42,972 research outputs found

    DeSyRe: on-Demand System Reliability

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    The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

    Enabling electronic prognostics using thermal data

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    Prognostics is a process of assessing the extent of deviation or degradation of a product from its expected normal operating condition, and then, based on continuous monitoring, predicting the future reliability of the product. By being able to determine when a product will fail, procedures can be developed to provide advanced warning of failures, optimize maintenance, reduce life cycle costs, and improve the design, qualification and logistical support of fielded and future systems. In the case of electronics, the reliability is often influenced by thermal loads, in the form of steady-state temperatures, power cycles, temperature gradients, ramp rates, and dwell times. If one can continuously monitor the thermal loads, in-situ, this data can be used in conjunction with precursor reasoning algorithms and stress-and-damage models to enable prognostics. This paper discusses approaches to enable electronic prognostics and provides a case study of prognostics using thermal data.Comment: Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions
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