety-critical digital architecture targeted for the Nuclear power generation facilities. The study presents detailed experiences and results to demonstrate the benefits of Model testing in finding design flaws and its relevance to subsequent verification steps in the workflow. Additionally, to study the impact of physical faults on the digital architecture we develop a novel property-based fault injection method that overcomes few deficiencies of traditional fault injection methods. The model-based fault injection approach presented here guarantees high efficiency and near-exhaustive input/state/fault space coverage, by utilizing formal model checking principles to identify fault activation conditions and prove the fault tolerance features. The fault injection framework facilitates automated integration of fault saboteurs throughout the model to enable exhaustive fault location coverage in the model

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains

Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA

A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA) by a total-ionizing dose. It then identified the different factors contributing to the amount of delay induced by the total dose in the FPGA. A novel fault model for delay failure in FPGA was developed. This fault model was used to identify worst-case test vectors for delay failures induced in FPGA devices exposed to a total ionizing dose. The fault model and the methodology for identifying worst-case test vectors WCTV were validated using Micro-semi ProASIC3 FPGA and Cobalt 60 radiation facility

Experimental analysis of computer system dependability

This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

Compilation Optimizations to Enhance Resilience of Big Data Programs and Quantum Processors

Modern computers can experience a variety of transient errors due to the surrounding environment, known as soft faults. Although the frequency of these faults is low enough to not be noticeable on personal computers, they become a considerable concern during large-scale distributed computations or systems in more vulnerable environments like satellites. These faults occur as a bit flip of some value in a register, operation, or memory during execution. They surface as either program crashes, hangs, or silent data corruption (SDC), each of which can waste time, money, and resources. Hardware methods, such as shielding or error correcting memory (ECM), exist, though they can be difficult to implement, expensive, and may be limited to only protecting against errors in specific locations. Researchers have been exploring software detection and correction methods as an alternative, commonly trading either overhead in execution time or memory usage to protect against faults. Quantum computers, a relatively recent advancement in computing technology, experience similar errors on a much more severe scale. The errors are more frequent, costly, and difficult to detect and correct. Error correction algorithms like Shor’s code promise to completely remove errors, but they cannot be implemented on current noisy intermediate-scale quantum (NISQ) systems due to the low number of available qubits. Until the physical systems become large enough to support error correction, researchers instead have been studying other methods to reduce and compensate for errors. In this work, we present two methods for improving the resilience of classical processes, both single- and multi-threaded. We then introduce quantum computing and compare the nature of errors and correction methods to previous classical methods. We further discuss two designs for improving compilation of quantum circuits. One method, focused on quantum neural networks (QNNs), takes advantage of partial compilation to avoid recompiling the entire circuit each time. The other method is a new approach to compiling quantum circuits using graph neural networks (GNNs) to improve the resilience of quantum circuits and increase fidelity. By using GNNs with reinforcement learning, we can train a compiler to provide improved qubit allocation that improves the success rate of quantum circuits

New Techniques for On-line Testing and Fault Mitigation in GPUs

L'abstract è presente nell'allegato / the abstract is in the attachmen